Data storage device maximizing areal density based on a target quality metric
View Patent ↗A data storage device is disclosed comprising a head actuated over a disk. Data is written to the disk and read from the disk to measure a quality metric. A recording parameter is repeatedly adjusted and the quality metric is measured for each adjustment of the recording parameter. An operating value for the recording parameter is selected that corresponds to a substantially maximum areal density for the disk when the measured quality metric substantially matches a target quality metric.
1. A data storage device comprising:
a disk;
a head actuated over the disk; and
control circuitry configured to:
write data to the disk and read the data from the disk to measure a quality metric;
repeatedly adjust a recording parameter and measure the quality metric for each adjustment of the recording parameter; and
select an operating value for the recording parameter that corresponds to a substantially maximum areal density for the disk when the measured quality metric substantially matches a target quality metric.
2. The data storage device as recited in claim 1 , wherein the recording parameter comprises the areal density for the disk.
3. The data storage device as recited in claim 1 , wherein the recording parameter comprises a write current applied to a write element.
4. The data storage device as recited in claim 1 , wherein the recording parameter comprises a write power applied to a laser configured to heat the disk during write operations.
5. The data storage device as recited in claim 1 , wherein the control circuitry is further configured to adjust the recording parameter based on a nominal function that estimates a relationship between the recording parameter and the target quality metric.
6. The data storage device as recited in claim 5 , wherein the control circuitry is further configured to generate the nominal function based on at least one recording parameter setting where the corresponding measured quality metric substantially matches the target quality metric.
7. The data storage device as recited in claim 6 , wherein the control circuitry is further configured to generate the nominal function based on at least two recording parameter settings where the corresponding measured quality metric for each recording parameter substantially matches the target quality metric.
8. The data storage device as recited in claim 1 , wherein the quality metric comprises an off-track read capability.
9. The data storage device as recited in claim 1 , wherein the quality metric comprises an error rate.
10. The data storage device as recited in claim 1 , wherein the quality metric comprises a squeeze margin.
11. A method of operating a data storage device, the method comprising:
writing data to a disk and reading the data from the disk to measure a quality metric;
repeatedly adjusting a recording parameter and measuring the quality metric for each adjustment of the recording parameter; and
selecting an operating value for the recording parameter that corresponds to a substantially maximum areal density for the disk when the measured quality metric substantially matches a target quality metric.
12. The method as recited in claim 11 , wherein the recording parameter comprises the areal density for the disk.
13. The method as recited in claim 11 , wherein the recording parameter comprises a write current applied to a write element.
14. The method as recited in claim 11 , wherein the recording parameter comprises a write power applied to a laser configured to heat the disk during write operations.
15. The method as recited in claim 11 , further comprising adjusting the recording parameter based on a nominal function that estimates a relationship between the recording parameter and the target quality metric.
16. The method as recited in claim 15 , further comprising generating the nominal function based on at least one recording parameter setting where the corresponding measured quality metric substantially matches the target quality metric.
17. The method as recited in claim 16 , further comprising generating the nominal function based on at least two recording parameter settings where the corresponding measured quality metric for each recording parameter setting substantially matches the target quality metric.
18. The method as recited in claim 11 , wherein the quality metric comprises an off-track read capability.
19. The method as recited in claim 11 , wherein the quality metric comprises an error rate.
20. The method as recited in claim 11 , wherein the quality metric comprises a squeeze margin.