IP Library Granted Patent US 9,883,615
Granted Patent B2
US 9,883,615 · App. 14/842,151 · Granted Jan 30, 2018

Semiconductor memory device having a heat conduction member

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Quick Facts
Patent No.
US 9,883,615
App. No.
14/842,151
Granted
Jan 30, 2018
Kind
B2
Abstract

A semiconductor memory device includes a substrate having a conductive region on a surface thereof, a semiconductor memory unit, a memory controller, at least one of the semiconductor memory unit and the memory controller being disposed on the substrate, a housing enclosing the substrate, and a heat conduction member in contact with and pressed between the conductive region and a portion of the housing.

Claims (52)

1. A semiconductor memory device, comprising:

a substrate having a conductive region on a surface thereof;

a semiconductor memory unit;

a memory controller, at least one of the semiconductor memory unit and the memory controller being disposed on the substrate;

a housing enclosing the substrate; and

a heat conduction member in contact with and pressed between the conductive region and a portion of the housing, wherein the heat conduction member is made of an electrically-insulating material.

2. The semiconductor memory device according to claim 1 , wherein

the portion of the housing extends into an interior of the housing from a side thereof.

3. The semiconductor memory device according to claim 1 , wherein

the heat conduction member has an elasticity that is greater than those of the substrate and the housing.

4. The semiconductor memory device according to claim 1 , wherein

the conductive region is disposed at a position adjacent to an edge of the substrate.

5. The semiconductor memory device according to claim 1 , wherein

the semiconductor memory unit and the memory controller are both disposed on the substrate, and

the heat conduction member is disposed at a position that is closer to the semiconductor memory unit than to the memory controller.

6. The semiconductor memory device according to claim 1 , wherein

the substrate includes a conductive layer, an insulating layer having a portion in which the conductive region is formed, and a plurality of vias electrically connecting the conductive layer and the conductive region.

7. The semiconductor memory device according to claim 1 , wherein

the housing includes a first cover member covering a portion of the surface of the substrate, a second cover member covering another portion of the surface of the substrate, and a heat insulating member disposed between the first cover member and the second cover member.

8. The semiconductor memory device according to claim 1 , wherein

the housing includes a top cover member and a bottom cover member, and

the heat conduction member is pressed between the conductive region and the top cover member.

9. The semiconductor memory device according to claim 8 , wherein the substrate has a second conductive region on a second surface thereof that is opposite to the surface, the semiconductor memory device further comprising:

a second heat conduction member in contact with and pressed between the second conductive region and the bottom cover member.

10. A semiconductor memory device, comprising:

a first substrate having a first conductive region on a first surface thereof, and a second conductive region and a connector on a second surface thereof, the second surface being opposite to the first surface;

a second substrate positioned on the second surface side of the first substrate and electrically connected to the connector;

a semiconductor memory unit disposed on the first substrate;

a memory controller disposed on the second substrate;

a housing enclosing the first and second substrates and including a top cover member and a frame member;

a first heat conduction member in contact with and pressed between the first conductive region and the top cover member; and

a second heat conduction member in contact with and pressed between the second conductive region and the frame member.

11. The semiconductor memory device according to claim 10 , wherein

the first conductive region is disposed at a position corresponding to the connector.

12. The semiconductor memory device according to claim 10 , wherein

the first and second conductive regions are disposed at positions of the first substrate corresponding to each other.

13. The semiconductor memory device according to claim 10 , wherein the second substrate has a third conductive region on a surface facing the first substrate, the semiconductor memory device further comprising:

a third heat conduction member in contact with and pressed between the third conductive region and the frame member.

14. The semiconductor memory device according to claim 13 , wherein

the second and third heat conduction members are disposed at positions of the frame member corresponding to each other.

15. A semiconductor memory device, comprising:

a substrate having a conductive region on a surface thereof;

a semiconductor memory unit;

a memory controller, at least one of the semiconductor memory unit and the memory controller being disposed on the substrate;

a housing enclosing the substrate; and

a heat conduction member in contact with and between the conductive region and a portion of the housing, such that heat is transferred from the conductive region to the portion of the housing therethrough, wherein the heat conduction member is made of an electrically-insulating material.

16. The semiconductor memory device according to claim 15 , wherein

the portion of the housing extends into an interior of the housing.

17. The semiconductor memory device according to claim 15 , wherein

the heat conduction member has an elasticity that is greater than those of the substrate and the housing.

18. The semiconductor memory device according to claim 15 , wherein

the conductive region is disposed near an edge of the substrate.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0647 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 16, 2015
From: YOSHINAGA, KOUEI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037051/0675 →