IP Library Granted Patent US 10,008,958
Granted Patent B2
US 10,008,958 · App. 14/624,945 · Granted Jun 26, 2018

Capacitive micro-machined transducer and method of manufacturing the same

Inventors: Peter Dirksen (Valkenswaard, NL); Ruediger Mauczok (Erkelenz, DE); Koray Karakaya (Eindhoven, NL); Johan Hendrik Klootwijk (Eindhoven, NL); Bout Marcelis (Eindhoven, NL); Marcel Mulder (Eindhoven, NL)
Assignee: Koninklijke Philips N.V.
H02N1/006B06B1/0292B81B3/00B81C1/00158B81C1/00373H02N1/08B81B2203/0127
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Quick Facts
Patent No.
US 10,008,958
App. No.
14/624,945
Granted
Jun 26, 2018
Kind
B2
Abstract

The present invention relates to a method of manufacturing a capacitive micro-machined transducer ( 100 ), in particular a CMUT, the method comprising depositing a first electrode layer ( 10 ) on a substrate ( 1 ), depositing a first dielectric film ( 20 ) on the first electrode layer ( 10 ), depositing a sacrificial layer ( 30 ) on the first dielectric film ( 20 ), the sacrificial layer ( 30 ) being removable for forming a cavity ( 35 ) of the transducer, depositing a second dielectric film ( 40 ) on the sacrificial layer ( 30 ), and depositing a second electrode layer ( 50 ) on the second dielectric film ( 40 ), wherein the first dielectric film ( 20 ) and/or the second dielectric film ( 40 ) comprises a first layer comprising an oxide, a second layer comprising a high-k material, and a third layer comprising an oxide, and wherein the depositing steps are performed by Atomic Layer Deposition. The present invention further relates to a capacitive micro-machined transducer ( 100 ), in particular a CMUT, manufactured by such method.

Claims (16)

1. A capacitive micromachined ultrasound transducer, comprising:

a first electrode layer on a substrate, wherein the first electrode layer comprises a first non-metal conductive material;

a first dielectric layer on the first electrode layer, wherein the first dielectric layer comprises a first layer comprising an oxide, a second layer comprising an oxide, and a high-k material layer having a high dielectric constant, wherein the high-k material layer is sandwiched between the first oxide layer and the second oxide layer, and wherein the first dielectric layer comprises a residual from atomic layer deposition;

a membrane above the first dielectric layer, wherein a cavity is formed between the first dielectric layer and the membrane; and

a second electrode layer formed on the membrane, wherein the second electrode layer comprises a second non-metal conductive material, and wherein the transducer is configured to be coupled to a voltage source that is configured to apply a voltage such that during operation the transducer is in a collapsed mode.

2. The capacitive micromachined ultrasound transducer of claim 1 , wherein the high dielectric constant is between 8 and 9 or between 12 and 27.

3. The capacitive micromachined ultrasound transducer of claim 1 , wherein the high-k material layer having the high dielectric constant comprises Aluminum Oxide or Hafnium Oxide.

4. The capacitive micromachined ultrasound transducer of claim 1 , wherein the membrane comprises a second dielectric layer, wherein the second dielectric layer includes another layer having a high dielectric constant sandwiched between first and second layers comprising an oxide.

5. The capacitive micromachined ultrasound transducer of claim 1 , wherein the first dielectric layer has a thickness of less than 100 nm.

6. The capacitive micromachined ultrasound transducer of claim 1 , wherein the layer having a high dielectric constant has a thickness of less than 100 nm.

7. The capacitive micromachined ultrasound transducer of claim 1 , wherein the residual from atomic layer deposition comprises carbon or chlorine.

8. The capacitive micromachined ultrasound transducer of claim 1 , having a circular, square or hexagonal shape.

9. The capacitive micromachined ultrasound transducer of claim 1 , comprising a single cell.

10. The capacitive micromachined ultrasound transducer of claim 1 , comprising an array of cells.

11. The capacitive micromachined ultrasound transducer of claim 1 , wherein at least one of the first non-metal conductive material and the second non-metal conductive material includes at least one of titanium nitride, tantalum nitride, iridium oxide, indium tin oxide, strontium ruthenate, TaCN, and LaNiO 3 .

12. The capacitive micromachined ultrasound transducer of claim 1 , wherein at least one of the first non-metal conductive material and the second non-metal conductive material includes polysilicon.

Assignments (1)
NUNC PRO TUNC ASSIGNMENT Recorded Jun 5, 2026
From: XIVER MEMS FOUNDRY B.V.
To: MEMS.WORKS HOLDING B.V.
Reel/Frame 074869/0144 →
Continuity (3)
Continuation 14369341
Provisional Application 61591344 · Jan 27, 2012
Related Publication 20150162852A1 · Jun 11, 2015