IP Library Granted Patent US 9,724,897
Granted Patent B2
US 9,724,897 · App. 14/591,840 · Granted Aug 8, 2017

Processing method for constraining lower melting point metals within ceramic laminates during sintering

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Quick Facts
Patent No.
US 9,724,897
App. No.
14/591,840
Granted
Aug 8, 2017
Kind
B2
Abstract

A method is described. The method is a method for making a constraining ceramic assembly. The method includes applying at least one metallic electrode to a substrate. The method also includes applying a porous ceramic layer to the substrate to cover the metallic electrode. The method also includes sintering the substrate, the porous ceramic layer, and the metallic electrode together at a sintering temperature above a melting point of the metallic electrode.

Claims (29)

1. A method of making a constraining ceramic assembly, the method comprising:

forming a cavity in a substrate to facilitate flow of at least one metallic electrode during a sintering process;

applying the at least one metallic electrode to the substrate;

applying a porous ceramic layer to the substrate to cover the at least one metallic electrode; and

sintering the substrate, the porous ceramic layer, and the at least one metallic electrode together at a sintering temperature above a melting point of the metallic electrode.

2. The method of claim 1 , further comprising placing a fugitive material into the cavity, wherein the fugitive material is expended during sintering.

3. The method of claim 1 , wherein the cavity is formed to allow the flow of the at least one metallic electrode to form an electrical via.

4. The method of claim 1 , wherein the cavity is formed to allow the flow of the at least one metallic electrode to form a contact pad.

5. The method of claim 1 , wherein the porous ceramic layer has a porosity up to approximately 25%.

6. The method of claim 1 , wherein the sintering temperature is between 1000° C. and 1700° C.

7. An apparatus comprising:

a substrate;

a porous ceramic layer; and

a metallic electrode disposed between the substrate and the porous ceramic layer, wherein the metallic electrode is enclosed by the substrate and the porous ceramic layer; and wherein the substrate and the porous ceramic layer are sintered together with the metallic electrode enclosed, wherein the metallic electrode has a melting point lower than a sintering temperature of the substrate or the porous ceramic layer, wherein the apparatus further comprises a cavity to facilitate flow of the metallic electrode during sintering.

8. The apparatus of claim 7 , wherein the substrate comprises a porous ceramic.

9. The apparatus of claim 7 , wherein the metallic electrode comprises a metal having a melting point below a sintering temperature of the substrate and the porous ceramic layer.

10. The apparatus of claim 9 , wherein the metallic electrode comprises gold.

11. The apparatus of claim 7 , wherein at least one of the substrate and the porous ceramic layer comprises stabilized zirconia.

12. The apparatus of claim 7 , wherein the electrode comprises a metallic ribbon.

13. A system comprising:

a sensor disposed in a gas environment, wherein the sensor is configured to detect a concentration within the gas environment, the sensor comprising:

a substrate;

a porous ceramic layer; and

a metallic electrode disposed between the substrate and the porous ceramic layer, wherein the metallic electrode is enclosed by the substrate and the porous ceramic layer; and wherein the substrate and the porous ceramic layer are sintered together with the metallic electrode enclosed, wherein the metallic electrode has a melting point lower than a sintering temperature of the substrate and the porous ceramic layer, wherein the sensor further comprises a cavity to facilitate flow of the metallic electrode during sintering.

14. The system of claim 13 , wherein the substrate comprises a porous ceramic.

15. The system of claim 13 , wherein the electrode comprises gold.

16. The system of claim 13 , wherein the sensor has a planar geometry.

17. The system of claim 13 , wherein the sensor has a non-planar geometry.

18. The system of claim 13 , further comprising a heater to apply heat to the sensor.

Assignments (5)
TERMINATION AND RELEASE OF CONFIRMATORY GRANT OF SECURITY INTEREST IN PATENTS Recorded Oct 29, 2025
From: JPMORGAN CHASE BANK, N.A.
To: COORSTEK, INC.
Reel/Frame 073414/0270 →
SECURITY INTEREST Recorded Oct 28, 2025
From: COORSTEK, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 072705/0315 →
SECURITY INTEREST Recorded Nov 23, 2022
From: COORSTEK, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 061860/0208 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2021
From: EMISENSE TECHNOLOGIES LLC.
To: COORSTEK INC.
Reel/Frame 057513/0588 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2015
From: WANG, GANGQIANG; FITZPATRICK, JOSEPH; STEPPAN, JAMES JOHN; WOO, LETA YAR-LI; HENDERSON, BRETT TAMATEA; BELL, FRANK
To: EMISENSE TECHNOLOGIES, LLC
Reel/Frame 034742/0188 →