X-ray source assembly
An apparatus includes an X-ray tube, X-ray optics, one or more coils and control circuitry. The X-ray tube is configured to direct an electron beam onto an anode so as to emit an X-ray beam. The X-ray optics which configured to receive the X-ray beam emitted from the X-ray tube and to direct the X-ray beam onto a target. The coils are configured to steer the electron beam in the X-ray tube using electrical currents flowing through the coils. The control circuitry is configured to compensate for misalignment between the X-ray tube and the X-ray optics by analyzing the X-ray beam output by the X-ray optics, and setting the electrical currents based on the analyzed X-ray beam.
1. Apparatus, comprising:
an X-ray tube, which comprises an X-ray window and is configured to direct an electron beam onto an anode so as to emit an X-ray beam through the X-ray window;
X-ray optics, which are mounted externally to the X-ray tube with a mechanical misalignment relative to the X-ray tube, and which are configured to receive the X-ray beam emitted from the X-ray tube through the X-ray window, and to direct the X-ray beam onto a target;
one or more coils, which are configured to steer the electron beam in the X-ray tube using electrical currents flowing through the coils; and
control circuitry, which is configured to:
determine, based on the X-ray beam output by the X-ray optics, respective values of the electrical currents that, when flowing in the coils, steer the electron beam to a region of the anode that causes the X-ray beam to compensate for the mechanical misalignment between the X-ray tube and the X-ray optics; and
set the electrical currents to the determined values.
2. The apparatus according to claim 1 , wherein the control circuitry is configured to set the electrical currents to be constant.
3. The apparatus according to claim 1 , wherein the control circuitry is configured to set the electrical currents adaptively based on the X-ray beam.
4. The apparatus according to claim 1 , wherein the target comprises a detector comprised in the control circuitry, and wherein the control circuitry further comprises a processor configured to analyze an output of the detector and to set the electrical currents depending on the output.
5. The apparatus according to claim 1 , wherein the control circuitry is configured to estimate a deviation of an actual characteristic of the emitted X-ray beam from a specified characteristic, and to set the electrical currents depending on the deviation.
6. The apparatus according to claim 5 , wherein the actual and specified characteristics comprise at least one type of characteristic selected from a group of types consisting of a beam intensity, a beam spot size, and an intensity distribution across a beam spot.
7. The apparatus according to claim 1 , wherein, in addition to compensating for the misalignment, the control circuitry is configured to optimize a characteristic of the X-ray beam by setting the electrical currents.
8. The apparatus according to claim 1 , wherein the X-ray tube comprises an integrated magnetic shield, which is configured to protect the electron beam from magnetic fields external to the X-ray tube.
9. A method, comprising:
in an X-ray tube, which comprises an X-ray window, directing an electron beam onto an anode so as to emit an X-ray beam through the X-ray window;
receiving the X-ray beam emitted from the X-ray tube through the X-ray window, and directing the X-ray beam by X-ray optics, which are mounted externally to the X-ray tube with a mechanical misalignment relative to the X-ray tube, onto a target;
steering the electron beam in the X-ray tube using electrical currents flowing through coils surrounding the X-ray tube; and
determining, based on the X-ray beam output from the X-ray optics, respective values of the electrical currents that, when flowing in the coils, steer the electron beam to a region of the anode that causes the X-ray beam to compensate for the mechanical misalignment between the X-ray tube and the X-ray optics, and setting the electrical currents to the determined values.
10. The method according to claim 9 , wherein setting the electrical currents comprises setting the electrical currents to be constant.
11. The method according to claim 9 , wherein setting the electrical currents comprises setting the electrical currents adaptively based on the X-ray beam.
12. The method according to claim 9 , wherein compensating for the misalignment comprises detecting the X-ray beam output by the X-ray optics using a detector, analyzing an output of the detector, and setting the electrical currents depending on the output.
13. The method according to claim 9 , wherein determining the respective values comprises estimating a deviation of an actual characteristic of the emitted X-ray beam from a specified characteristic, and setting the electrical currents depending on the deviation.
14. The method according to claim 13 , wherein the actual and specified characteristics comprise at least one type of characteristic selected from a group of types consisting of a beam intensity, a beam spot size, and an intensity distribution across a beam spot.
15. The method according to claim 9 , and comprising, in addition to compensating for the misalignment, optimizing a characteristic of the X-ray beam by setting the electrical currents.
16. The method according to claim 9 , and comprising protecting the electron beam from magnetic fields external to the X-ray tube by applying an integrated magnetic shield.