IP Library Granted Patent US 9,570,274
Granted Patent B2
US 9,570,274 · App. 14/607,997 · Granted Feb 14, 2017

Plasma activated conformal dielectric film deposition

Inventors: Shankar Swaminathan (Beaverton, OR); Jon Henri (West Linn, OR); Dennis Hausmann (Lake Oswego, OR); Pramod Subramonium (Beaverton, OR); Mandyam Sriram (San Jose, CA); Vishwanathan Rangarajan (Fremont, CA); Kirthi Kattige (Portland, OR); Bart van Schravendijk (Palo Alto, CA); Andrew J. McKerrow (Lake Oswego, OR)
Assignee: Novellus Systems, Inc.
H01J37/32412C23C16/045C23C16/345C23C16/401C23C16/402C23C16/4408C23C16/4554C23C16/45523C23C16/45544C23C16/52C23C16/56H01L21/0217H01L21/02129H01L21/02164H01L21/02274H01L21/02348H01L21/67017H01L21/76831H01L21/76898H01J2237/3321H01J2237/3365
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Quick Facts
Patent No.
US 9,570,274
App. No.
14/607,997
Granted
Feb 14, 2017
Kind
B2
Abstract

Methods of depositing a film on a substrate surface include surface mediated reactions in which a film is grown over one or more cycles of reactant adsorption and reaction. In one aspect, the method is characterized by intermittent delivery of dopant species to the film between the cycles of adsorption and reaction.

Claims (14)

1. A method of depositing a film on a non-planar substrate surface in a reaction chamber, the method comprising:

introducing a first reactant into the reaction chamber under non-plasma conditions allowing the first reactant to adsorb onto the non-planar substrate surface;

introducing a dopant containing material into the reaction chamber under non-plasma conditions; and

subsequently exposing the non-planar substrate surface to plasma to form a doped film conformal to the non-planar substrate surface.

2. The method of claim 1 , wherein the first reactant is a silicon-containing reactant.

3. The method of claim 1 , wherein the dopant is selected from the group consisting of boron, phosphorous, arsenic, and gallium.

4. The method of claim 1 , further comprising, prior to exposing the non-planar substrate surface to plasma, introducing a second reactant into the reaction chamber.

5. The method of claim 4 , wherein the second reactant is an oxidant.

6. The method of claim 4 , wherein the second reactant is an nitrogen-containing reactant.

7. The method of claim 1 , wherein the doped film is a doped silicon oxide film.

8. The method of claim 1 , wherein the doped film is a doped silicon nitride film.

9. The method of claim 1 , wherein the doped film is a doped silicon carbide film.

10. The method of claim 1 , further comprising introducing a second reactant into the reaction chamber while the first reactant is adsorbed onto the non-planar substrate surface.

11. The method of claim 10 , further comprising exposing the non-planar substrate surface to plasma to drive a reaction between the first and second reactants on the substrate surface to form a portion of the film.

Continuity (9)
Continuation 14133239 · Dec 18, 2013
Division 13242084 · Sep 23, 2011
Continuation In Part 13084399 · Apr 11, 2011
Continuation In Part 13084305 · Apr 11, 2011
Provisional Application 61324710 · Apr 15, 2010
Provisional Application 61372367 · Aug 10, 2010
Provisional Application 61379081 · Sep 1, 2010
Provisional Application 61417807 · Nov 29, 2010
Related Publication 20150206719A1 · Jul 23, 2015