Gas-tight packaging of detectors
View Patent ↗An atomic particle detection assembly includes one or more detectors that detect atomic particles. The detectors are positioned within a first chamber having a first operating pressure. The atomic particle detection assembly includes a junction apparatus supporting the detectors. The junction apparatus defines a second chamber having a second operating pressure that is different from the first operating pressure. Sensing electronics are attached to the detectors and the sensing electronics are housed within the second chamber of the junction apparatus.
1. An atomic particle detection assembly comprising:
a detector configured to detect atomic particles, the detector being positioned within a first chamber having a first operating pressure;
sensing electronics operatively attached to the detector; and
a junction apparatus supporting the detector within the first chamber, the junction apparatus defining a second chamber having a second operating pressure that is different from the first operating pressure, the second chamber being sealed from the first chamber, and the junction apparatus including a housing within which the sensing electronics are housed.
2. The atomic particle detection assembly of claim 1 , wherein the housing defines a portion of the second chamber such that the housing is maintained at the second operating pressure.
3. The atomic particle detection assembly of claim 2 , wherein a second chamber channel extends from the housing towards the detector.
4. The atomic particle detection assembly of claim 3 , wherein the second chamber channel is maintained at the second operating pressure and supports wires extending between the detector and the sensing electronics that are housed within the housing.
5. The atomic particle detection assembly of claim 1 , wherein the second chamber of the junction apparatus defines a substantially enclosed volume that is not defined at an exterior of the junction apparatus.
6. The atomic particle detection assembly of claim 1 , wherein the second operating pressure is higher than the first operating pressure.
7. An atomic particle detection assembly comprising:
a detector configured to detect atomic particles, the detector being positioned within a first chamber having a first operating pressure;
sensing electronics operatively attached to the detector; and
a junction apparatus supporting the detector, the junction apparatus defining a second chamber having a second operating pressure that is different from the first operating pressure, the second chamber being sealed from the first chamber, the junction apparatus defining a detector opening through which the detector is configured to extend, the junction apparatus defining a securing opening that intersects with the detector opening, the sensing electronics being operatively attached to the detector extending through the detector opening, and the securing opening configured to receive a securing device that secures the detector with respect to the junction apparatus.
8. The atomic particle detection assembly of claim 7 , wherein the securing opening extends in a direction that is substantially perpendicular with respect to the detector opening.
9. The atomic particle detection assembly of claim 7 , wherein the securing device includes a mechanical fastener that is threaded with respect to the securing opening.
10. The atomic particle detection assembly of claim 7 , wherein the securing opening extends between an outer radial surface of the junction apparatus and an inner radial surface of the junction apparatus.
11. The atomic particle detection assembly of claim 10 , wherein the detector extends through the detector opening such that the detector extends at least partially into the second chamber of the junction apparatus.
12. The atomic particle detection assembly of claim 7 , wherein the second operating pressure is higher than the first operating pressure.
13. An atomic particle detection assembly comprising:
a detector configured to detect atomic particles, the detector being positioned within a first chamber having a first operating pressure;
sensing electronics operatively attached to the detector; and
a junction apparatus supporting the detector, the junction apparatus defining a second chamber having a second operating pressure that is different from the first operating pressure, the junction apparatus defining a detector opening through which the detector is configured to extend, a sealing device positioned within the detector opening and configured to seal the detector and the junction apparatus.
14. The atomic particle detection assembly of claim 13 , wherein the sealing device is positioned between a shoulder of the detector opening and the detector.
15. The atomic particle detection assembly of claim 14 , wherein the sealing device contacts the shoulder and the detector to seal the detector and the junction apparatus.
16. The atomic particle detection assembly of claim 15 , wherein the sealing device is elastically deformable.
17. The atomic particle detection assembly of claim 13 , wherein an inner radial surface of the sealing device contacts and seals with the detector, an outer radial surface of the sealing device contacts and seals with the junction apparatus.
18. The atomic particle detection assembly of claim 13 , wherein the sealing device defines an opening through the sealing device, the detector configured to extend through the opening of the sealing device.
19. The atomic particle detection assembly of claim 13 , wherein the second chamber of the junction apparatus defines a substantially enclosed volume that is not defined at an exterior of the junction apparatus.
20. The atomic particle detection assembly of claim 13 , wherein the second operating pressure is higher than the first operating pressure.