System and method to predict a usable life of a vacuum interrupter in the field
View Patent ↗A closed and open contact method to predict a usable life of vacuum interrupters in the field can include using computer instructions in the data storage to instruct the processor to position a calculated amp or calculated pressure on an ionic or current versus pressure calibration curve for the installed vacuum interrupter and identify trend data from a library of trend data corresponding to the installed vacuum interrupter and to the calculated pressure or calculated amp of the installed vacuum interrupter; thereby determining the anticipated life expectancy.
1. A method for predicting a usable life of a vacuum interrupter, the method comprising:
placing a magnetic field generator adjacent to an installed vacuum interrupter;
generating a magnetic field around the installed vacuum interrupter using the magnetic field generator;
measuring ion current flow across one or more open contacts of the installed vacuum interrupter;
comparing the measured ion current flow to a threshold value; and
indicating a first condition of the vacuum interrupter.
2. The method of claim 1 , wherein the threshold value corresponds to an acceptable predicted usable life of the installed vacuum interrupter.
3. The method of claim 1 , wherein the first condition of the vacuum interrupter is an acceptable condition if the measured ion current flow is less than the threshold value.
4. The method of claim 1 , wherein the first condition of the vacuum interrupter is an unacceptable condition if the measured ion current flow is greater than the threshold value.
5. The method of claim 1 , wherein the indication of the first condition comprises illuminating a first light if the first condition is an acceptable condition and illuminating a second light if the first condition is an unacceptable condition.
6. A method for predicting a usable life of a vacuum interrupter, the method comprising:
placing a magnetic field generator adjacent to an installed vacuum interrupter;
generating a magnetic field around the installed vacuum interrupter using the magnetic field generator;
measuring a first ion current flow across one or more open contacts of the installed vacuum interrupter;
comparing the first measured ion current flow to a threshold value;
if the first measured ion current flow is greater than the threshold value, indicating a first condition of the vacuum interrupter; and
if the first measured ion current flow is less than the threshold value:
increasing the magnetic field around the installed vacuum interrupter;
measuring a second ion current flow across the one or more open contacts;
comparing the second measured ion current flow to the threshold value; and
indicating a second condition of the vacuum interrupter.
7. The method of claim 6 , wherein the indication of the first condition comprises illuminating a first light if the first condition is an unacceptable condition.
8. The method of claim 6 , wherein the indication of the second condition comprises illuminating a second light if the second condition is an acceptable condition, or illuminating a third light if the second condition is a less acceptable condition.
9. The method of claim 6 , wherein the threshold value corresponds to an acceptable predicted usable life of the vacuum interrupter.
10. The method of claim 6 , wherein the first condition of the vacuum interrupter is an unacceptable condition if the measured first ion current flow is greater than the threshold value.
11. The method of claim 6 , wherein the second condition of the vacuum interrupter is a less acceptable condition if the measured second ion current flow is greater than the threshold value, and is an acceptable condition if the measured second ion current flow is less than the threshold value.
12. A system for predicting a usable life of a vacuum interrupter, the system comprising:
a magnetic field generator configured to be placed adjacent to an installed vacuum interrupter;
wherein the magnetic field generator is configured to generate a magnetic field around the installed vacuum interrupter;
current sensing circuitry configured to measure ion current flow across one or more open contacts of the installed vacuum interrupter and to compare the measured ion current flow to a threshold value; and
a condition indicator configured to indicate a first condition of the vacuum interrupter.
13. The system of claim 12 , wherein the condition indicator comprises one or more lights to indicate a condition of the installed vacuum interrupter.
14. The system of claim 13 , wherein the condition comprises one of an acceptable, a less acceptable, and an unacceptable condition.
15. The system of claim 12 , wherein the threshold value corresponds to an acceptable predicted usable life of the vacuum interrupter.
16. The system of claim 12 , wherein the first condition of the vacuum interrupter is an acceptable condition if the measured ion current flow is less than the threshold value.
17. The system of claim 12 , wherein the first condition of the vacuum interrupter is an unacceptable condition if the measured ion current flow is greater than the threshold value.
18. The method of claim 1 , wherein the magnetic field generator comprises a flexible magnetic field coil.
19. The method of claim 18 , further comprising causing a DC potential to be applied across the one or more open contacts of the installed vacuum interrupter.
20. The method of claim 6 , wherein the magnetic field generator comprises a flexible magnetic field coil.
21. The method of claim 20 , further comprising causing a DC potential to be applied across the one or more open contacts of the installed vacuum interrupter.
22. The system of claim 12 , wherein the magnetic field generator comprises a flexible magnetic field coil configured to be placed around the installed vacuum interrupter; and further comprising a current generator configured to generate a magnetic field around the installed vacuum interrupter using the flexible magnetic field coil.
23. The system of claim 22 , further comprising control circuitry configured to cause a DC potential to be applied across the one or more open contacts of the installed vacuum interrupter.
24. The system of claim 23 , further comprising a high-potential testing unit configured to apply the DC potential across the one or more open contacts of the installed vacuum interrupter.