Scanning laser microscope
View Patent ↗An image having an expected superresolution effect is created in a straightforward manner and with superior precision. The invention provides a scanning laser microscope including a scanner that scans a laser beam emitted from an Ar laser device on a specimen; an objective lens that radiates the laser beam scanned by the scanner onto the specimen and that collects return light coming from the specimen; a detector array that has a plurality of minute detector elements arrayed at a position that is optically conjugate with the focal position of the objective lens; and a superresolution calculating portion that calculates a center position of a spot of the return light that is incident on the detector array on the basis of a light intensity signal output from each of the minute detector elements in the detector array.
1. A method for creating a superresolution image of a specimen using a scanning laser microscope comprising a scanner, a light source, an objective lens, and a detector array which has a plurality of minute detector elements arrayed two-dimensionally and disposed at a position that is optically conjugate with a focal position of the objective lens, the method comprising:
scanning, with the scanner, a laser beam emitted from the light source on the specimen;
radiating, with the objective lens, the laser beam scanned by the scanner onto the specimen and collecting, with the objective lens, return light coming from the specimen;
projecting the return light coming from the specimen on the detector array which has the plurality of minute detector elements arrayed two-dimensionally and disposed at the position that is optically conjugate with the focal position of the objective lens;
comparing outputs from the minute detector elements of the detector array and determining that a center position of a spot of the return light is disposed at the minute detector elements where an intensity of the return light is highest;
moving a selection range of the detector array by selectively turning ON or OFF individual minute detector elements of the detector array, the minute detector elements which are turned ON defining the selection range, so that the center position of the spot is aligned with a center position of the selection range of the detector array; and
creating the superresolution image of the specimen by summing light intensity signals of the return light coming from a same position on the specimen, which are detected by different minute detector elements at different detection timings in accordance with the scanning of the laser beam with the scanner.
2. The method according to claim 1 , wherein the detector array has an odd number×odd number of the minute detector elements.
3. The method according to claim 1 , wherein, in a case in which the objective lens or a wavelength of the laser beam changes, the center position of the spot of the return light is calculated.