Semiconductor device having stacked chips
According to one embodiment, a semiconductor device includes chips and a first selection circuit. Each of the chips has at least first and second vias for transmitting at least first and second address signals, these chips are stacked to be electrically connected via the first and second vias. The first selection circuit is provided in each chip, includes a logic circuit that selects a chip based on at least the first and second address signals, and supplies a result of operating the first and second address signals to the subsequent chip.
1. A semiconductor device comprising:
chips each of which has at least first and second vias through each chip from a front surface of the chip to a back surface of the chip, the vias enabling transmission of at least first and second address signals, and the chips being electrically connected to each other through the first and second vias and stacked; and
a first selection circuit which is provided in each chip, and includes a wiring configuration that selects the chips by selecting one of the first and second address signals;
wherein the first selection circuit comprises:
first and second wiring layers which are connected to the first and second vias in each chip, respectively; and
a third wiring layer which is selectively connected to the first and second wiring layers.
2. The device according to claim 1 , further comprising a second selection circuit, the second selection circuit comprising:
a third via which is provided in each chip and allows transmission of a third address;
a fourth wiring layer which is selectively connected to the third via; and
a transistor which is connected to the fourth wiring layer and is constantly conductive.
3. The device according to claim 2 , wherein the third and fourth wiring layers are formed by changing a mask pattern.
4. The device according to claim 2 , wherein the third and fourth wiring layers are formed by changing a position at which a bump is formed.
5. The device according to claim 1 , wherein the first selection circuit comprises:
an insulating film which is selectively arranged between the respective chips to insulate the vias; and
a transistor which is provided in each chip, is connected to the vias, and is constantly conductive.
6. A semiconductor device comprising:
chips each of which has at least first and second vias through each chip from a front surface of the chip to a back surface of the chip, the vias enabling transmission of at least first and second address signals, and the chips being electrically connected to each other through the first and second vias and being stacked;
a first selection circuit which is provided in each chip and selects a chip based on at least the first and second address signals; and
a second selection circuit which selects a first chip from the chips based on a first selection signal supplied from the first selection circuit and an externally supplied address signal.
7. The device according to claim 6 , further comprising a transfer circuit which is provided in each of the chips and transfers the address signal to any other chip based on a second selection signal supplied from the second selection circuit.
8. The device according to claim 7 , further comprising:
a redundant chip which has a same configuration as a configuration of each of the chips; and
a redundancy control circuit which is provided in each of the chips, receives a first designation signal that designates the redundant chip, a second designation signal that designates a defective chip, and the first selection signal supplied from the first selection circuit, and outputs a signal that deactivates a chip when the second designation signal coincides with the first selection signal in a state in which the first designation signal is activated, or outputs a signal that activates a chip when the second designation signal does not coincide with the first selection signal in a same state.
9. The device according to claim 8 , wherein each of the stacked chips and the redundant chip has replaceable regions and, when at least one region included in one of the stacked chips has a defect, the region having a defect is replaced with at least one region of the redundant chip.
10. The device according to claim 9 , wherein the redundant chip allows inclusion of a region having a defect.
11. The device according to claim 10 , wherein each of the redundant chip and the chips has a fourth selection circuit which selects first and second regions in the regions, and the fourth selection circuit selects, based on a selection signal, one of a first state in which the first region is selected as the first region, a second state in which the first region is selected as the second region, a third state in which the second region is selected as the first region, and a fourth state in which the second region is selected as the second region.
12. The device according to claim 11 , wherein each chip further comprises:
an address switching circuit which controls, based on a swap signal, switching of fifth and sixth address signals output from the first selection circuit that selects a chip based on at least the first and second address signals;
a sixth selection circuit which selects one of at least first and second chip enable signals based on a chip enable signal switching signal and an output signal from the switching circuit; and
a seventh selection circuit which selectively outputs the fifth and sixth address signals supplied from the address switching circuit based on the chip enable signal switching signal.
13. The device according to claim 12 , wherein the stacked chips are connected to a printed wiring board through at least one chip having a specific function.