IP Library Granted Patent US 9,520,716
Granted Patent B2
US 9,520,716 · App. 14/561,717 · Granted Dec 13, 2016

Electrostatic protection circuit and semiconductor integrated circuit apparatus

Inventor: Masuhide Ikeda (Matsumoto, JP)
Assignee: SEIKO EPSON CORPORATION
H02H9/046H01L27/0248
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Quick Facts
Patent No.
US 9,520,716
App. No.
14/561,717
Granted
Dec 13, 2016
Kind
B2
Abstract

The following are included: a series circuit that is connected between a first node and a second node and includes an impedance element and a capacitor connected to each other by a third node; a first transistor that is connected between the first node and a fourth node and turns on in accordance with an increase in voltage generated in the impedance element; a voltage divider circuit that divides voltage between the fourth node and the second node; a second transistor that turns on in accordance with an increase in the divided voltage and increases current flowing in the impedance element; a detection circuit that activates an output signal upon detection of an on state of the second transistor; and a discharge circuit that allows current to flow from the first node to the second node when the output signal of the detection circuit is activated.

Claims (34)

1. An electrostatic protection circuit that is connected via a first node to a first terminal to which a first potential is supplied, and is connected via a second node to a second terminal to which a second potential lower than the first potential is supplied, the electrostatic protection circuit comprising:

a first impedance element, one end thereof being connected to one of the first node and the second node, and the other end thereof being connected to a third node;

a capacitor, one end thereof being connected to the third node, and the other end thereof being connected to the other of the first node and the second node;

a first transistor that is connected between the one of the first node and the second node and a fourth node, and is placed in an electrically conductive state in accordance with an increase in voltage generated at both ends of the first impedance element;

a voltage divider circuit that includes a second impedance element and a third impedance element and divides voltage between the other of the first node and the second node and the fourth node, the second impedance element being connected between the fourth node and a fifth node, and the third impedance element being connected between the other of the first node and the second node and the fifth node;

a second transistor that is placed in an electrically conductive state in accordance with an increase in voltage generated at both ends of the third impedance element;

a detection circuit that activates an output signal upon detection of the electrically conductive state of the second transistor; and

a discharge circuit that is connected between the first node and the second node, and allows current to flow from the first node to the second node when the output signal of the detection circuit is activated.

2. The electrostatic protection circuit according to claim 1 , wherein

the voltage divider circuit further includes a third transistor connected in parallel to the second impedance element, the third transistor turning on when the output signal of the detection circuit is activated.

3. The electrostatic protection circuit according to claim 1 , wherein

the voltage divider circuit includes a plurality of impedance elements and at least one transistor, the plurality of impedance elements being connected in series between the fourth node and the fifth node, and the at least one transistor being connected in parallel to at least one of the plurality of impedance elements and turning on when the output signal of the detection circuit is activated.

4. The electrostatic protection circuit according to claim 1 , wherein

the second impedance element or each of a plurality of impedance elements includes at least one of a resistor element, a diode, and a P-channel transistor or an N-channel transistor in which a gate is connected to a drain or a source.

5. The electrostatic protection circuit according to claim 1 , wherein

the first impedance element includes one of a resistor element and a P-channel transistor, the resistor element being connected between the first node and the third node, and the P-channel transistor having a source, a drain, and a gate connected to the first node, the third node, and the second node, respectively, and

the third impedance element includes one of a resistor element and an N-channel transistor, the resistor element being connected between the fifth node and the second node, and the N-channel transistor having a drain, a source, and a gate connected to the fifth node, the second node, and the first node, respectively.

6. The electrostatic protection circuit according to claim 5 , wherein

the first transistor includes a P-channel transistor having a source, a drain, and a gate connected to the first node, the fourth node, and the third node, respectively, and voltage is applied to the voltage divider circuit by the P-channel transistor turning on in accordance with an increase in voltage between the first node and the third node.

7. The electrostatic protection circuit according to claim 5 , wherein

the second transistor includes an N-channel transistor having a drain, a source, and a gate connected to the third node, the second node, and the fifth node, respectively, and the output signal of the detection circuit is activated by the N-channel transistor turning on in accordance with an increase in voltage between the fifth node and the second node.

8. The electrostatic protection circuit according to claim 1 , wherein

the detection circuit includes an inverter having an input terminal to which a potential of the third node is supplied, and activates the output signal when voltage generated in the first impedance element becomes higher than a predetermined percentage of voltage between the first node and the second node.

9. The electrostatic protection circuit according to claim 1 , wherein

the discharge circuit includes one of an N-channel transistor and an NPN transistor, the N-channel transistor having a drain connected to the first node, a source connected to the second node, and a gate to which the output signal of the detection circuit is supplied, and the NPN transistor having a collector connected to the first node, an emitter connected to the second node, and a base to which the output signal of the detection circuit is supplied.

10. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 1 .

11. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 2 .

12. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 3 .

13. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 4 .

14. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 5 .

15. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 6 .

16. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 7 .

17. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 8 .

18. A semiconductor integrated circuit apparatus comprising the electrostatic protection circuit according to claim 9 .

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 14, 2024
From: CRYSTAL LEAP ZRT
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 066761/0627 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 1, 2024
From: SEIKO EPSON CORPORATION
To: CRYSTAL LEAP ZRT
Reel/Frame 066162/0434 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2014
From: IKEDA, MASUHIDE
To: SEIKO EPSON CORPORATION
Reel/Frame 034390/0342 →
Priority Claims (1)
JP 2013-253930 · Dec 9, 2013 · national
Continuity (1)
Related Publication 20150162745A1 · Jun 11, 2015