IP Library Granted Patent US 9,209,360
Granted Patent B2
US 9,209,360 · App. 14/586,418 · Granted Dec 8, 2015

Vertical topology light-emitting device

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Quick Facts
Patent No.
US 9,209,360
App. No.
14/586,418
Granted
Dec 8, 2015
Kind
B2
Abstract

A vertical topology light emitting device comprises a metal support structure; an adhesion structure on the metal support structure, wherein the adhesion structure comprises a first adhesion layer and a second adhesion layer on the first adhesion layer; a metal layer on the adhesion structure, wherein the adhesion structure is thicker than the metal layer; a GaN-based semiconductor structure on the metal layer, wherein the GaN-based semiconductor structure has a thickness less than 5 micrometers; a multi-layered electrode structure on the GaN-based semiconductor structure; and a protective layer on a side surface and a top surface of the GaN-based semiconductor structure, wherein the protective layer is further disposed on the multi-layered electrode structure.

Claims (47)

1. A light emitting device, comprising:

a metal support structure comprising Cu;

an adhesion structure on the metal support structure;

a first metal layer on the adhesion structure;

a second metal layer comprising Ti on the first metal layer;

a GaN-based semiconductor structure on the second metal layer, wherein the GaN-based semiconductor structure has a thickness less than 5 micrometers;

an interface layer on the GaN-based semiconductor structure; and

a contact pad on the interface layer,

wherein the second metal layer comprises a portion that directly contacts the GaN-based semiconductor structure, and

wherein a thickness of the metal support structure is 0.5 times or less than that of a side width of the GaN-based semiconductor structure.

2. The device according to claim 1 , wherein the adhesion structure comprises a first adhesion layer and a second adhesion layer on the first adhesion layer.

3. The device according to claim 2 , wherein the first adhesion layer is thicker than the second adhesion layer.

4. The device according to claim 1 , wherein the first metal layer is thicker than the second metal layer.

5. The device according to claim 1 , wherein the interface layer comprises Ti.

6. The device according to claim 1 , wherein the interface layer comprises a first interface layer and a second interface layer.

7. The device according to claim 1 , wherein the contact pad comprises Au.

8. The device according to claim 1 , wherein the contact pad has a diameter of 100 microns.

9. A light emitting device, comprising:

a metal support structure;

an adhesion structure on the metal support structure, wherein the adhesion structure comprises a first adhesion layer and a second adhesion layer on the first adhesion layer;

a first metal layer on the adhesion structure;

a second metal layer comprising Ti on the first metal layer;

a GaN-based semiconductor structure on the second metal layer, wherein the GaN-based semiconductor structure has a thickness less than 5 micrometers;

an interface layer on the GaN-based semiconductor structure; and

a contact pad on the interface layer,

wherein the second metal layer comprises a portion that directly contacts the GaN-based semiconductor structure, and

wherein a thickness of the metal support structure is 0.5 times or less than that of a side width of the GaN-based semiconductor structure.

10. The device according to claim 9 , wherein the adhesion structure comprises a first adhesion layer and a second adhesion layer on the first adhesion layer.

11. The device according to claim 10 , wherein the first adhesion layer is thicker than the second adhesion layer.

12. The device according to claim 9 , wherein the first metal layer is thicker than the second metal layer.

13. The device according to claim 9 , wherein the interface layer comprises Ti.

14. The device according to claim 9 , wherein the interface layer comprises a first interface layer and a second interface layer.

15. A light emitting device, comprising:

a support structure;

an adhesion structure comprising Au on the support structure, wherein the adhesion structure comprises a first adhesion layer and a second adhesion layer on the first adhesion layer;

a first metal layer on the adhesion structure;

a second metal layer on the first metal layer;

a GaN-based semiconductor structure on the second metal layer, wherein the GaN-based semiconductor structure has a thickness less than 5 micrometers;

an interface layer on the GaN-based semiconductor structure; and

a contact pad on the interface layer,

wherein the second metal layer comprises a portion that directly contacts the GaN-based semiconductor structure, and

wherein a thickness of the support structure is 0.5 times or less than that of a side width of the GaN-based semiconductor structure.

16. The device according to claim 15 , wherein the adhesion structure comprises a first adhesion layer and a second adhesion layer on the first adhesion layer.

17. The device according to claim 16 , wherein the first adhesion layer is thicker than the second adhesion layer.

18. The device according to claim 15 , wherein the first metal layer is thicker than the second metal layer.

19. The device according to claim 15 , wherein the interface layer comprises Ti.

20. The device according to claim 15 , wherein the interface layer comprises a first interface layer and a second interface layer.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 4, 2015
From: YOO, MYUNG CHEOL
To: LG INNOTEK CO., LTD.
Reel/Frame 036955/0196 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2014
From: YOO, MYUNG CHEOL
To: LG INNOTEK CO., LTD.
Reel/Frame 034603/0418 →