System and method for selecting victim memory block for garbage collection

1. A method for selecting a victim memory block in a storage device for garbage collection comprising:

identifying, by a block selection system, a memory block having a minimum valid unit count among a plurality of memory blocks in the storage device;

determining, by the block selection system, a wear count bit of the identified memory block to be one of a null wear count and a non-null wear count;

selecting, by the block selection system, the identified memory block as the victim memory block for garbage collection upon determining the identified memory block having the null wear count; and

performing, by the block selection system, upon determining the identified memory block having the non-null wear count:

dividing the plurality of memory blocks into a first set of memory blocks and a second set of memory blocks, wherein a minimum valid unit count and a wear count bit is identified for each memory block in the first set of memory blocks and the second set of memory blocks;

iterating the division until a first target memory block having the minimum valid unit count and the null wear count from one of the first set of memory blocks and the second set of memory blocks is identified; and

selecting the target memory block as the victim memory block for garbage collection.

2. The method as claimed in claim 1 further comprising:

identifying, by the block selection system, a second target memory block having the minimum valid unit count and the null wear count from remaining set of memory blocks of the first set of memory blocks and the second set of memory blocks during the iteration; and

merging, by the block selection system, the first target memory block and the second target memory block for garbage collection.

3. The method as claimed in claim 1 , wherein the plurality of memory blocks is divided into the first set of memory blocks and the second set of memory blocks by masking the identified memory block having non-null wear count.

4. The method as claimed in claim 1 , wherein the wear count bit relates to a wear count of the identified memory block that corresponds to number of times the memory block is used for garbage collection.

5. The method as claimed in claim 1 , wherein the wear count bit of the identified memory block is null when the identified memory block is never used for garbage collection.

6. The method as claimed in claim 1 , wherein the wear count bit of the identified memory block is non-null when the identified memory block is used at least once for garbage collection.

7. A block selection system for selecting a victim memory block in a storage device for garbage collection comprising:

a processor;

a memory communicatively coupled to the processor, wherein the memory stores processor-executable instructions, which, on execution, cause the processor to:

identify a memory block having a minimum valid unit count among a plurality of memory blocks in the storage device;

determine a wear count bit of the identified memory block to be one of a null wear count and a non-null wear count;

select the identified memory block as the victim memory block for garbage collection upon determining the identified memory block having the null wear count; and

perform upon determining the identified memory block having the non-null wear count:

divide the plurality of memory blocks into a first set of memory blocks and a second set of memory blocks, wherein a minimum valid unit count and a wear count bit is identified for each memory block in the first set of memory blocks and the second set of memory blocks;

iterate the division until a first target memory block having the minimum valid unit count and the null wear count from one of the first set of memory blocks and the second set of memory blocks is identified; and

select the final target memory block as the victim memory block for garbage collection.

8. The block selection system as claimed in claim 7 , wherein the processor is further configured to:

identify a second target memory block having the minimum valid unit count and the null wear count from remaining set of memory blocks of the first set of memory blocks and the second set of memory blocks during the iteration; and

merge the first target memory block and the second target memory block for garbage collection.

9. The block selection system as claimed in claim 7 , wherein the processor masks the identified memory block having non-null wear count to divide the plurality of memory blocks into the first set of memory blocks and the second set of memory blocks.

10. The block selection system as claimed in claim 7 , wherein the wear count bit relates to a wear count of the identified memory block that corresponds to number of times the memory block is used for garbage collection.

11. The block selection system as claimed in claim 7 , wherein the wear count bit of the identified memory block is null when the identified memory block is never used for garbage collection.

12. The block selection system as claimed in claim 7 , wherein the wear count bit of the identified memory block is non-null when the identified memory block is used at least once for garbage collection.

13. A non-transitory computer readable medium including instructions stored thereon that when processed by a processor cause a block selection system to perform acts of:

identifying a memory block having a minimum valid unit count among a plurality of memory blocks in a storage device;

determining a wear count bit of the identified memory block to be one of a null wear count and a non-null wear count;

selecting the identified memory block as the victim memory block for garbage collection upon determining the identified memory block having the null wear count; and

performing upon determining the identified memory block having the non-null wear count:

dividing the plurality of memory blocks into a first set of memory blocks and a second set of memory blocks, wherein a minimum valid unit count and a wear count bit is identified for each memory block in the first set of memory blocks and the second set of memory blocks;

iterating the division until a first target memory block having the minimum valid unit count and the null wear count from one of the first set of memory blocks and the second set of memory blocks is identified; and

selecting the final target memory block as the victim memory block for garbage collection.

14. The medium as claimed in claim 13 , wherein the instructions further cause the processor to perform operations comprising

identifying a second target memory block having the minimum valid unit count and the null wear count from remaining set of memory blocks of the first set of memory blocks and the second set of memory blocks during the iteration; and

merging the first target memory block and the second target memory block for garbage collection.

15. The medium as claimed in claim 13 , wherein the plurality of memory blocks is divided into the first set of memory blocks and the second set of memory blocks by masking the identified memory block having non-null wear count.

16. The medium as claimed in claim 13 , wherein the wear count bit relates to a wear count of the identified memory block that corresponds to number of times the memory block is used for garbage collection.

17. The medium as claimed in claim 13 , wherein the wear count bit of the identified memory block is null when the identified memory block is never used for garbage collection.

18. The medium as claimed in claim 13 , wherein the wear count bit of the identified memory block is non-null when the identified memory block is used at least once for garbage collection.