IP Library Granted Patent US 10,156,588
Granted Patent B2
US 10,156,588 · App. 14/593,958 · Granted Dec 18, 2018

Contact tip and contact element and method of producing the same

Inventor: Manuel Petermann (Rosenheim, DE)
Assignee: Multitest Elektronische Systeme GmbH
G01R3/00G01R1/06761H01R43/16Y10T83/04
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Quick Facts
Patent No.
US 10,156,588
App. No.
14/593,958
Granted
Dec 18, 2018
Kind
B2
Abstract

A contact tip for a sequential test of electronic components comprises a base material and a hard material, wherein the base material and the hard material are fixed to each other and wherein the hard material has a thickness of at least 0.03 mm. The contact tip may be the contact tip of a contact element used for a sequential test of electronic components. A method of producing a contact tip of a contact element used for a sequential test of electronic components, comprises: Providing a plate made up of a base material and a hard material, wherein the base material and the hard material are fixed to each other; Cutting the plate along a cut line to form the contact tip wherein the cut line runs through the base material and the hard material and wherein the hard material has a thickness of at least 0.03 mm in a section where the cut line cuts the hard material.

Claims (18)

1. A method of producing a contact tip of a contact element used for a sequential test of electronic components, comprising:

providing a plate made up of a base material and a hard material,

wherein the base material and the hard material are fixed to each other; and

cutting the plate along a cut line to form the contact tip;

wherein the cut line runs through the base material and the hard material; and

wherein the hard material has a thickness of at least 0.03 mm in a section where the cut line cuts the hard material.

2. The method of producing a contact tip according to claim 1 ,

wherein a first section of the cut line runs from the base material to the hard material;

wherein a second section of the cut line cuts the hard material to form a free contact tip end;

wherein a third section of the cut line runs from the hard material to the base material; and

wherein the second section of the cut line extends between the first section and the third section.

3. The method of producing a contact tip according to claim 1 , wherein the plate is made up of the base material and a strip of the hard material being fixed to an edge of the base material.

4. The method of producing a contact tip according to claim 1 , wherein the plate is made up of the base material and an inlay of the hard material being fixed in a through hole of the base material.

5. The method of producing a contact tip according to claim 1 , wherein the plate comprises a pocket in the base material, and wherein the pocket is filled with the hard material.

6. The method of producing a contact tip according to claim 5 , wherein the plate comprises a further pocket on an opposite side of a main plane of the plate regarding the main plane side of the pocket;

wherein the pocket and the further pocket have an overlap; and

wherein the further pocket is filled with a further hard material.

7. The method of producing a contact element according to claim 1 , further comprising cutting the plate along a cut line through the base material to form the contact element.

Assignments (2)
MERGER Recorded Dec 5, 2025
From: MULTITEST ELEKTRONISCHE SYSTEME GMBH
To: COHU GMBH
Reel/Frame 073901/0811 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2015
From: PETERMANN, MANUEL
To: MULTITEST ELEKTRONISCHE SYSTEME GMBH
Reel/Frame 035373/0543 →
Priority Claims (1)
EP 14150596 · Jan 9, 2014 · regional
Continuity (1)
Related Publication 20150192612A1 · Jul 9, 2015