IP Library Granted Patent US 9,711,074
Granted Patent B2
US 9,711,074 · App. 14/661,556 · Granted Jul 18, 2017

Apparatus and method for preventing image display defects in a display device

Inventors: Jae Hong Ko (Seoul-si, KR); Shin Yoon (Seoul-si, KR); Byung Jae Nam (Seongnam-si, KR); Chang Ho Ahn (Hwaseong-si, KR); Sang Hyun Park (Seoul-si, KR)
Assignee: MagnaChip Semiconductor, Ltd.
G09G3/006G09G2320/04G09G2330/08
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Quick Facts
Patent No.
US 9,711,074
App. No.
14/661,556
Granted
Jul 18, 2017
Kind
B2
Abstract

An apparatus and a method that quickly detect an error that may occur due to an external noise occurrence during display of image data on a screen of an image display device, and that control a strobe signal output to prevent a screen defect from being displayed on the display device screen.

Claims (33)

1. An apparatus for preventing an abnormal screen display, comprising:

a separator configured to separate a clock signal and a data signal from a clock embedded signal;

a first latch that latches the data signal;

a lock detector that receives the clock signal and outputs a lock signal at a predetermined level after comparing an Nth clock waveform and an N−1th clock waveform of the clock signal;

a control logic unit that selectively outputs a strobe signal based on the predetermined level of the lock signal;

a second latch that latches the data signal that is latched in the first latch based on the strobe signal; and,

an output section that outputs the data latched in the second latch as a panel driver signal.

2. The apparatus of claim 1 , wherein the predetermined level of the lock signal comprises a high level or a low level, and, wherein the predetermined level comprises a low level when noise is included in the data signal that is latched in the first latch.

3. The apparatus of claim 1 , wherein the lock detector is configured to output a low level lock signal when a phase of the Nth clock waveform and the N−1th clock waveform do not conform with a predetermined condition.

4. The apparatus of claim 1 , wherein the control logic unit is configured to not output a strobe signal when the predetermined level of the lock signal is a low level.

5. The apparatus of claim 4 , wherein the second latch is configured to output data of a prior scan line based when the strobe signal is not output.

6. The apparatus of claim 1 , wherein the lock detector comprises:

a first element that receives the Nth clock waveform and a −1UI fast clock of the N−1th clock waveform;

a second element that receives the N−1th clock waveform and a +UI clock of the N−1 the clock waveform; and,

a logic element that outputs a high level lock signal when a first element output value and a second element output value are larger than +1UI or smaller than −1UI.

7. The apparatus of claim 6 , wherein the first element and the second element comprise a DQ flip-flop and the logic element comprises an AND gate.

8. An apparatus for preventing an abnormal screen display, comprising:

a noise signal detector that detects a noise occurrence during driving of an image display device; and,

a display driver IC that does not output a strobe signal for a scan line that includes the noise occurrence.

9. The apparatus of claim 8 , wherein the detector is configured to compare a current clock signal and prior a clock signal to detect the noise occurrence.

10. The apparatus of claim 8 , wherein the noise signal detector outputs a lock signal having a predetermined level, and wherein the predetermined level comprises a low level when the display driver IC does not output the strobe signal.

11. A method for preventing display of an abnormal screen, the method comprising:

separating a data signal and a clock signal from a clock embedded signal;

latching the data signal every scan line based on a strobe signal;

detecting a noise occurrence based on the clock signal; and,

outputting the strobe signal based on the clock signal,

wherein the strobe signal is prevented from being output when the noise occurrence is detected.

12. The method of claim 11 , wherein the detecting the noise occurrence comprises comparing a successively applied Nth clock waveform and a N−1th clock waveform of the clock signal.

13. The method of claim 12 , wherein the strobe signal is prevented from being output when the Nth clock waveform and the N−1th clock waveform are outside of a predetermined range.

14. The method of claim 12 , further comprising:

outputting a lock signal having a predetermined level, wherein the predetermined level comprises a low level when the noise occurrence is detected.

15. The method of claim 14 , wherein the predetermined level transitions to a high level when the Nth clock waveform and the N−1th clock waveform of the clock signal are within a predetermined range.

16. The method of claim 14 , wherein said latching the data signal every scan line comprises maintaining the data signal from a scan line prior to the noise occurrence until the strobe signal is received again.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 7, 2025
From: MAGNACHIP MIXED-SIGNAL, LTD.
To: MAGNACHIP SEMICONDUCTOR, LTD.
Reel/Frame 071813/0800 →
NUNC PRO TUNC ASSIGNMENT Recorded Mar 14, 2024
From: MAGNACHIP SEMICONDUCTOR, LTD.
To: MAGNACHIP MIXED-SIGNAL, LTD.
Reel/Frame 066878/0875 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2015
From: KO, JAE HONG; YOON, SHIN; NAM, BYUNG JAE; AHN, CHANG HO; PARK, SANG HYUN
To: MAGNACHIP SEMICONDUCTOR, LTD.
Reel/Frame 035428/0803 →
Priority Claims (1)
KR 10-2014-0137913 · Oct 13, 2014 · national
Continuity (1)
Related Publication 20160104401A1 · Apr 14, 2016