IP Library Granted Patent US 9,290,375
Granted Patent B2
US 9,290,375 · App. 14/711,145 · Granted Mar 22, 2016

Complementary metal oxide semiconductor (CMOS) ultrasonic transducers and methods for forming the same

Inventors: Jonathan M. Rothberg (Guilford, CT); Keith G. Fife (Palo Alto, CA); Tyler S. Ralston (Clinton, CT); Gregory L. Charvat (Guilford, CT); Nevada J. Sanchez (Guilford, CT)
Assignee: Butterfly Network, Inc.
B81B7/007B06B1/0292B81C1/00158B81C1/00246G01N29/2406H01L29/84H04R19/005B81C1/00134B81C2201/0195B81C2203/0735B81C2203/0771
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Quick Facts
Patent No.
US 9,290,375
App. No.
14/711,145
Granted
Mar 22, 2016
Kind
B2
Abstract

Complementary metal oxide semiconductor (CMOS) ultrasonic transducers (CUTs) and methods for forming CUTs are described. The CUTs may include monolithically integrated ultrasonic transducers and integrated circuits for operating in connection with the transducers. The CUTs may be used in ultrasound devices such as ultrasound imaging devices and/or high intensity focused ultrasound (HIFU) devices.

Claims (10)

1. An apparatus, comprising:

a semiconductor wafer having a complementary metal oxide semiconductor (CMOS) integrated circuit;

a conductive membrane bonded with the semiconductor wafer such that a gap exists between a bonding surface of the semiconductor wafer and a first side of the conductive membrane proximate the bonding surface of the semiconductor wafer, the conductive membrane having a second side distal the bonding surface of the semiconductor wafer; and

a conductive standoff terminating on the first side of the conductive membrane proximate the bonding surface of the semiconductor wafer without extending through the conductive membrane such that a surface of the conductive standoff forms at least part of a bonding interface between the first side of the conductive membrane and the bonding surface of the semiconductor wafer, the conductive standoff electrically connecting the conductive membrane to the CMOS integrated circuit, and

wherein the apparatus lacks an electrode that is on the second side of the conductive membrane and that overlies the cavity.

2. The apparatus of claim 1 , wherein the conductive membrane is a doped silicon layer.

3. The apparatus of claim 1 , wherein the conductive standoff forms a closed contour surrounding the gap.

4. The apparatus of claim 1 , wherein the conductive standoff is formed of titanium nitride (TiN).

5. The apparatus of claim 1 , wherein the conductive standoff is formed of a metal.

6. The apparatus of claim 1 , wherein the conductive membrane has a thickness less than thirty microns.

Assignments (2)
CHANGE OF NAME Recorded Mar 16, 2022
From: BUTTERFLY NETWORK, INC.
To: BFLY OPERATIONS, INC.
Reel/Frame 059369/0969 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 19, 2015
From: ROTHBERG, JONATHAN M.; FIFE, KEITH G.; RALSTON, TYLER S.; CHARVAT, GREGORY L.; SANCHEZ, NEVADA J.
To: BUTTERFLY NETWORK, INC.
Reel/Frame 035668/0687 →
Continuity (4)
Continuation 14561384 · Dec 5, 2014
Continuation 14208351 · Mar 13, 2014
Provisional Application 61794744 · Mar 15, 2013
Related Publication 20150251896A1 · Sep 10, 2015