IP Library Granted Patent US 10,073,202
Granted Patent B2
US 10,073,202 · App. 14/621,899 · Granted Sep 11, 2018

Near-infrared cut filter

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Quick Facts
Patent No.
US 10,073,202
App. No.
14/621,899
Granted
Sep 11, 2018
Kind
B2
Abstract

A near-infrared cut filter has an optical multilayer provided on at least one main surface of a transparent substrate, in which the optical multilayer is formed of a high-refractive index layer having a refractive index of 2.0 or more, and a low-refractive index layer having a refractive index of 1.6 or less at a wavelength of 500 nm, and the optical multilayer has a repeating structure of (a n Q H , b n Q L , c n Q H , d n Q L )^n when a QWOT at the wavelength of 500 nm of the high-refractive index layer is set to Q H , and a QWOT at the wavelength of 500 nm of the low-refractive index layer is set to Q L , in which an average value of the a n is not less than 1.5 nor more than 2.5, and a value obtained by averaging average values of the respective b n , c n , and d n is 1.0 or less.

Claims (14)

1. A near-infrared cut filter, comprising:

a transparent substrate; and

an optical multilayer provided on at least one main surface of the transparent substrate, wherein:

the optical multilayer is formed of a high-refractive index layer having a refractive index of 2.0 or more, and a low-refractive index layer having a refractive index of 1.6 or less at a wavelength of 500 nm; and

the optical multilayer has a repeating structure of (a n Q H , b n Q L , c n Q H , d n Q L )^n when a Quarter Wave Optical Thickness (QWOT) at the wavelength of 500 nm of the high-refractive index layer is set to Q H , and a QWOT at the wavelength of 500 nm of the low-refractive index layer is set to Q L , in which an average value of the a n is not less than 1.5 nor more than 2.5, and a value obtained by averaaing average values of the respective b n , c n , and d n is 1.0 or less, wherein n represents a number of base units (a n Q H , b n Q L , c n Q H , d n Q L ) that are stacked to form the optical multilayer, and wherein each of a n , b n , c n , and d n is a coefficient in each base unit, and represents that a physical layer thickness of a layer in each base unit corresponds to a product as a result of multiplying the QWOT by that coefficient.

2. The near-infrared cut filter according to claim 1 ,

wherein the average value of the c n is not less than 0.2 nor more than 0.5.

3. The near-infrared cut filter according to claim 1 ,

wherein ratios b n /d n , and d n /b n are calculated in each of the repeatedly stacked base units, and for each number of base units n, the larger of the ratios b n /d n and d n /b n is used to calculate an average for all of the repeatedly stacked based units, and the value obtained by averaging such larger values of the calculated b n /d n and d n /b n for each number of base units is not less than 1.1 nor more than 2.5.

4. The near-infrared cut filter according to claim 1 ,

wherein the n is not less than 9 nor more than 25.

5. The near-infrared cut filter according to claim 1 ,

wherein the transparent substrate has absorption of light in a near-infrared wavelength region.

6. The near-infrared cut filter according to claim 1 , wherein the average value of the c n is not less than 0.2 nor more than 0.4.

Assignments (2)
CHANGE OF NAME Recorded Aug 7, 2018
From: ASAHI GLASS COMPANY, LIMITED
To: AGC INC.
Reel/Frame 046730/0786 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2015
From: TATEMURA, MITSUYUKI
To: ASAHI GLASS COMPANY, LIMITED
Reel/Frame 035115/0484 →