Non-volatile memory validity
View Patent ↗An embodiment provides a method, including: reading validity timing information written to a non-volatile memory device; and determining validity of the non-volatile memory device using the validity timing information read from the non-volatile memory device. Other aspects are described and claimed.
1. A method, comprising:
reading validity timing information written to a non-volatile memory device; and
determining validity of the non-volatile memory device using the validity timing information read from the non-volatile memory device.
2. The method of claim 1 , wherein the validity timing information is predetermined.
3. The method of claim 1 , wherein the validity timing information is predetermined for a memory device.
4. The method of claim 1 , wherein the validity timing is predetermined for a memory device and a given power setting.
5. The method of claim 1 , wherein the validity timing information is dynamically updated.
6. The method of claim 5 , wherein the validity timing information is dynamically updated via:
writing test information to the non-volatile memory device;
waiting a predetermined time after the writing; and
reading the test information written to the non-volatile memory device following the predetermined time.
7. The method of claim 1 , further comprising determining if an elapsed time since last refresh of the non-volatile memory exceeds a threshold.
8. The method of claim 7 , wherein the predetermined time is set using the validity timing information.
9. The method of claim 7 , further comprising refreshing the non-volatile memory after determining that the elapsed time since last refresh of the non-volatile memory exceeds the threshold.
10. A device, comprising:
a non-volatile memory;
a processor; and
a memory device storing instructions executable by the processor to:
read validity timing information written to the non-volatile memory device; and
determine validity of the non-volatile memory device using the validity timing information read from the non-volatile memory device.
11. The device of claim 10 , wherein the validity timing information is predetermined.
12. The device of claim 10 , wherein the validity timing information is predetermined for a memory device.
13. The device of claim 10 , wherein the validity timing is predetermined for a memory device and a given power setting.
14. The device of claim 11 , wherein the validity timing information is dynamically updated.
15. The device of claim 14 , wherein the validity timing information is dynamically updated via:
writing test information to the non-volatile memory device;
waiting a predetermined time after the writing; and
reading the test information written to the non-volatile memory device following the predetermined time.
16. The device of claim 10 , wherein the instructions are executable by the processor to determine if an elapsed time since last refresh of the non-volatile memory exceeds a threshold.
17. The device of claim 16 , wherein the predetermined time is set using the validity timing information.
18. The device of claim 16 , wherein the instructions are executable by the processor to refresh the non-volatile memory after determining that the elapsed time since last refresh of the non-volatile memory exceeds the threshold.
19. The device of claim 10 , wherein the non-volatile memory is non-volatile random access memory (NVRAM).
20. A program product, comprising:
a storage medium that stores instructions executable by a process, the instructions comprising:
code that reads validity timing information written to a non-volatile memory device; and
code that determines validity of the non-volatile memory device using the validity timing information read from the non-volatile memory device.