Mixed mode integrated circuit, method of providing a controllable test clock signal to a sub-circuitry of the mixed-mode integrated circuit and method of detecting current paths causing violations of electromagnetic compatibility standards in the mixed mode integrated circuit
View Patent ↗A mixed mode integrated circuit, a method of providing a controllable test clock signal to a sub-circuitry of the mixed-mode integrated circuit and a method of detecting current paths causing violations of electromagnetic compatibility standards in the mixed mode integrated circuit are provided. The mixed mode integrated circuit 100 comprises in addition to a clock network 110 an integrated test clock signal generator 140 to generate test clock signals that are provided via controllable multiplexers 150, 160 to an analog and digital sub-circuitry, respectively, of the mixed-mode integrated circuit. The test clock signals are generated on basis of an input test clock signal having a controllable frequency. The clock network generates clock signals for the sub-circuitries that are used by the sub-circuitries under normal operational conditions. The controllable multiplexers provide either the test clock signal to a specific sub-circuitry or a clock signal received from the clock network.
1. A mixed mode integrated circuit being adapted for electromagnetic compatibility testing, the mixed mode integrated circuit comprising:
an analogue sub-circuitry;
a digital sub-circuitry;
a clock network comprising a clock input and being arranged to provide a first clock signal and a second clock signal in response to a clock signal received at the clock input;
an integrated test clock signal generator being arranged to generate a first test clock signal and to generate a second test clock signal in response to an input test clock signal having a controllable frequency, the first test clock signal and the second test clock signal having a controllable frequency that relates to the controllable frequency of the input test clock signal;
a first controllable clock multiplexer coupled to the first clock signal and to the first test clock signal and being arranged to provide either the first clock signal or the first test clock signal to the analogue sub-circuitry; and
a second controllable clock multiplexer coupled to the second clock signal and to the second test clock signal and being arranged to provide either the second clock signal or the second test clock signal to the digital sub-circuitry.
2. The mixed mode integrated circuit according to claim 1 , wherein the integrated test clock signal generator comprises a delay phasing generator being arranged to control a phase of at least one of the first test clock signal and the second test clock signal.
3. The mixed mode integrated circuit according to claim 2 , wherein the delay phasing generator comprises
a first series arrangement of clock delay circuitries, the first series arrangement being coupled between an input receiving the input test clock signal and an output providing the first test clock signal;
a plurality of controllable switches each being arranged parallel to one clock delay circuitry of the first series arrangement of clock delay circuitries for short circuiting an input and an output of the one clock delay circuitry in dependence of a control signal from a first set of control signals; and
a controller being arranged to provide the first set of control signals to the plurality of controllable switches for controlling the controllable phase of the first test clock signal.
4. The mixed mode integrated circuit according to claim 1 , wherein the delay phasing generator comprises
a second series arrangement of clock delay circuitries, the second series arrangement being coupled between an input receiving the input test clock signal and an output providing the second test clock signal;
a plurality of further controllable switches each being arranged parallel to one clock delay circuitry of the second series arrangement of clock delay circuitries for short circuiting an input and an output of the one clock delay circuitry in dependence of a control signal from a second set of control signals; and
the delay phasing generator comprises a controller being arranged to provide the second set of control signals to the plurality of controllable switches for controlling the controllable phase of the second test clock signal.
5. The mixed mode integrated circuit according to claim 3 wherein the controller comprises a fuse matrix for coupling the control signals of the first set of control signals and/or the control signals of the second set of control signals to a first control voltage or a second control voltage, the fuse matrix comprises fuses being arranged in a matrix and being arranged to be disabled by a high current.
6. The mixed mode integrated circuit according to claim 1 wherein the analogue sub-circuitry and the digital sub-circuitry are coupled to a power supply,
the mixed mode integrated circuit further comprising a first matched load, a second matched load, a first controllable switch and a second controllable switch;
a series arrangement of the first matched load and the first controllable switch is coupled to the power supply and is arranged parallel to the analogue sub-circuitry;
a series arrangement of the second matched load and the second controllable switch is coupled to the power supply and is arranged parallel to the digital sub-circuitry;
wherein an impedance of the first matched load is selected to provide, when the first controllable switch is controlled in a conducting state, a dc load to the power supply that is substantially equal to a dc load of the analogue sub-circuitry in normal operation; and
an impedance of the second matched load is selected to provide, when the second controllable switch is controlled in a conducting state, a dc load to the power supply that is about equal to a dc load of the digital sub-circuitry in normal operation.
7. The mixed mode integrated circuit according to claim 6 , further comprising a sub-circuitry on/off controller being arranged to control the analogue sub-circuitry and/or the digital sub-circuitry in an on mode or an off mode, to control the first controllable switch in the conducting state when the analogue sub-circuitry is controlled in the off mode and to control the second controllable switch in the conducting state when the digital sub-circuitry is controlled in the off-mode.
8. The mixed mode integrated circuit according to claim 1 further comprising a further analogue circuit and a third controllable clock multiplexer, the clock network being further arranged to provide a third clock signal, the integrated test clock signal generator being further arranged to generate a third test clock signal, the third controllable clock multiplexer being coupled to the third clock signal and to the third test clock signal and being arranged to provide either the third clock signal or the third test clock signal to the further analogue sub-circuitry.
