Detection of particle characteristics
View Patent ↗A method of detecting particles in an air flow is described. The method includes receiving a signal indicative of light intensity scattered from the air flow at a plurality of wavelengths and processing the signal indicative of the intensity of received light at each of the wavelengths and a corresponding wavelength dependent parameter to generate an output signal indicative of at least one characteristic of particles in the air flow. A particle detection system is also described.
1. A particle detection system for including:
a detection chamber adapted to receive an air sample;
first particle detection means including a first light source for illuminating a first volume of the air sample at at least a first wavelength, and a first light receiver having a field of view intersecting with the first volume for receiving light scattered from the detection chamber and outputting a first signal indicative of the scattered received light;
second particle detection means including a second light source for illuminating a second volume of the air sample at at least a second wavelength, and a second light receiver having a field of view intersecting with the second volume for receiving light scattered from the detection chamber and outputting a second signal indicative of the scattered received light;
light source activation means adapted to selectively activate the first light source in a first time period and the second light source in a second time period; and
processing means adapted to receive a first signal from the first light receiver and a second signal from the second light receiver corresponding to the first time period and process the received signals to generate a first output corresponding to the first time period corrected for background light; and to receive a first signal from the first light receiver and a second signal from the second light receiver corresponding to the second time period and process the received signals to generate a second output corresponding to the second time period that is corrected for background light.
2. The particle detection system as claimed in claim 1 wherein the detection chamber includes at least one wall within the field of view of each of the first and second light receivers and wherein the first and second light receivers are positioned such that substantially the same portion of said chamber wall lies within the field of view of each of the first and second light receivers.
3. The particle detection system as claimed in claim 1 wherein the first and second light receivers are positioned with respect to their corresponding first and second light sources such that the field of view of the first light receiver and the second volume do not intersect, and the field of view of the second light receiver and the first volume do not intersect.
4. The particle detection system as claimed in claim 1 wherein the first and second wavelengths are different wavelengths.
5. The particle detection system as claimed in claim 1 wherein the first output corresponding to the first time period is corrected for background light by a process including subtracting the second signal indicative of the scattered received light corresponding to the first time period from the first signal indicative of the scattered received light corresponding to the first time period.
6. The particle detection system as claimed in claim 1 wherein the second output corresponding to the second time period is corrected for background light by a process including subtracting the first signal indicative of the scattered received light corresponding to the second time period from the second signal indicative of the scattered received light corresponding to the second time period.
7. The particle detection system as claimed in claim 1 wherein the first and second wavelengths are the same wavelengths.