IP Library Granted Patent US 10,170,426
Granted Patent B2
US 10,170,426 · App. 14/661,585 · Granted Jan 1, 2019

Manufacturing method of wiring structure and wiring structure

Inventor: Motonobu Sato (Isehara, JP)
Assignee: FUJITSU LIMITED
H01L23/53276H01L21/76802H01L21/76877H01L21/76883H01L21/76886H01L23/485H01L23/528H01L23/53295H01L21/7681H01L2221/1094
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Quick Facts
Patent No.
US 10,170,426
App. No.
14/661,585
Granted
Jan 1, 2019
Kind
B2
Abstract

A trench is formed in an insulating film, carbon is formed on the insulating film to fill an inside of the trench, a catalytic material is formed on the carbon, heat treatment is performed on the carbon to turn the carbon into graphenes which are stacked in a plurality of layers, and the catalytic material and a part of the graphenes on the insulating film are removed to make the graphenes remain only in the trench.

Claims (14)

1. A wiring structure, comprising:

a first insulating film including a connection hole;

a second insulating film which is on the first insulating film and includes a wiring trench;

a first conductive material which fills an inside of the connection hole; and

a second conductive material which fills an inside of the wiring trench, wherein

the first conductive material is made of a first graphene layer which includes stacked plural graphenes formed in a direction along a bottom surface of the connection hole,

the second conductive material is made of a second graphene layer which includes stacked plural graphenes formed in a direction along a bottom surface of the wiring trench, and

the first graphene layer and the second graphene layer are directly connected to each other.

2. The wiring structure according to claim 1 , wherein

the first graphene layer and the second graphene layer are subjected to intercalation or doping using molecules of a different kind.

3. The wiring structure according to claim 1 , wherein

only the first graphene layer is formed in the inside of the connection hole of the first insulating film.

4. The wiring structure according to claim 1 , wherein

only the second graphene layer is formed in the inside of the wiring trench of the second insulating film.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2025
From: FUJITSU LIMITED
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 073964/0516 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 27, 2024
From: FUJITSU LIMITED
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 069454/0333 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 7, 2015
From: SATO, MOTONOBU
To: FUJITSU LIMITED
Reel/Frame 035350/0480 →
Continuity (1)
Related Publication 20160276281A1 · Sep 22, 2016