Electronic devices and method of controlling an electronic device

1. An electronic device, comprising:

a memory configured to store a look-up table,

a plurality of electronic circuits including

a first electronic circuit, and

a second electronic circuit; and

at least one processor configured to control the first electronic circuit based on

a first parameter, stored in the look-up table, indicating a thermal property of the first electronic circuit, the first parameter indicating a slope of a temperature measurement signal of the first electronic circuit,

a second parameter, stored in the look-up table, indicating a thermal property of the first electronic circuit, the second parameter indicating an average temperature of the first electronic circuit, and

a predetermined parameter indicating a thermal interdependency between the first electronic circuit and the second electronic circuit, the predetermined parameter indicating a comparison of a temperature change of the first electronic circuit and power consumed by the second electronic circuit,

wherein the at least one processor is configured to control the first electronic circuit by selecting an electronic circuit throttling scheme, from a plurality of electronic circuit throttling schemes, based on the first parameter indicating the slope of the temperature measurement signal, the second parameter indicating the average temperature, and the predetermined parameter indicating the thermal interdependency between the first electronic circuit and the second electronic circuit,

wherein the selected electronic circuit throttling scheme is associated with a plurality of electronic circuit throttling classes; and

wherein the at least one processor is further configured to activate at least one electronic circuit throttling class, from the one or more electronic circuit throttling classes, in accordance with the selected electronic circuit throttling scheme and based on the first parameter indicating the slope of the temperature measurement signal and the second parameter indicating the average temperature within the stored look-up table.

2. The electronic device of claim 1 ,

wherein the at least one processor is further configured to control the first electronic circuit based on at least one parameter indicating thermal properties of the second electronic circuit.

3. The electronic device of claim 1 , further comprising:

at least one temperature sensor configured to measure a temperature of at least a portion of at least one of the first electronic circuit or the second electronic circuit.

4. The electronic device of claim 1 ,

wherein the at least one processor is further configured to control a performance of the second electronic circuit based on the predetermined parameter indicating the thermal interdependency between the first electronic circuit and the second electronic circuit.

5. The electronic device of claim 1 ,

wherein the memory is further configured to store information about thermal properties of each electronic circuit of the plurality of electronic circuits.

6. The electronic device of claim 1 ,

wherein the memory is further configured to store information about thermal interdependencies between all electronic circuits of the plurality of electronic circuits,

wherein the at least one processor is further configured to select one or more electronic circuits of the plurality of electronic circuits for performance control, based on a portion of the stored information about thermal interdependencies between all electronic circuits of the plurality of electronic circuits.

7. An electronic device, comprising:

a memory configured to store a look-up table;

a plurality of electronic circuits; and

a processor configured to control at least one electronic circuit of the plurality of electronic circuits based on

a first parameter, stored in the look-up table, indicating a thermal property of the at least one electronic circuit, the first parameter indicating a slope of a temperature measurement signal of the at least one electronic circuit,

a second parameter, stored in the look-up table, indicating a thermal property of the at least one electronic circuit, the second parameter indicating an average temperature of the at least one electronic circuit, and

a thermal interaction of the at least one electronic circuit with at least one further electronic circuit of the plurality of electronic circuits, the thermal interaction indicating a comparison of a temperature increase of the at least one further electronic circuit and power consumed by the at least one electronic circuit,

wherein the processor is configured to control the at least one electronic circuit by selecting an electronic circuit throttling scheme based on the first parameter indicating the slope of the temperature measurement signal, the second parameter indicating the average temperature, and the thermal interaction of the at least one electronic circuit with the at least one further electronic circuit,

wherein the selected electronic circuit throttling scheme is associated with a plurality of electronic circuit throttling classes, and

wherein the processor is further configured to determine at least one electronic circuit throttling class for activation, from the plurality of electronic circuit throttling classes, in accordance with the selected electronic circuit throttling scheme and based on the first parameter indicating the slope of the temperature measurement signal and the second parameter indicating the average temperature within the stored look-up table.

8. The electronic device of claim 7 ,

wherein the memory is further configured to store information about

one or more thermal properties of the at least one electronic circuit,

one or more thermal properties of the at least one further electronic circuit, and/or

the thermal interaction of the at least one electronic circuit with the at least one further electronic circuit.

