IP Library Granted Patent US 9,552,862
Granted Patent B2
US 9,552,862 · App. 14/812,812 · Granted Jan 24, 2017

Magnetic ram array architecture

Inventors: Thomas Ohki (Arlington, MA); Oleg Mukhanov (Putnam Valley, NY); Alex Kirichenko (Pleasantville, NY)
Assignees: RAYTHEON BBN TECHNOLOGIES CORP.; HYPRES, INC.
G11C11/1675G11C11/1659G11C11/1673G11C11/18
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Quick Facts
Patent No.
US 9,552,862
App. No.
14/812,812
Granted
Jan 24, 2017
Kind
B2
Abstract

A magnetic random access memory (MRAM) array including: a plurality of MRAM cells arranged in an array configuration, each comprising a first type nTron and a magnetic memory element; a wordline select circuit comprising of a second type nTron to drive a plurality of parallel wordlines; and a plurality of bitline select circuits, each comprising of said second type nTron for writing to and reading from a column of memory cells in the array and each capable of selecting a single MRAM cell for a memory read or write operation, wherein the second nTron has a higher current drive than the first nTron.

Claims (11)

1. A magnetic random access memory (MRAM) array comprising:

a plurality of MRAM cells arranged in an array configuration, each comprising a first type nTron and a magnetic memory element;

a wordline select circuit comprising of a second type nTron to drive a plurality of parallel wordlines comprising of a memory word; and

a plurality of bitline select circuits, each comprising of said second type nTron for writing to and reading from a column of memory cells in the MRAM array and each capable of selecting a single MRAM cell for a memory read or write operation, wherein the second nTron has a higher current drive than the first nTron.

2. The MRAM array of claim 1 , wherein the magnetic memory element is a Cryogenic Orthogonal Spin-Transfer (COST) device.

3. The MRAM array of claim 2 , wherein the each of the plurality of MRAM cells further comprises of an inductance.

4. The MRAM array of claim 1 , wherein the magnetic memory element is a Cryogenic Spin Hall Effect (CSHE) device.

5. The MRAM array of claim 1 , wherein the second type nTron is capable of driving a linear array of 64 first type nTrons for a memory word of 64 bits wide.

6. The MRAM array of claim 1 , further comprising a Single Flux Quantum (SFQ) comparator for reading a state of each MRAM cell, during the memory read operation.

7. The MRAM array of claim 6 , wherein the SFQ comparator senses a resistance of said each MRAM cell for reading the state of said each MRAM cell.

8. The MRAM array of claim 1 , wherein during a memory read operation, the second type nTron applies a current to the memory element smaller than a critical current of the memory element to keep the memory element at its current state while being read.

Assignments (5)
CHANGE OF NAME Recorded Aug 22, 2024
From: RAYTHEON BBN TECHNOLOGIES CORP.
To: RTX BBN TECHNOLOGIES, INC.
Reel/Frame 068748/0419 →
RELEASE OF SECURITY INTEREST Recorded Aug 6, 2024
From: AVIDBANK
To: HYPRES, INC.
Reel/Frame 068348/0909 →
SECURITY INTEREST Recorded Jun 17, 2021
From: HYPRES, INC.
To: AVIDBANK
Reel/Frame 056617/0116 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 7, 2016
From: OHKI, THOMAS
To: RAYTHEON BBN TECHNOLOGIES CORP.
Reel/Frame 039661/0521 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 7, 2016
From: MUKHANOV, OLEG; KIRICHENKO, ALEX
To: HYPRES, INC.
Reel/Frame 039661/0525 →
Continuity (2)
Provisional Application 62030333 · Jul 29, 2014
Related Publication 20160035404A1 · Feb 4, 2016