Circuit arrangement with a thyristor circuit, as well as a method for testing the thyristor circuit
A thyristor circuit comprising at least one series circuit in which two or more thyristors are connected in series. Each thyristor is parallel-connected to an RC member. A control device can energize the thyristors individually and independently of each other by a control signal, so that each thyristor can be individually switched into its conducting condition. During a test sequence, the thyristors are switched successively into their conducting condition, wherein, in a series circuit and/or in the thyristor circuit, respectively only one thyristor is in its conducting condition. While a thyristor is conducting, the capacitor of the associate RC member discharges and produces a thyristor current. As a result, the conducting condition is maintained until the thyristor current falls below the holding current. The control device can use the thyristor voltage and/or the thyristor current to evaluate the function or the switching behavior of the thyristor.
1. A circuit arrangement, comprising:
a thyristor circuit including at least one thyristor having an anode terminal and a cathode terminal; and
a control device configured to control the at least one thyristor by applying a control signal to the at least one thyristor in order to switch the at least one thyristor into a conducting condition, measure and evaluate the at least one thyristor voltage that is present between the anode terminal and the cathode terminal during a test period subsequent to the application of the control signal, monitor whether the voltage of the at least one thyristor is decreasing during the test period for the evaluation of the voltage of the at least one thyristor, monitor whether the voltage of the at least one thyristor decreases initially and rises subsequently, monitor whether the voltage of the at least one thyristor falls below a first threshold and subsequently rises again and above a second threshold, and monitor whether the voltage of the at least one thyristor rises above the second threshold within a predetermined blocking delay time from a switching point of time.
2. The circuit arrangement of claim 1 , wherein the control device is further configured to monitor whether the voltage of the at least one thyristor drops below a predetermined first threshold within a predetermined conduction delay time from the application of the control signal.
3. The circuit arrangement of claim 1 , wherein the control device is further configured to monitor whether the voltage of the at least one thyristor rests below a predetermined threshold after falling below the first threshold.
4. The circuit arrangement of claim 1 , further comprising an RC-circuit connected to the at least one thyristor, the RC-circuit including a capacitor and a first resistor.
5. The circuit arrangement of claim 4 , wherein the capacitor of the RC-circuit discharges after the application of the control signal to the at least one thyristor during the test period, and produces a current of the at least one thyristor through the at least one thyristor.
6. The circuit arrangement of claim 5 , wherein the current of the at least one thyristor decreases during the discharge of the capacitor during the test period, and falls below the holding current of the at least one thyristor at a switching point of time.
7. A circuit arrangement, comprising:
a thyristor circuit including at least one thyristor having an anode terminal and a cathode terminal; and
a control device configured to control the at least one thyristor by applying a control signal to the at least one thyristor in order to switch the at least one thyristor into a conducting condition, measure and evaluate the voltage of the at least one thyristor that is present between the anode terminal and the cathode terminal of the at least one thyristor during a test period subsequent to the application of the control signal to the at least one thyristor, monitor whether the voltage of the at least one thyristor is decreasing during the test period for the evaluation of the voltage of the at least one thyristor, monitor whether the voltage of the at least one thyristor decreases initially and rises subsequently, and monitor whether the voltage of the at least one thyristor falls below a first threshold and subsequently rises again and above a second threshold.
8. The circuit arrangement of claim 7 , wherein the control device is further configured to monitor whether the voltage of the at least one thyristor drops below a predetermined first threshold within a predetermined conduction delay time from the application of the control signal.
9. The circuit arrangement of claim 7 , wherein the control device is further configured to monitor whether the voltage of the at least one thyristor rests below a predetermined threshold after falling below the first threshold.
10. The circuit arrangement of claim 7 , further comprising an RC-circuit connected to the at least one thyristor, the RC-circuit including a capacitor and a first resistor.
11. The circuit arrangement of claim 10 , wherein the capacitor of the RC-circuit discharges after the application of the control signal to the at least one thyristor during the test period, and produces a current of the at least one thyristor through the at least one thyristor.
12. The circuit arrangement of claim 11 , wherein the current of the at least one thyristor decreases during the discharge of the capacitor during the test period, and falls below the holding current of the at least one thyristor at a switching point of time.
13. A method for testing a thyristor circuit including at least one thyristor having an anode terminal and a cathode terminal, the method comprising:
applying a control signal to switch the at least one thyristor into a conducting condition;
measuring and evaluating the voltage of the at least one thyristor that is present between the anode terminal and the cathode terminal during a test period subsequent to the application of the control signal to the at least one thyristor;
monitoring whether the voltage of the at least one thyristor is decreasing during the test period for the evaluation of the voltage of the at least one thyristor;
monitoring whether the voltage of the at least one thyristor decreases initially and rises subsequently; and
monitoring whether the voltage of the at least one thyristor falls below a first threshold and subsequently rises again and above a second threshold.