IP Library Granted Patent US 9,714,983
Granted Patent B2
US 9,714,983 · App. 14/808,081 · Granted Jul 25, 2017

Test instrument for testing charge storage devices

Inventors: Ian W. Hunter (Lincoln, MA); Grant W. Kristofek (Wayland, MA); Dean Ljubicic (Somerville, MA)
Assignee: Nucleus Scientific Inc.
G01R31/3675G01R31/016G01R31/3627G01R31/3641G01R1/06705G01R31/2886
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Quick Facts
Patent No.
US 9,714,983
App. No.
14/808,081
Granted
Jul 25, 2017
Kind
B2
Abstract

A test instrument for use with a sample having a plurality of electrically conducting contact pads, the instrument including: a controllable, variable force linear actuator; a probe assembly operated by the linear actuator, the probe assembly having a probe head at one end with a surface for contacting the sample; a movable contactor assembly including a plurality of contacts for electrically contacting the plurality of contact pads on the sample; a housing on which the linear actuator and contactor assembly are mounted, the housing having an identified area for holding the sample during testing; a position sensor assembly for measuring changes in the position of the probe; and a sensor for measuring a force applied to the sample by the probe head.

Claims (33)

1. A test instrument for use with a sample having a plurality of electrically conducting contact pads, said instrument comprising:

a controllable, variable force linear actuator;

a probe assembly operated by the linear actuator, said probe assembly having a probe head at one end with a flat surface for contacting and applying a uniform force over a contacted area of the sample during testing, wherein the uniform force is generated by the linear actuator and is variably controllable;

a movable contactor assembly including a plurality of contacts for electrically contacting the plurality of contact pads on the sample, wherein the movable contactor assembly and the probe assembly are separate from each other and independently operable, and;

a housing on which the linear actuator and contactor assembly are mounted, said housing having an identified area for holding the sample during testing, said identified area oriented in a sample plane;

a position sensor assembly for measuring changes in the position of the probe head in a direction perpendicular to the sample plane while the probe head is contacting the sample during testing; and

a sensor for measuring a force applied to the sample by the probe head during testing.

2. The test instrument of claim 1 , wherein the linear actuator is a pneumatic actuator.

3. The test instrument of claim 2 , wherein the pneumatic actuator comprises an air bearing cylinder.

4. The test instrument of claim 3 , wherein the sensor for measuring the force applied to the sample by the probe head is a pressure sensor arranged to measure a pressure of gas supplied to the pneumatic actuator.

5. The test instrument of claim 1 , wherein the linear actuator is an electromagnetic actuator.

6. The test instrument of claim 5 , wherein the sensor for measuring the force applied to the sample is located on the housing at the identified area where the sample is held during testing.

7. The test instrument of claim 1 , further comprising:

one or more conduits proximate to and in thermal communication with a portion of the housing next to the identified location, said one or more conduits for carrying temperature-controlled fluid for controlling a temperature of the sample during testing; and

a temperature sensor for measuring a temperature of the housing near the identified area where the sample is located during testing.

8. The test instrument of claim 7 , wherein the temperature sensor is thermistor.

9. The test instrument of claim 7 , wherein the temperature sensor is a resistive temperature detector.

10. The test instrument of claim 1 , wherein the position sensor assembly is a non-contact, optical position sensor assembly comprising an optical read head and a scale with markings.

11. The test instrument of claim 10 , wherein the optical read head is mounted on the housing and the scale is mounted on the movable probe assembly.

12. The test instrument of claim 1 , wherein the plurality of contacts is a plurality of contact pins.

13. The test instrument of claim 12 , wherein the plurality of contact pins are spring-loaded.

14. The test instrument of claim 1 , further comprising a heating element located on the housing near where the sample is positioned during operation.

15. The test instrument of claim 14 , wherein the heating element is a Peltier device or a resistive heater element.

16. The test instrument of claim 1 , further comprising a controller for controlling the linear actuator, wherein during testing the controller sets and controls the force applied by the probe head to the sample.

17. A test instrument for use with a sample having a plurality of electrically conducting contact pads, said instrument comprising:

a controllable, variable force linear actuator;

a probe assembly operated by the linear actuator, said probe assembly having a probe head at one end with a surface for contacting the sample;

a movable contactor assembly including a plurality of contacts for electrically contacting the plurality of contact pads on the sample;

a housing on which the linear actuator and contactor assembly are mounted, said housing having an identified area for holding the sample during testing;

a position sensor assembly for measuring changes in the position of the probe; and

a sensor for measuring a force applied to the sample by the probe head,

wherein the linear actuator is a pneumatic actuator comprising an air bearing cylinder and wherein the sensor for measuring the force applied to the sample by the probe head is a pressure sensor arranged to measure a pressure of gas supplied to the pneumatic actuator.

18. The test instrument of claim 5 , wherein the linear actuator is a Lorentz-force electromagnetic actuator.

Assignments (3)
SECURITY INTEREST Recorded Jan 21, 2026
From: INDIGO TECHNOLOGIES, INC.
To: MASSACHUSETTS DEVELOPMENT FINANCE AGENCY
Reel/Frame 073538/0251 →
CHANGE OF NAME Recorded Mar 27, 2019
From: NUCLEUS SCIENTIFIC, INC.
To: INDIGO TECHNOLOGIES, INC.
Reel/Frame 048709/0747 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2015
From: HUNTER, IAN W.; KRISTOFEK, GRANT W.; LJUBICIC, DEAN
To: NUCLEUS SCIENTIFIC INC.
Reel/Frame 036592/0804 →
Continuity (2)
Provisional Application 62028431 · Jul 24, 2014
Related Publication 20160025817A1 · Jan 28, 2016