X-ray scatterometry apparatus
Apparatus, including a sample-support that retains a sample in a plane having an axis, the plane defining first and second regions separated by the plane. A source-mount in the first region rotates about the axis, and an X-ray source on the source-mount directs first and second incident beams of X-rays to impinge on the sample at first and second angles along beam axes that are orthogonal to the axis. A detector-mount in the second region moves in a plane orthogonal to the axis and an X-ray detector on the detector-mount receives first and second diffracted beams of X-rays transmitted through the sample in response to the first and second incident beams, and outputs first and second signals, respectively, in response to the received first and second diffracted beams. A processor analyzes the first and the second signals so as to determine a profile of a surface of the sample.
1. Apparatus, comprising:
a sample-support, configured to fixedly retain a sample in a plane comprising an axis, the plane defining first and second regions in space that are separated by the plane;
a source-mount, positioned in the first region, and configured to rotate about the axis;
an X-ray source positioned in the first region on the source-mount and configured to direct first and second incident beams of X-rays to impinge simultaneously on a common point on the sample at respective first and second angles along respective beam axes that are orthogonal to the axis;
a detector-mount positioned in the second region and configured to move in a plane orthogonal to the axis;
an X-ray detector positioned in the second region on the detector-mount and configured to receive first and second scattered beams of X-rays transmitted through the sample in response to the first and second incident beams, and to output first and second signals, respectively, in response to the received first and second scattered beams; and
a processor, configured to analyze the first and the second signals so as to determine a profile of a surface of the sample.
2. The apparatus according to claim 1 , wherein the X-ray source comprises a single X-ray source configured to produce the first and second incident beams simultaneously.
3. The apparatus according to claim 1 , wherein the X-ray source comprises a first X-ray source configured to produce the first incident beam and a second X-ray source configured to produce the second incident beam simultaneously with the first incident beam.
4. The apparatus according to claim 1 , wherein the X-ray detector comprises a first detector located at a first position on the detector-mount so as to receive the first scattered beam and a second detector located at a second position on the detector-mount so as to receive the second scattered beam.
5. The apparatus according to claim 1 , wherein the detector-mount is configured to move so as to maintain alignment of the X-ray detector with the first and second scattered beams on rotation of the source-mount about the axis.
6. The apparatus according to claim 5 , wherein the detector-mount is configured to rotate about the axis.
7. The apparatus according to claim 1 , wherein the processor is configured to formulate an expected first signal and an expected second signal for the X-ray detector in response to a theoretical profile of the surface, and to compare, using a cost function, the expected first and second signals with the outputted first and second signals so as to determine the profile.
8. The apparatus according to claim 7 , wherein the processor is configured to minimize a sum of a first result of the cost function applied to the outputted first signal and the expected first signal and a second result of the cost function applied to the outputted second signal and the expected second signal so as to determine the profile.
9. The apparatus according to claim 1 , wherein the plane is horizontal.
10. The apparatus according to claim 9 , wherein the first region is below the sample, and wherein the second region is above the sample.
11. A method, comprising:
configuring a sample-support to fixedly retain a sample in a plane comprising an axis, the plane defining first and second regions in space that are separated by the plane;
positioning a source-mount, configured to rotate about the axis, in the first region;
positioning an X-ray source in the first region on the source-mount;
directing first and second incident beams of X-rays from the X-ray source to impinge simultaneously on a common point on the sample at respective first and second angles along respective beam axes that are orthogonal to the axis;
positioning a detector-mount, configured to move in a plane orthogonal to the axis, in the second region;
positioning an X-ray detector, configured to receive first and second scattered beams of X-rays transmitted through the sample in response to the first and second incident beams, in the second region on the detector-mount;
outputting first and second signals, respectively, in response to the received first and second scattered beams; and
analyzing the first and the second signals so as to determine a profile of a surface of the sample.
12. The method according to claim 11 , wherein the X-ray source comprises a single X-ray source configured to produce the first and second incident beams simultaneously.
13. The method according to claim 11 , wherein the X-ray source comprises a first X-ray source configured to produce the first incident beam and a second X-ray source configured to produce the second incident beam simultaneously with the first incident beam.
14. The method according to claim 11 , wherein the X-ray detector comprises a first detector located at a first position on the detector-mount so as to receive the first scattered beam and a second detector located at a second position on the detector-mount so as to receive the second scattered beam.
15. The method according to claim 11 , wherein the detector-mount is configured to move so as to maintain alignment of the X-ray detector with the first and second scattered beams on rotation of the source-mount about the axis.
16. The method according to claim 15 , wherein the detector-mount is configured to rotate about the axis.
17. The method according to claim 11 , wherein analyzing the first and the second signals comprises formulating an expected first signal and an expected second signal for the X-ray detector in response to a theoretical profile of the surface, and comparing, using a cost function, the expected first and second signals with the outputted first and second signals so as to determine the profile.
18. The method according to claim 17 , and comprising minimizing a sum of a first result of the cost function applied to the outputted first signal and the expected first signal and a second result of the cost function applied to the outputted second signal and the expected second signal so as to determine the profile.
19. The method according to claim 11 , wherein the plane is horizontal.
20. The method according to claim 19 , wherein the first region is below the sample, and wherein the second region is above the sample.