IP Library Granted Patent US 9,525,338
Granted Patent B2
US 9,525,338 · App. 14/658,809 · Granted Dec 20, 2016

Voltage charge pump with segmented boost capacitors

Inventor: Christopher P. Miller (Underhill, VT)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
H02M3/07G05F5/00
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,525,338
App. No.
14/658,809
Granted
Dec 20, 2016
Kind
B2
Abstract

A voltage charge pump circuit with boost capacitor segments and boost delay chain structures are provided. The voltage charge pump circuit comprising a plurality of boost capacitor segments each of which is individually controlled by a respective signal line of a boost delay chain structure.

Claims (24)

1. A voltage charge pump circuit comprising a plurality of boost capacitor segments each of which is individually controlled by a respective signal line of a boost delay structure, wherein:

the boost delay structure allows individual boost timing control of each of the boost capacitor segments during a boost phase, and

the respective signal line for each of the plurality of boost capacitor segments of the boost delay structure includes a NAND gate in series with an inverter, which provides a delayed input boost signal to a subsequent boost capacitor segment of the plurality of boost capacitor segments.

2. The voltage charge pump circuit of claim 1 , wherein the respective signal line for each of the plurality of boost capacitor segments of the boost delay structure includes a pair of inverters which provide a delayed input boost signal to a subsequent boost capacitor segment of the plurality of boost capacitor segments.

3. The voltage charge pump circuit of claim 2 , wherein the delayed input boost signal fires each boost capacitor segment at a different time.

4. The voltage charge pump circuit of claim 1 , wherein each boost capacitor segment includes a boost transistor configured to be used as a capacitor, driven by boost drive transistors.

5. The voltage charge pump circuit of claim 1 , further comprising enable signals for enabling each individual signal line such that, upon activation of an enable signal, a respective one of the plurality of boost capacitor segments are individually controlled.

6. The voltage charge pump circuit of claim 1 , wherein the plurality of boost capacitor segments are driven separately to limit over voltage of a boosted node.

7. The voltage charge pump circuit of claim 1 , wherein timing control of the plurality of boost capacitor segments are coordinated with digital delays.

8. The voltage charge pump circuit of claim 1 , wherein boost charge of the plurality of boost capacitor segments are distributed over time to control pump output current.

9. A charge pump architecture comprising a plurality of pump boost capacitor segments enabled as a function of response of power to current load, wherein:

the pump boost capacitor segments each comprise a transistor acting as a capacitor, to charge an output transistor;

the pump boost capacitor segments are controlled with a delay signal through a boost delay chain structure;

the boost delay structure comprises a boost delay chain structure having a single control line for each of the pump boost capacitor segments; and

the single control line comprises a pair of inverters.

10. The charge pump architecture of claim 9 , wherein the output transistor is a PFET.

11. The charge pump architecture of claim 9 , wherein the pump boost capacitor segments are separately enabled thus allowing individual control of each of the pump boost capacitor segments.

12. The charge pump architecture of claim 9 , wherein the single control line comprises, in series, a NAND gate and inverter.

13. A charge pump architecture comprising a plurality of pump boost capacitor segments enabled as a function of response of power to current load, wherein:

the pump boost capacitor segments each comprise a transistor acting as a capacitor, to charge an output transistor;

the pump boost capacitor segments are controlled with a delay signal through a boost delay chain structure;

the boost delay structure comprises a boost delay chain structure having a single control line for each of the pump boost capacitor segments;

the single control line comprises, in series, a NAND gate and inverter; and

a control signal is a delayed signal which is an output signal from a previous single control line for a previous pump boost capacitor segment of the pump boost capacitor segments.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2015
From: MILLER, CHRISTOPHER P.
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 035173/0829 →
Continuity (1)
Related Publication 20160276926A1 · Sep 22, 2016