Test device for kinetic switches and method of testing kinetic switches
View Patent ↗Test apparatus and method of testing kinetic switches. The test apparatus utilizes an RFID device attached to a high speed centrifuge on which the kinetic switches are mounted for testing. Sensors monitor the operation of the kinetic switch for movement from a first position to a second position. In addition, the speed of the centrifuge at the time of the movement is determined. This information may be transmitted in real time as received by the RFID device or saved in RFID memory and transmitted to determine the force applied to the kinetic switch at the time of the movement so that the acceptability of the kinetic switch can be determined.
1. A kinetic switch testing system for kinetic switches comprising:
a high speed centrifuge;
a centrifuge speed detector;
a test fixture mounted on the high speed centrifuge, the test fixture including a sensor for sensing a movement of the kinetic switch from a first position to a second position and a unique identification address corresponding to the sensor;
an RFID system in communication with the test fixture, the RFID system further comprising;
an RFID device, the RFID device having a computer chip in communication with the sensor and receiving a signal from the sensor indicating movement of the kinetic switch from the first position to the second position, and an antenna,
a scanning antenna in communication with the RFID device, the RFID device communicating the signal from the sensor indicating movement of the kinetic switch from the first position to the second position and the identification address of the sensor;
a signal analyzer and a memory storage unit;
wherein the scanning antenna is in communication with the signal analyzer and the memory storage unit; and
wherein the signal analyzer and the memory storage unit determine the acceptability of the kinetic switch at the identification address based on centrifuge speed and a signal indicative of the movement of the kinetic switch from the first position to the second position and store data related to testing of the kinetic switch.
2. The kinetic switch testing system of claim 1 wherein the RFID device further includes a second memory storage unit.
3. The kinetic switch testing system of claim 1 wherein the signal analyzer and the memory storage unit that determine the acceptability of the kinetic switch at the unique identification address and store data related to the testing of the kinetic switch is a computer.
4. The kinetic switch testing system of claim 3 wherein the computer further includes a custom computer program that determines the acceptability of the kinetic switch based on movement from the first position to the second position and the centrifuge speed.
5. The kinetic switch testing system of claim 1 wherein the test fixture mounted on the high speed centrifuge comprises a second sensor that includes a signal-producing electrical circuit, the circuit generating a signal when the kinetic switch moves from the first position to the second position.
6. The kinetic switch testing system of claim 1 further including a test platform mechanically attached to the high speed centrifuge.
7. The kinetic switch testing system of claim 6 further including a PC board affixed to the test platform.
8. The kinetic switch testing system of claim 7 wherein the RFID device is removably attached to the PC board and in communication with the test platform.
9. The kinetic switch testing system of claim 8 wherein the RFID device includes a passive chip.
10. The kinetic switch testing system of claim 1 wherein the RFID device is a passive device embedded in a substrate.
11. The kinetic switch testing system of claim 1 wherein the RFID device is an active device.
12. The kinetic switch testing system of claim 1 wherein the centrifuge speed detector is an encoder mounted to a centrifuge motor, the encoder in communication with the signal analyzer and memory storage unit.
13. The kinetic switch testing system of claim 1 wherein the centrifuge speed detector is a centrifuge speed-monitoring sensor, the speed-monitoring sensor monitoring a rotational speed of the centrifuge and in communication with the signal analyzer and memory storage unit.
14. A method for testing a kinetic switch, comprising the steps of:
providing a high speed centrifuge, a test fixture and an RFID system, a signal analyzer and a memory storage unit, wherein the RFID system further comprises an RFID device having a computer chip, and an antenna, the RFID system further including a scanning antenna in communication with the RFID device;
mounting the test fixture and the RFID device to the high speed centrifuge;
placing the test fixture in communication with the RFID device;
mounting a kinetic switch to the test fixture;
providing a centrifuge speed detector;
accelerating the high speed centrifuge;
sensing the kinetic switch moving from a first position to a second position, a sensor in the test fixture generating and communicating a signal to the RFID device indicative of the unique identification address correspond to the sensor as well as kinetic switch moving from a first position to a second position, the RFID device receiving the signal;
interrogating the RFID device with a second signal from the scanning antenna;
transmitting the sensor signal received by the RFID device to the scanning antenna;
receiving the transmitted sensor signal from the RFID device by the scanning antenna;
providing a signal analyzer and a memory storage unit;
transmitting the sensor signal to the signal analyzer and the memory storage unit;
transmitting a signal from the centrifuge speed detector indicative of centrifuge speed to the signal analyzer and the memory storage unit; and
analyzing and storing data related to the testing as well as the acceptability of the kinetic switch and its identification address.
15. The system of claim 14 wherein the step of providing an RFID system further includes steps of
providing an RFID device with a second memory storage unit;
storing the sensor signal in the second memory storage unit; and
transmitting the sensor signal from the second memory storage unit of the RFID device upon interrogating the RFID device.
16. The method of claim 14 wherein the step or providing a centrifuge speed detector includes providing an encoder mounted to a centrifuge motor, the encoder in communication with the signal analyzer and memory storage unit.
17. The method of claim 14 wherein the centrifuge speed detector is a centrifuge speed-monitoring sensor, the speed-monitoring sensor monitoring a rotational speed of the centrifuge and in communication with the signal analyzer and memory storage unit and providing a third signal indicative of centrifuge speed to the signal analyzer and the memory storage unit.
18. The method of claim 14 wherein the step of providing the signal analyzer and the memory storage unit further includes providing a computer that includes the signal analyzer and the memory storage unit.
19. The method of claim 18 wherein the step of providing a computer further includes providing a computer having a custom computer program that determines the acceptability of the kinetic switch based on movement from the first position to the second position and the centrifuge speed.
20. The method of testing the kinetic switch of claim 19 wherein a signal information generated by the sensor received by the scanning antenna and the speed of the centrifuge are sent to the computer for calculation of a force on the kinetic switch at the time it moved from the first position to the second position.
21. The method for testing a kinetic switch of claim 14 wherein the step of mounting the test fixture and the RFID device to the high speed centrifuge further includes mechanically mounting a test platform to the high speed centrifuge, mechanically mounting a board to the test platform and mounting the RFID device to the board.
22. The method of claim 14 wherein the step of sensing includes generating an electrical signal when the kinetic switch moves from the first position to the second position opening or closing a circuit.
23. A method for testing a kinetic switch, comprising the steps of:
providing a high speed centrifuge, a test fixture and an RFID system, a signal analyzer and a memory storage unit, wherein the RFID system further comprises an RFID device having a computer chip, and an antenna, the RFID system further including a scanning antenna in communication with the RFID device;
mounting the test fixture and the RFID device to the high speed centrifuge;
placing the test fixture in communication with the RFID device;
mounting a kinetic switch to the test fixture;
accelerating the high speed centrifuge;
interrogating the RFID device with a signal from the scanning antenna;
sensing the kinetic switch moving from a first position to a second position, a sensor in the test fixture generating and communicating a signal to the RFID device indicative of the kinetic switch moving from a first position to a second position;
receiving the generated signal by the sensor in the test fixture, by the RFID device;
transmitting the signal information as it is received by the RFID device;
receiving the transmitted signal information from the RFID device by the scanning antenna;
analyzing the signal information to determine a force at which the identified kinetic switch moved from the first position to the second position; and
determining the acceptability of the kinetic switch.