9. The electronic device of claim 7 ,

wherein the memory is further configured to store information about thermal interdependencies between all electronic circuits of the plurality of electronic circuits.

10. The electronic device of claim 7 ,

wherein the memory is further configured to store information about thermal properties of each electronic circuit of the plurality of electronic circuits.

11. An electronic device, comprising:

a plurality of chip modules;

a memory configured to store

information about self-heating of at least one chip module of the plurality of chip modules in a look-up table, the stored information about self-heating of the at least one chip module including information indicating a slope of a temperature measurement signal of the at least one chip module and information indicating an average temperature of the at least one chip module, and

information about cross-heating of the plurality of chip modules indicating a temperature influence between the at least one chip module of the plurality of chip modules and one or more other chip modules of the plurality of chip modules; and

at least one processor configured to control the at least one chip module based on the stored information about self-heating of the at one chip module and the stored information about cross-heating of the plurality of chip modules,

wherein the at least one processor is configured to control the at least one chip module by selecting a chip module throttling scheme, from a plurality of chip module throttling schemes, based on the stored information indicating the slope of the temperature measurement signal, the stored information indicating the average temperature, and the stored information about cross-heating of the plurality of chip modules,

wherein the selected chip module throttling scheme is associated with one or more chip module throttling classes, and

wherein the at least one processor is further configured to activate at least one chip module throttling class, from the one or more chip module throttling classes, in accordance with the selected chip module throttling scheme and based on the stored information indicating the slope of the temperature measurement signal and the stored information indicating the average temperature within the stored look-up table.

12. The electronic device of claim 11 ,

wherein the memory is further configured to store, for each chip module of the plurality of chip modules, a respective chip module throttling scheme and information to change a power consumption of the respective chip module.

13. The electronic device of claim 1 ,

wherein at least one electronic circuit throttling class of the plurality of electronic circuit throttling classes has a plurality of electronic circuit throttling mechanisms associated therewith, and

wherein at least one electronic circuit throttling mechanism of the plurality of electronic circuit throttling mechanisms is configured to reduce power consumption of the electronic device.

14. The electronic device of claim 1 , further comprising:

at least one temperature sensor configured to measure a temperature of at least a portion of the first electronic circuit; and

a noise filtering circuit configured to generate the temperature measurement signal by filtering the measured temperature from the at least one temperature sensor.

15. The electronic device of claim 13 ,

wherein at least two different electronic circuit throttling classes of the plurality of electronic circuit throttling classes share a common electronic circuit throttling mechanism of the plurality of electronic circuit throttling mechanisms.

16. The electronic device of claim 11 ,

wherein the memory is further configured to store information about cross-heating of a further chip module of the plurality of chip modules,

wherein the stored information about cross-heating of the further chip module indicates a temperature influence of the further chip module to the at least one chip module, and

wherein the at least one processor is further configured to control a performance the further chip module based on the stored information about cross-heating of the further chip module satisfying a criteria.

17. The electronic device of claim 16 ,

wherein the criteria is satisfied when the stored information about cross-heating of the further chip module exceeds a threshold value.

18. The electronic device of claim 1 ,

wherein the memory is further configured to store information about cross-heating of a further electronic circuit of the plurality of electronic circuits,

wherein the stored information about cross-heating of the further electronic circuit indicates a temperature influence of the further electronic circuit to the first electronic circuit, and

wherein the at least one processor is further configured to control a performance the further electronic circuit based on the stored information about cross-heating of the further electronic circuit satisfying a criteria.

19. The electronic device of claim 18 ,

wherein the criteria is satisfied when the stored information about cross-heating of the further electronic circuit exceeds a threshold value.

20. The electronic device of claim 7 ,

wherein the memory is further configured to store information about cross-heating of a further electronic circuit of the plurality of electronic circuits,

wherein the stored information about cross-heating of the further electronic circuit indicates a temperature influence of the further electronic circuit to the at least one electronic circuit, and

wherein the at least one processor is further configured to control a performance the further electronic circuit based on the stored information about cross-heating of the further electronic circuit satisfying a criteria.

21. The electronic device of claim 20 ,

wherein the criteria is satisfied when the stored information about cross-heating of the further electronic circuit exceeds a threshold value.