IP Library Granted Patent US 10,572,799
Granted Patent B2
US 10,572,799 · App. 14/749,331 · Granted Feb 25, 2020

Neuron peripheral circuits for neuromorphic synaptic memory array based on neuron models

Inventors: Kohji Hosokawa (Shiga-ken, JP); Masatoshi Ishii (Shiga-ken, JP); SangBum Kim (Yorktown Heights, NY); Chung H. Lam (Peekskill, NY); Scott C. Lewis (Eastham, MA)
Assignee: International Business Machines Corporation
G06N3/0635G06N3/049
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,572,799
App. No.
14/749,331
Granted
Feb 25, 2020
Kind
B2
Abstract

A neuromorphic memory system including neuromorphic memory arrays. The neuromorphic memory system includes a presynaptic neuron circuit coupled to a postsynaptic neuron circuit by a resistive memory cell. The method includes generating a presynaptic LIF pulse on a presynaptic LIF line at time t 1 . An activating operation activates an access transistor coupled to the presynaptic LIF line in response to the presynaptic LIF pulse. The access transistor enables LIF current to pass through the resistive memory cell to a postsynaptic LIF line. An integrating operation integrates the LIF current at the postsynaptic LIF line over time. A comparing operation compares a LIF voltage at the postsynaptic LIF line to a threshold voltage. A generating operation generates a postsynaptic spike timing dependent plasticity (STDP) pulse on a postsynaptic STDP line if the LIF voltage is beyond the threshold voltage.

Claims (6)

1. A method for generating a memory program pulse in a neuromorphic memory circuit, the neuromorphic memory circuit including a presynaptic neuron circuit coupled to a postsynaptic neuron circuit by a resistive memory cell, the method comprising:

generating a presynaptic STDP pulse based on a target spike timing dependent plasticity (STDP) behavior function h(Δt) and a memory cell characteristic function f VD1 (V A1 ), the target STDP behavior function h(Δt) describing a desired relative change in a synaptic weight of the resistive memory cell based on Δt, the memory cell characteristic function f VD1 (V A1 ) describing a relationship between change in an electrical resistance of the resistive memory cell and V A1 at a constant VD1, where Δt=t 2 −t 1 , where t 1 is a time when the presynaptic neuron circuit fires, where t 2 is a time when the postsynaptic neuron circuit fires, where V A1 is a voltage of a presynaptic STDP pulse, where VD1 is an amplitude of a postsynaptic STDP pulse, where the presynaptic STDP pulse is equal to f VD1 −1 (h(t+min(Δt)−t 1 )), and where t is time and min(Δt) is a constant time shift; and

transmitting the presynaptic STDP pulse on a presynaptic STDP line, the presynaptic STDP pulse controlling a current flow through the resistive memory cell when the postsynaptic STDP pulse is generated at t 2 -min(Δt).

2. The method of claim 1 , further comprising generating the postsynaptic STDP pulse at time t 2 -min(Δt) and amplitude VD1.

3. The method of claim 1 , wherein the synaptic weight of the resistive memory cell is inversely proportional to the electrical resistance of the resistive memory cell.

4. The method of claim 1 , wherein the STDP behavior function h(Δt) approaches zero as an absolute value of Δt increases.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2020
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 052823/0678 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2015
From: HOSOKAWA, KOHJI; ISHII, MASATOSHI; KIM, SANGBUM; LAM, CHUNG H.; LEWIS, SCOTT C.
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 035964/0431 →
Continuity (2)
Continuation 14722008 · May 26, 2015
Related Publication 20160350647A1 · Dec 1, 2016