IP Library Granted Patent US 9,917,567
Granted Patent B2
US 9,917,567 · App. 14/843,943 · Granted Mar 13, 2018

Bulk acoustic resonator comprising aluminum scandium nitride

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Quick Facts
Patent No.
US 9,917,567
App. No.
14/843,943
Granted
Mar 13, 2018
Kind
B2
Abstract

A ladder filter includes a plurality of series resonators and a plurality of shunt resonators connected between an input port and an output port. At least one of the series or shunt resonators include a bulk acoustic wave (BAW) resonator structure, which includes: a first electrode disposed over a substrate; an air cavity located in the substrate and below the first electrode; a piezoelectric layer disposed over the first electrode and comprising aluminum scandium nitride, the piezoelectric layer having a thickness in a range of approximately 1.0 microns to approximately 1.5 microns; and a second electrode disposed over the piezoelectric layer. The BAW resonator structure has an area, and the area is less than an area of a comparable BAW resonator structure comprising identical layers and materials except for an undoped aluminum nitride piezoelectric layer.

Claims (33)

1. A bulk acoustic wave (BAW) resonator structure, comprising:

a first electrode disposed over a substrate;

an air cavity located in the substrate and below the first electrode;

a piezoelectric layer disposed over the first electrode and comprising aluminum scandium nitride, the piezoelectric layer having a thickness in a range of approximately 1.0 μm to approximately 1.5 μm; and

a second electrode disposed over the piezoelectric layer, wherein the BAW resonator structure has an electrical impedance, and an area, and the area is less than an area of a comparable BAW resonator structure comprising identical layers and materials except for comprising an undoped aluminum nitride piezoelectric layer, and having the same electrical impedance.

2. The BAW resonator structure of claim 1 , wherein the BAW resonator structure has a passband with a center frequency in a range of approximately 700 MHz to approximately 900 MHz.

3. The BAW resonator structure of claim 1 , wherein the aluminum scandium nitride has a scandium concentration between approximately zero percent by number of atoms and 50 percent by number of atoms.

4. The BAW resonator structure of claim 1 , wherein the aluminum scandium nitride has a scandium concentration of approximately 5 percent by number of atoms to approximately 10 percent by number of atoms.

5. A bulk acoustic wave (BAW) resonator structure, comprising:

a first electrode disposed over a substrate;

an air cavity located in the substrate and below the first electrode;

a piezoelectric layer disposed over the first electrode and comprising aluminum scandium nitride, wherein the BAW resonator structure has a passband with a center frequency between approximately 700 MHz and approximately 900 MHz; and

a second electrode disposed over the piezoelectric layer, wherein the BAW resonator structure has an electrical impedance, and an area, and the area is less than an area of a comparable BAW resonator structure comprising identical layers and materials except for comprising an undoped aluminum nitride piezoelectric layer, and having the same electrical impedance.

6. The BAW resonator structure of claim 5 , wherein the first and second electrodes each comprise tungsten.

7. The BAW resonator structure of claim 5 , wherein the piezoelectric layer has a thickness in a range of approximately 1.0 μm to approximately 1.5 μm.

8. The BAW resonator structure of claim 5 , wherein the aluminum scandium nitride has a scandium concentration of approximately 5 percent by number of atoms to approximately 10 percent by number of atoms.

9. The BAW resonator structure of claim 5 , wherein the aluminum scandium nitride has a scandium concentration of approximately 0 percent by number of atoms to approximately 50 percent by number of atoms.

10. A ladder filter comprising a plurality of series resonators and a plurality of shunt resonators connected between an input port and an output port, at least one of the series resonators, or shunt resonators comprising a bulk acoustic wave (BAW) resonator structure, comprising:

a first electrode disposed over a substrate;

an air cavity located in the substrate and below the first electrode;

a piezoelectric layer disposed over the first electrode and comprising aluminum scandium nitride, the piezoelectric layer having a thickness in a range of approximately 1.0 microns to approximately 1.5 microns; and

a second electrode disposed over the piezoelectric layer, wherein the BAW resonator structure has an electrical impedance, and an area, and the area is less than an area of a comparable BAW resonator structure comprising identical layers and materials except for an undoped aluminum nitride piezoelectric layer, and having the same electrical impedance.

11. The ladder filter of claim 10 , wherein the aluminum scandium nitride has a scandium concentration between approximately 0 percent and approximately 50 percent by number of atoms.

12. The ladder filter of claim 10 , wherein the aluminum scandium nitride has a scandium concentration of approximately 5 percent by number of atoms to approximately 10 percent by number of atoms.

13. A ladder filter comprising a plurality of series resonators and a plurality of shunt resonators connected between an input port and an output port, at least one of the series resonators, or shunt resonators comprising a bulk acoustic wave (BAW) resonator structure, comprising:

a first electrode disposed over a substrate;

an air cavity located in the substrate and below the first electrode;

a piezoelectric layer disposed over the first electrode and comprising aluminum scandium nitride, the piezoelectric layer having a thickness in a range of approximately 1.0 microns to approximately 1.5 microns; and

a second electrode disposed over the piezoelectric layer, wherein the ladder filter has a passband with a center frequency in a range of approximately 700 MHz to approximately 900 MHz.

14. The ladder filter of claim 13 , wherein the aluminum scandium nitride has a scandium concentration between approximately 0 percent and approximately 50 percent by number of atoms.

15. The ladder filter of claim 13 , wherein the aluminum scandium nitride has a scandium concentration of approximately 5 percent by number of atoms to approximately 10 percent by number of atoms.

16. The ladder filter of claim 13 , wherein the aluminum scandium nitride has a scandium concentration of approximately 5 percent by number of atoms to approximately 10 percent by number of atoms.

17. The ladder filter of claim 13 , wherein the first and second electrodes each comprise tungsten.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 047422 FRAME: 0464. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 6, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048883/0702 →
MERGER Recorded Oct 5, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047422/0464 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 29, 2015
From: BRADLEY, PAUL; SHIRAKAWA, ALEXANDRE; BADER, STEFAN
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037373/0087 →