Methods, apparatuses, systems and software for treatment of a specimen by ion-milling

1. An apparatus, comprising:

a) a specimen holder, configured to hold a specimen in a stationary position;

b) a table, configured to change the stationary position of the specimen holder in any of three orthogonal linear directions and an angular direction;

c) one or more ion sources;

d) rotatable ion optics, configured to emit an ion beam towards a predetermined location on the specimen from any of the one or more ion sources at any angle around an axis orthogonal to a horizontal surface of the table while the specimen holder and the specimen are stationary;

e) a motor configured to rotate the ion optics; and

f) an imaging device, configured to generate an image of the specimen including the predetermined location simultaneously with the rotatable ion optics emitting the ion beam.

2. The apparatus of claim 1 , wherein the table includes a first mechanism to move the sample holder in a lateral direction, a second mechanism to move the sample holder in a longitudinal direction, a third mechanism to move the sample holder in a vertical direction, and a fourth mechanism to move the sample holder in the angular direction, the angular direction being defined by an axis in a plane defined by the lateral and longitudinal directions.

3. The apparatus of claim 1 , wherein the imaging device comprises an optical camera, a microscope, and/or a thermo-vision device.

4. The apparatus of claim 1 , further comprising a laser configured to irradiate the predetermined location with a predetermined dose of radiation.

5. The apparatus of claim 1 , further comprising a laser interferometer configured to determine a depth of ion milling into the specimen at the predetermined location.

6. The apparatus of claim 1 , further comprising a vacuum chamber configured to sealingly house at least the specimen holder and the ion optics.

7. The apparatus of claim 1 , wherein the imaging device comprises a microscope or an interferometer that measures a milling depth at the predetermined location.

8. The apparatus of claim 1 , wherein the one or more ion sources includes a first ion source and a second ion source different from the first ion source.

9. The apparatus of claim 8 , wherein the first ion source is selected from the group consisting of noble gas ion sources and the second ion source is selected from the group consisting of Group 3, Group 4 and Group 5 ion sources.

10. The apparatus of claim 8 , wherein the first ion source comprises a duoplasmatron and the second ion source comprises a liquid metal ion source or a cluster ion source.

11. The apparatus of claim 1 , wherein the ion optics comprises (i) a first ion path configured to emit the ion beam at a first angle relative to an exposed surface of the specimen and (ii) a second ion path configured to emit the ion beam at a second angle relative to the exposed surface of the specimen, the first and second angles differing by at least 10°.

12. The apparatus of claim 11 , wherein the ion optics focuses the ion beam in each of the first and second ion paths onto the predetermined location on the specimen.

13. The apparatus of claim 11 , wherein the one or more ion sources and the imaging device are on a same side of the specimen holder and the table.

14. The apparatus of claim 11 , wherein the first and second angles differ by at least 35°.

15. The apparatus of claim 11 , wherein the ion optics further comprises a first matching lens configured to focus the ion beam from the one or more ion sources, and a bidirectional deflector configured to direct the ion beam to either the first ion path or the second ion path.

16. The apparatus of claim 15 , wherein the ion optics further comprises a first deflector receiving the ion beam from the one or more ion sources, and a beam current monitor configured to determine a beam current of the ion beam.

17. The apparatus of claim 15 , wherein the first ion path comprises a beam stigmator, an objective lens, and a beam scanning plate, and the second ion path comprises a second matching lens, a second beam deflector, and a quadrupole beam aligner.

18. An apparatus, comprising:

a) a specimen holder, configured to hold a specimen in a stationary position;

b) a table, configured to change the stationary position of the specimen holder in any of three orthogonal linear directions and an angular direction;

c) one or more ion sources;

d) rotatable ion optics, configured to emit an ion beam towards a predetermined location on the specimen from any of the one or more ion sources at any angle around an axis orthogonal to a horizontal surface of the table, the rotatable ion optics comprising (i) a first ion path configured to emit the ion beam at a first angle relative to an exposed surface of the specimen, the first ion path comprising a beam stigmator, an objective lens, and a beam scanning plate, (ii) a second ion path configured to emit the ion beam at a second angle relative to the exposed surface of the specimen, the first and second angles differing by at least 10°, the second ion path comprising a second matching lens, a second beam deflector, and a quadrupole beam aligner, (iii) a first matching lens configured to focus the ion beam from the one or more ion sources, and (iv) a bidirectional deflector configured to direct the ion beam to either the first ion path or the second ion path; and

e) an imaging device, configured to generate an image of the specimen including the predetermined location simultaneously.

19. The apparatus of claim 18 , further comprising a motor configured to rotate the ion optics.

20. The apparatus of claim 18 , wherein the one or more ion sources includes a first ion source and a second ion source different from the first ion source.

21. The apparatus of claim 20 , wherein the first ion source is selected from the group consisting of noble gas ion sources and the second ion source is selected from the group consisting of Group 3, Group 4 and Group 5 ion sources.

22. An apparatus, comprising:

a) a specimen holder, configured to hold a specimen in a stationary position;

b) a table, configured to change the stationary position of the specimen holder in any of three orthogonal linear directions and an angular direction;

c) a first ion source;

d) a second ion source different from the first ion source;

e) rotatable ion optics, configured to emit an ion beam towards a predetermined location on the specimen from any of the one or more ion sources at any angle around an axis orthogonal to a horizontal surface of the table while the specimen holder and the specimen are stationary, wherein ion beams from each of the first and second ion sources are configured to travel along a same path in the rotatable ion optics; and

f) an imaging device, configured to generate an image of the specimen including the predetermined location simultaneously with the rotatable ion optics emitting the ion beam.

23. The apparatus of claim 22 , wherein the first ion source comprises a duoplasmatron and the second ion source comprises a liquid metal ion source or a cluster ion source.

24. The apparatus of claim 22 , wherein the first ion source is selected from the group consisting of noble gas ion sources and the second ion source is selected from the group consisting of Group 3, Group 4 and Group 5 ion sources.