Method of and device for quality control process optimization
Methods of and Devices for quality control that can be used with automated optical inspection (AOI), solder paste inspection (SPI), and automated x-ray inspection (AXI) are disclosed. Plurality of threshold settings are entered in a testing process. Multiple testing results are obtained from the testing process. A graphic presentation is generated showing the numerical relationship among the data points, such that a quality control person is able to fine-tune the testing process to have a predetermined ratio of Defect Escaped % to False Call ppm.
1. A method of performing quality control inspection comprising:
a. entering plurality of threshold settings on an optical imaging inspection device configuring the optical imaging inspection device for a quality control inspection;
b. generating graphic presentation showing a linear data relationship of a percentage of the defect escaped and a false call rate based on the data acquired by the optical imaging inspection device; and
c. selecting a predetermined data of one of the percentage of the defect escaped or the false call rate based on a corresponding data of another on the linear data relationship.
2. The method of claim 1 , wherein the false call rate comprises a rate of false call ppm (parts-per million).
3. The method of claim 1 , wherein the quality control inspection comprises an automated optical inspection.
4. The method of claim 1 , wherein the quality control inspection comprises an automated x-ray inspection.
5. The method of claim 1 , wherein the quality control inspection comprises a solder paste inspection.
6. The method of claim 1 , further comprising adjusting the threshold setting numbers based on the relationship.
7. The method of claim 6 , wherein the relationship is substantially linear.
8. A quality control inspection system comprising:
a. an optical imaging inspection device coupled with the computer;
b. a first set of computer executable instructions stored in a computer configured to receive plurality of threshold setting numbers;
c. a second set of computer executable instruction stored in the computer configured to operate the optical inspection element; and
d. a graphic presentation generated by the computer showing a linear data relationship of a percentage of defects escaped and a false call rate using the detection data acquired by the optical imaging inspection device, wherein a predetermined data of one of the percentage of the defect escaped or the false call rate is selected for a next quality control inspection based on a corresponding data of another on the linear data relationship.
9. The system of claim 8 , wherein the plurality of threshold setting numbers comprises at least three numbers.
10. The system of claim 8 , wherein the optical inspection device comprises an automated optical inspection device.
11. The device of claim 8 , wherein the optical inspection device comprises a solder paste inspection device.
12. The device of claim 8 , wherein the optical inspection device comprises an automated x-ray inspection device.
13. The system of claim 8 , further comprises a third set of computer executable instruction configured to plot data received from testing into data points on a chart showing the numeral relationship among the data points.
14. A method of inspecting an electronic circuit member comprising:
a. requesting one or more inputs of at least two threshold settings on an optical imaging inspection device and configuring the optical imaging inspection device for a quality control inspection;
b. performing a testing of electronic circuit inspection;
c. receiving data of the testing;
d. generating a graphic presentation showing a numerical linear relationship of a percentage of the defect escaped and a false call rate based on the data acquired by the optical imaging inspection device; and
e. selecting a predetermined data of one of the percentage of the defect escaped or the false call rate based on a corresponding data of another on the linear data relationship.
15. The method of claim 14 , wherein the data points are in a substantial linear relationship.
16. The method of claim 14 , wherein the testing comprises an optical inspection.
17. The method of claim 14 further comprising selecting an algorithm of the testing.
18. The method of claim 14 further comprising adjusting the inputs of the at least two threshold settings.