Data readout circuit of a storage device for read-out operation for preventing erroneous writing into a data storage element and reading out of the data correctly
View Patent ↗Provided is a data readout circuit capable of, even when a high voltage is applied during data read-out operation, preventing erroneous writing of the data and reading out the data correctly. The data readout circuit includes: a non-volatile storage element; a latch circuit including: an input inverter; an output inverter; and a MOS transistor; a first MOS transistor connected between the non-volatile storage element and the latch circuit; a second MOS transistor connected between the latch circuit and the first power supply terminal; a first bias circuit configured to bias a gate of the first MOS transistor; and a second bias circuit configured to bias the MOS transistor in the latch circuit, each of the first bias circuit and the second bias circuit being configured to output a predetermined bias voltage when the data in the non-volatile storage element is read out.
1. A data readout circuit, comprising:
a non-volatile storage element;
a latch circuit comprising:
an input inverter;
an output inverter; and
a third MOS transistor connected between the output inverter and a first power supply terminal,
the latch circuit being configured to hold data in the non-volatile storage element;
a first MOS transistor directly connected to the non-volatile storage element and directly connected to the latch circuit;
a second MOS transistor directly connected to the latch circuit and the first power supply terminal;
a first bias circuit configured to bias a gate of the first MOS transistor; and
a second bias circuit configured to bias the third MOS transistor in the latch circuit,
each of the first bias circuit and the second bias circuit being configured to output a predetermined bias voltage when the data in the non-volatile storage element is read out.
2. A data readout circuit according to claim 1 , further comprising:
a first capacitor connected between an output terminal of the first bias circuit and a second power supply terminal; and
a second capacitor connected between an output terminal of the second bias circuit and the first power supply terminal.
3. A data readout circuit according to claim 1 , wherein the data in the non-volatile storage element is read out from an output terminal of the input inverter in the latch circuit.
4. A data readout circuit according to claim 2 , wherein the data in the non-volatile storage element is read out from an output terminal of the input inverter in the latch circuit.