9. The mixed mode integrated circuit according to claim 1 further comprising a further digital circuit and a fourth controllable clock multiplexer, the clock network being further arranged to provide a fourth clock signal, the integrated test clock signal generator being further arranged to generate a fourth test clock signal, the fourth controllable clock multiplexer being coupled to the fourth clock signal and to the fourth test clock signal and being arranged to provide either the fourth clock signal or the fourth test clock signal to the further digital sub-circuitry.
10. An integrated circuit design of the mixed mode integrated circuit according to claim 1 .
11. A method of providing a controllable test clock signal to a sub-circuitry of a mixed mode integrated circuit, the mixed mode integrated circuit comprising an analogue sub-circuitry and a digital sub-circuitry, a clock network comprising a clock input, the method comprises:
providing, by the clock network, a first clock signal and a second clock signal in response to a clock signal received at the clock input;
receiving an input test clock signal having a controllable frequency;
generating, by an integrated test clock signal generator, a first test clock signal and a second test clock signal based on the input test clock signal, the first test clock signal and the second test clock signal having a controllable frequency that relates to the controllable frequency of the input test clock signal; and
providing, by a first controllable clock multiplexer, either the first test clock signal or the first clock signal to the analogue sub-circuitry, wherein the first controllable clock multiplexer coupled to the first clock signal and to the first test clock signal; and
providing, by a second controllable clock multiplexer, either the second test clock signal or the second clock signal to the digital sub-circuitry, wherein second controllable clock multiplexer coupled to the second clock signal and to the second test clock signal.
12. The method of providing a controllable test clock signal to sub-circuitries of a mixed mode integrated circuit according to claim 11 , the analogue sub-circuitry and the digital sub-circuitry being coupled to a power supply of the mixed-mode integrated circuit, the method further comprising
switching the analogue sub-circuitry or the digital sub-circuitry in an off-state; and
coupling a matched load to the power supply in parallel to said switched off analogue or digital sub-circuitry, wherein an impedance of the matched load is selected to provide a dc load to the power supply that is substantially equal to a dc load of the switched off sub-circuitry in normal operation.
13. The method of detecting current paths causing violations of for electromagnetic compatibility standards in a mixed mode integrated circuit, the method comprises the method of providing a controllable test clock signal to sub-circuitries of a mixed mode integrated circuit according to claim 11 and the method comprises detecting currents paths causing the violations of for electromagnetic compatibility standards in one of the analogue sub-circuitry or the digital sub-circuitry when at least one of the analogue sub-circuitry and the digital sub-circuitry receives the first test clock signal and the second clock signal, respectively.
14. A non-transitory computer program product comprising instructions for causing a programmable apparatus to perform a method of providing a controllable test clock signal to sub-circuitries of a mixed mode integrated circuit the method comprising:
receiving an integrated circuit design representing a mixed mode integrated circuit, the mixed mode integrated circuit comprising an analogue sub-circuitry and a digital sub-circuitry, a clock network comprising a clock input;
providing, by the clock network, a first clock signal and a second clock signal in response to a clock signal received at the clock input;
receiving an input test clock signal having a controllable frequency;
generating, by an integrated test clock signal generator, a first test clock signal and a second test clock signal based on the input test clock signal, the first test clock signal and the second test clock signal having a controllable frequency that relates to the controllable frequency of the input test clock signal;
providing, by a first controllable clock multiplexer, either the first test clock signal or the first clock signal to the analogue sub-circuitry, wherein the first controllable clock multiplexer coupled to the first clock signal and to the first test clock signal; and
providing, by a second controllable clock multiplexer, either the second test clock signal or the second clock signal to the digital sub-circuitry, wherein second controllable clock multiplexer coupled to the second clock signal and to the second test clock signal.
15. The non-transitory computer program product according to claim 14 , wherein the method further comprises detecting currents paths causing violations of electromagnetic compatibility standards in one of the analogue sub-circuitry or the digital sub-circuitry when at least one of the analogue sub-circuitry and the digital sub-circuitry receive the first test clock signal and the second clock signal, respectively.
16. A non-transitory tangible computer readable storage medium comprising data loadable in a programmable apparatus, the data representing instructions executable by the programmable apparatus, said instructions comprising:
one or more receiving instructions for receiving an integrated circuit design representing a mixed mode integrated circuit, the mixed mode integrated circuit comprising an analogue sub-circuitry and a digital sub-circuitry, a clock network comprising a clock input and being arranged to provide a first clock signal to the analogue sub-circuitry and a second clock signal to the digital sub-circuitry on basis of a clock signal received at the clock input;
one or more further receiving instructions for receiving an input test clock signal having a controllable frequency;
one or more generating instructions for generating, by an integrated test clock signal generator, a first test clock signal and a second test clock signal on basis of the input test clock signal, the first test clock signal and the second test clock signal having a controllable frequency that relates to the controllable frequency of the input test clock signal;
one or more providing instructions for providing, by a first controllable clock multiplexer, either the first test clock signal or the first clock signal to the analogue sub-circuitry, wherein the first controllable clock multiplexer coupled to the first clock signal and to the first test clock signal; and
providing, by a second controllable clock multiplexer, either the second test clock signal or the second clock signal to the digital sub-circuitry, wherein second controllable clock multiplexer coupled to the second clock signal and to the second test clock signal.
17. The non-transitory tangible computer readable storage medium according to claim 16 , said instructions further comprising
one or more detecting instructions for detecting currents paths causing violations of electromagnetic compatibility standards in one of the analogue sub-circuitry or the digital sub-circuitry when at least one of the analogue sub-circuitry and the digital sub-circuitry receive the first test clock signal and the second clock signal, respectively.