IP Library Granted Patent US 9,824,168
Granted Patent B2
US 9,824,168 · App. 14/737,537 · Granted Nov 21, 2017

Magnetization analysis apparatus, magnetization analysis method, and recording medium

Inventors: Atsushi Furuya (Yokohama, JP); Tadashi Ataka (Kawasaki, JP); Koichi Shimizu (Inagi, JP)
Assignee: FUJITSU LIMITED
G06F17/5018G01R33/00G01R33/0064G06F2217/16
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Quick Facts
Patent No.
US 9,824,168
App. No.
14/737,537
Granted
Nov 21, 2017
Kind
B2
Abstract

A magnetization analysis apparatus includes a processor configured to execute a process. The process includes: first calculating, using a magnetization vector of each of elements obtained by mesh division in which a magnetic substance is divided into a plurality of meshes and a magnetization vector of an element adjacent to each element, intermediate magnetization that is a magnetization vector at the halfway point between each element and an element adjacent to each element; second calculating an effective magnetic field using the intermediate magnetization calculated at the first calculating; and third calculating a magnetization vector of each element after a unit time based on the effective magnetic field calculated at the second calculating.

Claims (18)

1. A magnetization analysis apparatus comprising:

a processor configured to execute a process including:

first calculating, using a magnetization vector of each of elements obtained by mesh division in which a magnetic substance is divided into a plurality of meshes and a magnetization vector of an element adjacent to each element, intermediate magnetization that is a magnetization vector at the halfway point between each element and an element adjacent to each element;

second calculating an effective magnetic field using the intermediate magnetization calculated at the first calculating; and

third calculating a magnetization vector of each element after a unit time based on the effective magnetic field calculated at the second calculating.

2. The magnetization analysis apparatus according to claim 1 , wherein the second calculating includes calculating an effective magnetic field by calculating an exchange field and an anisotropy field using the intermediate magnetization.

3. The magnetization analysis apparatus according to claim 2 , wherein

the first calculating includes calculating, in a case of two dimensions, two sets of intermediate magnetization to calculate the anisotropy field, and

the second calculating includes calculating the anisotropy field using the two sets of intermediate magnetization.

4. The magnetization analysis apparatus according to claim 1 , wherein the first calculating includes calculating intermediate magnetization including a magnitude of 1.

5. A magnetization analysis method comprising:

first calculating, using a magnetization vector of each of elements obtained by mesh division in which a magnetic substance is divided into a plurality of meshes and a magnetization vector of an element adjacent to each element, intermediate magnetization that is a magnetization vector at the halfway point between each element and an element adjacent to each element, by a processor;

second calculating an effective magnetic field using the intermediate magnetization calculated at the first calculating, by the processor; and

third calculating a magnetization vector of each element after a unit time based on the effective magnetic field calculated at the second calculating, by the processor.

6. A non-transitory computer-readable recording medium having stored therein a magnetization analysis program that causes a computer to execute a process comprising:

first calculating, using a magnetization vector of each of elements obtained by mesh division in which a magnetic substance is divided into a plurality of meshes and a magnetization vector of an element adjacent to each element, intermediate magnetization that is a magnetization vector at the halfway point between each element and an element adjacent to each element;

second calculating an effective magnetic field using the intermediate magnetization calculated at the first calculating; and

third calculating a magnetization vector of each element after a unit time based on the effective magnetic field calculated at the second calculating.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE ORIGINAL COVER SHEET BY REMOVING PATENT NUMBER 10586039 PREVIOUSLY RECORDED ON REEL 69272 FRAME 546. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 1, 2025
From: FUJITSU LIMITED
To: FSAS TECHNOLOGIES INC.
Reel/Frame 070764/0091 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 25, 2024
From: FUJITSU LIMITED
To: FSAS TECHNOLOGIES INC.
Reel/Frame 069272/0546 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 1, 2015
From: FURUYA, ATSUSHI; ATAKA, TADASHI; SHIMIZU, KOICHI
To: FUJITSU LIMITED
Reel/Frame 036049/0011 →
Priority Claims (1)
JP 2014-164980 · Aug 13, 2014 · national
Continuity (1)
Related Publication 20160048617A1 · Feb 18, 2016