Sample observation method and sample observation device
View Patent ↗A sample observation method includes an acquisition of for acquiring an electronic image of a sample, and a subtraction step of subtracting a DC component from a signal of the electronic image, and the acquisition step is performed in a state of bright-field observation, the electronic image at the subtraction step is an image acquired in a first predetermined state, and in the first predetermined state, at least a position of the sample and a in-focus position of an image forming optical system are different. A sample observation device includes a light source, an illumination optical system, an image forming optical system, an image-pickup device, and an image processing device, and the illumination optical system is disposed so as to irradiate a sample with illumination light from the light source, the image forming optical system is disposed so that light from the sample is incident thereon and an optical image of the sample is formed, the image-pickup device is disposed at a position of the optical image, and the image processing device is configured to implement the aforementioned sample observation method.
1. A sample observation method, comprising:
acquiring an electronic image of a sample with a sensor in a state of bright-field observation, and
acquiring a subtracted image of the sample at a second wavelength band with the sensor by subtracting a DC component from a signal of the electronic image to form an image in a predetermined state,
wherein
the predetermined state is a state in which an in-focus position of an image forming optical system at a first wavelength band is coincident with a position of the sample, and an in-focus position of an image forming optical system at the second wavelength band is different from the position of the sample,
the second wavelength band is coincident with a part of the first wavelength band, or is different from the first wavelength band, and
the in-focus position is a position where, at a spatial frequency which is included in the sample, an amount of wavefront aberration in zero-order diffracted light and an amount of wavefront aberration in first-order diffracted light are both 0.
2. The sample observation method according to claim 1 , further comprising:
an amplification step after the step of forming the image in the second predetermined state,
wherein
at the amplification step, a signal of an electronic image subjected to the step of forming the image in the second predetermined state is amplified.
3. The sample observation method according to claim 1 , further comprising:
performing Fourier transform, with an image processor, of a signal of the electronic image, and
performing inverse Fourier transform, with the image processor,
wherein
performing Fourier transform of the signal prior to the step of forming the image in the second predetermined state, and
performing inverse Fourier transform at least after the step of forming the image in the second predetermined state.
4. The sample observation method according to claim 1 , further comprising:
an acquisition in advance step, and
a normalization step,
wherein
at the acquisition in advance step, an electronic image is acquired without the sample,
at the normalization step, using the electronic image, an electronic image of the sample is normalized, and
the normalization step is performed prior to the step of forming the image in the second predetermined state.
5. The sample observation method according to claim 1 , wherein
the second wavelength band is changed with reference to the first wavelength band a plurality of times,
at each second wavelength band after changing, the step of acquiring the electronic image of the sample and the step of forming the image in the second predetermined state are performed, and thereby a plurality of electronic images are generated after the step of forming the image in the second predetermined state, and
the plurality of electronic images generated are added.
6. The sample observation method according to claim 5 , wherein
before the addition, a part with highest contrast in each of the plurality of electronic images is extracted, and
addition is performed using the extracted parts.
7. The sample observation method according to claim 5 , wherein
a change of the second wavelength band is made while keeping a sign of the amount of wavefront aberration in the second predetermined state same.
8. A sample observation device, comprising:
a light source,
an illumination optical system,
an image forming optical system,
a sensor, and
an image processor,
wherein
the illumination optical system is disposed so as to irradiate a sample with illumination light from the light source,
the image forming optical system is disposed so that light from the sample is incident thereon and an optical image of the sample is formed,
the sensor is disposed at a position of the optical image, and
the image processor is configured to perform the steps of the sample observation method according to claim 1 .
9. The sample observation device according to claim 8 , further comprising a display device, wherein
the display device displays an output signal from the image processor.
10. The sample observation device according to claim 8 , wherein
the following conditional expression 1 is satisfied:
10 μm< d /NA ob 2 <1000 μm 1
Where
d denotes an amount of axial chromatic aberration of the second wavelength band with reference to the first wavelength band, and
NA ob denotes a numerical aperture of the image forming optical system on the sample side.
11. The sample observation device according to claim 8 , wherein
the image forming optical system includes an objective lens, and
axial chromatic aberration at the objective lens changes monotonously with wavelength.
12. The sample observation device according to claim 8 , wherein
in the sensor, a minute optical filter having a different wavelength band is displaced for each pixel.