IP Library Granted Patent US 9,788,463
Granted Patent B2
US 9,788,463 · App. 14/842,313 · Granted Oct 10, 2017

Semiconductor memory device having a heat insulating mechanism

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Quick Facts
Patent No.
US 9,788,463
App. No.
14/842,313
Granted
Oct 10, 2017
Kind
B2
Abstract

A semiconductor memory device includes a semiconductor memory unit, a memory controller, a cover unit having a first portion covering the semiconductor memory unit and a second portion covering the memory controller, a first heat conduction member disposed between the semiconductor memory unit and the first portion of the cover unit, and a second heat conduction member disposed between the memory controller and the second portion of the cover. The cover unit has a gap formed between the first and second portions.

Claims (69)

1. A semiconductor memory device, comprising:

a semiconductor memory unit;

a memory controller;

a cover unit having a first portion covering the semiconductor memory unit and a second portion covering the memory controller;

a first heat conduction member disposed between the semiconductor memory unit and the first portion of the cover unit; and

a second heat conduction member disposed between the memory controller and the second portion of the cover unit, wherein

the cover unit has a gap formed between the first and second portions.

2. The semiconductor memory device according to claim 1 , wherein

a portion of the gap extends linearly and is aligned with an edge of the memory controller.

3. The semiconductor memory device according to claim 1 , further comprising:

a first substrate having a surface that faces the first portion of the cover unit and on which the semiconductor memory unit is disposed; and

a second substrate having a surface that faces the second portion of the cover unit and on which the memory controller is disposed, the first substrate being disposed between the second substrate and the first portion of the cover unit, wherein

the second portion of the cover unit extends through an opening formed in the first substrate.

4. The semiconductor memory device according to claim 3 , wherein

the first substrate includes a connector electrically connected to the second substrate, and

the first portion of the cover unit covers a portion of the first substrate corresponding to the connector.

5. The semiconductor memory device according to claim 3 , wherein

the second portion of the cover unit extends through the opening in a thickness direction of the first substrate.

6. The semiconductor memory device according to claim 1 , wherein

at least one of the first and second portions of the cover unit has a plurality of fins extending outward.

7. The semiconductor memory device according to claim 1 , wherein

the first portion of the cover unit does not cover any portion of the memory controller, and

the second portion of the cover unit does not cover any portion of the semiconductor memory unit.

8. The semiconductor memory device according to claim 1 , wherein

the first portion of the cover unit has an opening at a location corresponding to that of the opening formed in the first substrate, and

the second portion of the cover unit protrudes through the opening in the first portion of the cover unit.

9. The semiconductor memory device according to claim 1 , wherein

the first heat conduction member is in direct contact with the first portion of the cover unit and the semiconductor memory unit, and

the second heat conduction member is in direct contact with the second portion of the cover unit and the memory controller.

10. A server, comprising:

a main body including a plurality of slots; and

a plurality of server modules, each being fit in one of the slots, wherein

at least one of the server modules includes a semiconductor memory device including:

a semiconductor memory unit;

a memory controller;

a cover unit having a first portion covering the semiconductor memory unit and a second portion covering the memory controller;

a first heat conduction member disposed between the semiconductor memory unit and the first portion of the cover unit; and

a second heat conduction member disposed between the memory controller and the second portion of the cover unit, and wherein

the cover unit has a gap formed between the first and second portions.

11. The server according to claim 10 , wherein

a portion of the gap extends linearly and is aligned with an edge of the memory controller.

12. The server according to claim 10 , wherein

the second portion of the cover unit has a plurality of fins extending outward.

13. The server according to claim 12 , wherein

said one of the server modules further includes a fan, and

the fins also extend along a direction of an air flow generated by the fan.

14. The server according to claim 10 , wherein

said one of the server modules further includes a container in which the semiconductor memory device is contained and a third heat conduction member disposed between the container and the second portion of the cover unit.

15. The server according to claim 14 , wherein

the third heat conduction member is formed of an elastic material and pressed between the container and the second portion of the cover unit.

16. A semiconductor memory device, comprising:

a semiconductor memory unit;

a memory controller;

a cover unit having a first portion covering the semiconductor memory unit and a second portion covering the memory controller;

a first heat conduction member disposed between the semiconductor memory unit and the first portion of the cover unit;

a second heat conduction member disposed between the memory controller and the second portion of the cover unit; and

a heat insulating member disposed between a gap formed between the first and second portions.

17. The semiconductor memory device according to claim 16 , wherein

a portion of the gap extends linearly and is aligned with an edge of the memory controller.

18. The semiconductor memory device according to claim 16 , wherein

a first substrate having a surface that faces the first portion of the cover unit and on which the semiconductor memory unit is disposed; and

a second substrate having a surface that faces the second portion of the cover unit and on which the memory controller is disposed, the first substrate being disposed between the second substrate and the first portion of the cover unit, wherein

the second portion of the cover unit extends through an opening formed in the first substrate.

19. The semiconductor memory device according to claim 16 , wherein

the first portion of the cover unit does not cover any portion of the memory controller, and

the second portion of the cover unit does not cover any portion of the semiconductor memory unit.

20. The semiconductor memory device according to claim 16 , wherein

the first heat conduction member is in direct contact with the first portion of the cover unit and the semiconductor memory unit, and

the second heat conduction member is in direct contact with the second portion of the cover unit and the memory controller.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0647 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2015
From: OZAWA, YASUYUKI; KIMURA, FUMINORI; NIIJIMA, MASAAKI; IIJIMA, MASAHIRO; MATSUDA, YOSHIHARU; SAWANAKA, KENICHI; YOSHIDA, KAZUHIRO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037063/0526 →