IP Library Granted Patent US 9,705,288
Granted Patent B2
US 9,705,288 · App. 14/828,207 · Granted Jul 11, 2017

Electron beam pumped vertical cavity surface emitting laser

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Quick Facts
Patent No.
US 9,705,288
App. No.
14/828,207
Granted
Jul 11, 2017
Kind
B2
Abstract

A vertical external cavity surface emitting laser (VECSEL) structure includes a heterostructure and first and second reflectors. The heterostructure comprises an active region having one or more quantum well structures configured to emit radiation at a wavelength, λ lase , in response to pumping by an electron beam. One or more layers of the heterostructure may be doped. The active region is disposed between the first reflector and the second reflector and is spaced apart from the first reflector by an external cavity. An electron beam source is configured to generate the electron beam directed toward the active region. At least one electrical contact is electrically coupled to the heterostructure and is configured to provide a current path between the heterostructure and ground.

Claims (42)

1. A vertical external cavity surface emitting laser (VECSEL) structure, comprising:

a first reflector;

a second reflector;

a heterostructure comprising an active region that includes one or more quantum well structures comprising AlGaInN configured to emit radiation at a wavelength, λ lase , having a range from about 200 to about 400 nm, in response to pumping by an electron beam, the active region disposed between the first reflector and the second reflector and spaced apart from the first reflector by an external cavity;

an electron beam source configured to generate the electron beam which is directed toward the active region; and

one or more electrical contacts, each of the contacts having the same electrical potential and electrically coupled to the heterostructure and configured to provide a current path that discharges electrons arising from the electron beam pumping of the heterostructure.

2. The structure of claim 1 , further comprising a vacuum chamber, wherein the second reflector, the heterostructure, the at least one electrical contact are disposed within the vacuum chamber and the first reflector is disposed outside the vacuum chamber.

3. The structure of claim 1 , wherein the heterostructure comprises a M-N semiconductor having one or more layers with n- or p-type doping in a range between about 10 17 /cm′ to about 10 20 /cm 3 and the n-type doping includes one or more of Si, Ge, and Sn and the p-type doping includes one or more of Mg, Be, Zn, Cd, and C.

4. The structure of claim 1 , wherein the electron beam source is configured to produce a stationary electron beam.

5. The structure of claim 1 , wherein the electron beam has at least one of:

a cross sectional diameter of about 10 μm to about 500 μm; and

a power density of the electron beam is greater than about 20 kW/cm 2 .

6. The structure of claim 1 , further comprising an optical element disposed within the optical cavity.

7. The structure of claim 1 , wherein each of the quantum well structures are located substantially at an antinode of the radiation.

8. The structure of claim 1 , further comprising a substrate comprising AlN or GaN or sapphire.

9. The structure of claim 8 , wherein the substrate has a thickness less than about 100 μm.

10. The structure of claim 1 , further comprising a heat sink arranged to remove heat from the active region.

11. The structure of claim 10 , wherein the heat sink is adjacent the second reflector.

12. The structure of claim 10 , wherein the heat sink comprises one or more of diamond, copper, copper-tungsten, aluminum, and AlSiC.

13. The structure of claim 1 , wherein the first and second reflectors have reflectivity greater than 99% at the wavelength, λ lase .

14. The structure of claim 1 , wherein the structure is configured to provide output radiation having a line width smaller than 0.5 nm at a power output of more than 20 mW.

15. A vertical external cavity surface emitting laser (VECSEL) structure, comprising:

a first reflector;

a second reflector;

a heterostructure comprising an active region that includes one or more quantum well structures comprising AlGaInN configured to emit radiation at a wavelength, λ lase , having a range from about 200 to about 400 nm, in response to pumping by an electron beam, the active region disposed between the first reflector and the second reflector and spaced apart from the first reflector by an external cavity, the active region having a resonant periodic gain structure such that antinodes of a standing wave in the active region occur near the quantum well structures;

an electron beam source configured to generate the electron beam which is directed toward the active region; and

one or more electrical contacts electrically coupled to the heterostructure and configured to provide a current path that discharges electrons arising from the electron beam pumping of the heterostructure, each of the electrical contacts having the same electrical potential.

16. A method, comprising:

epitaxially growing a heterostructure comprising an active region having one or more quantum well structures comprising AlGaInN and configured to emit radiation in response to an electron beam, the radiation having a wavelength, λ lase , in a range of 200 to 400 nm;

forming a second reflector comprising a distributed Bragg reflector (DBR);

forming one or more electrical contacts electrically coupled to the heterostructure, each of the electrical contacts having the same electrical potential;

arranging the heterostructure, the second reflector, the electrical contact, and a first reflector so that the heterostructure is disposed between the first reflector and the second reflector and the heterostructure is spaced apart from the first reflector by an external cavity; and

arranging an electron beam source to generate the electron beam that pumps the active region, wherein the electrical contact is configured to electrically discharge electrons arising from electron beam pumping of the heterostructure.

17. The method of claim 16 , wherein:

epitaxially growing the heterostructure comprises epitaxially growing the heterostructure on a first major surface of a substrate; and

thinning the substrate to a thickness less than about 100 μm.

18. The method of claim 17 , wherein the substrate comprises AlN or GaN.

19. The method of claim 17 , wherein forming the second reflector comprises depositing a dielectric distributed Bragg reflector (DBR) on a second major surface of the thinned substrate.

20. The method of claim 16 , wherein:

epitaxially growing the heterostructure comprises epitaxially growing the heterostructure on a first major surface of a substrate; and

removing the substrate.

21. The method of claim 20 , wherein forming the second reflector comprises depositing a dielectric distributed Bragg reflector (DBR) on the heterostructure.

Assignments (9)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 6, 2025
From: XEROX CORPORATION
To: GENESEE VALLEY INNOVATIONS, LLC
Reel/Frame 073842/0479 →
SECOND LIEN NOTES PATENT SECURITY AGREEMENT Recorded Jul 2, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 071785/0550 →
FIRST LIEN NOTES PATENT SECURITY AGREEMENT Recorded Apr 11, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 070824/0001 →
SECURITY INTEREST Recorded Feb 13, 2024
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 066741/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RF 064760/0389 Recorded Feb 13, 2024
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: XEROX CORPORATION
Reel/Frame 068261/0001 →
SECURITY INTEREST Recorded Nov 20, 2023
From: XEROX CORPORATION
To: JEFFERIES FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 065628/0019 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVAL OF US PATENTS 9356603, 10026651, 10626048 AND INCLUSION OF US PATENT 7167871 PREVIOUSLY RECORDED ON REEL 064038 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jun 28, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064161/0001 →
SECURITY INTEREST Recorded Jun 22, 2023
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 064760/0389 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 20, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064038/0001 →