IP Library Granted Patent US 9,531,383
Granted Patent B2
US 9,531,383 · App. 14/608,279 · Granted Dec 27, 2016

Semiconductor device and method of controlling the same

Inventor: Masahisa Tamura (Kanagawa, JP)
Assignee: Sony Semiconductor Solutions Corporation
H03K19/0008G06F1/3287Y02B60/1282
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Quick Facts
Patent No.
US 9,531,383
App. No.
14/608,279
Granted
Dec 27, 2016
Kind
B2
Abstract

A semiconductor device includes: a first signal generation section configured to generate an activation signal having a variable duty ratio; and a first processing section configured to perform intermittent operation, based on the activation signal.

Claims (46)

1. A semiconductor device comprising:

a first signal generation section configured to generate an activation signal having a variable duty ratio;

a first processing section configured to perform intermittent operation, based on the activation signal; and

a second processing section, wherein

the first signal generation section varies the duty ratio, based on an operation frequency of the second processing section.

2. The semiconductor device according to claim 1 , further comprising

a power source section configured to supply power to the first processing section and the second processing section.

3. The semiconductor device according to claim 1 , wherein the first signal generation section counts pulses of a second clock signal by a number corresponding to the operation frequency in a period of a predetermined length indicated by a first clock signal, to generate the activation signal.

4. A semiconductor device comprising:

a first signal generation section configured to generate an activation signal having a variable duty ratio;

a first processing section configured to perform intermittent operation, based on the activation signal; and

a second signal generation section configured to generate a first control signal and a second control signal based on the activation signal, the first control signal and the second control signal being different in transition timing from each other, wherein

the first processing section includes

a first circuit block configured to perform the intermittent operation based on the first control signal, and

a second circuit block configured to operate based on an output signal of the first circuit block, and to perform the intermittent operation based on the second control signal.

5. The semiconductor device according to claim 4 , wherein the second circuit block is activated after the first circuit block is activated, in the intermittent operation.

6. The semiconductor device according to claim 5 , wherein the first circuit block stops operation after the second circuit block stops operation, in the intermittent operation.

7. The semiconductor device according to claim 4 , wherein the second signal generation section counts up or counts down pulses of a third clock signal, based on a transition direction of the activation signal, and generates the first control signal and the second control signal based on the count value.

8. The semiconductor device according to claim 4 , wherein the second signal generation section includes

a delay section configured to delay the activation signal to generate a plurality of signals different in transition timing from one another, and

a selector section configured to select one of the plurality of signals to output the selected signal as the first control signal, and configured to select another one of the plurality of signals to outputs the selected signal as the second control signal, based on the activation signal.

9. The semiconductor device according to claim 4 , wherein the second signal generation section delays the first control signal to generate the second control signal.

10. A method of controlling a semiconductor device, the method comprising:

varying a duty ratio of an activation signal;

performing, by a first processing section, intermittent operation, based on the activation signal; and

varying, by the first signal generation section, the duty ratio, based on an operation frequency of a second processing section.

11. A semiconductor device comprising:

a first signal generation circuitry configured to generate an activation signal having a variable duty ratio;

a first processing circuitry configured to perform intermittent operation, based on the activation signal; and

a second processing circuitry, wherein

the first signal generation circuitry varies the duty ratio, based on an operation frequency of the second processing circuitry.

12. The semiconductor device according to claim 11 , further comprising

a power source circuitry configured to supply power to the first processing circuitry and the second processing circuitry.

13. The semiconductor device according to claim 11 , wherein the first signal generation circuitry counts pulses of a second clock signal by a number corresponding to the operation frequency in a period of a predetermined length indicated by a first clock signal, to generate the activation signal.

14. The semiconductor device according to claim 11 , further comprising:

a second signal generation circuitry configured to generate a first control signal and a second control signal based on the activation signal, the first control signal and the second control signal being different in transition timing from each other, wherein

the first processing circuitry includes:

a first circuit block configured to perform the intermittent operation based on the first control signal, and

a second circuit block configured to operate based on an output signal of the first circuit block, and to perform the intermittent operation based on the second control signal.

15. The semiconductor device according to claim 14 , wherein the second circuit block is activated after the first circuit block is activated, in the intermittent operation.

16. The semiconductor device according to claim 15 , wherein the first circuit block stops operation after the second circuit block stops operation, in the intermittent operation.

17. The semiconductor device according to claim 14 , wherein the second signal generation circuitry counts up or counts down pulses of a third clock signal, based on a transition direction of the activation signal, and generates the first control signal and the second control signal based on the count value.

18. The semiconductor device according to claim 14 , wherein the second signal generation circuitry includes:

a delay circuitry configured to delay the activation signal to generate a plurality of signals different in transition timing from one another, and

a selector circuitry configured to select one of the plurality of signals to output the selected signal as the first control signal, and configured to select another one of the plurality of signals to outputs the selected signal as the second control signal, based on the activation signal.

19. The semiconductor device according to claim 14 , wherein the second signal generation circuitry delays the first control signal to generate the second control signal.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ZIP CODE FROM 246-0014 TO 243-0014 PREVIOUSLY RECORDED AT REEL: 039645 FRAME: 0019. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Dec 13, 2016
From: SONY CORPORATION
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 040894/0926 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 10, 2016
From: SONY CORPORATION
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 039645/0019 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2015
From: TAMURA, MASAHISA
To: SONY CORPORATION
Reel/Frame 034839/0695 →
Priority Claims (1)
JP 2014-027607 · Feb 17, 2014 · national
Continuity (1)
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