Multilayer substrate, design method of multilayer substrate, manufacturing method of semiconductor device, and recording medium
View Patent ↗According to one embodiment, there is provided a multilayer substrate including a ground layer and a signal layer. The ground layer includes a mesh ground having multiple openings. The signal layer is laid above the ground layer and including multiple signal lines. The multiple openings include first openings and second openings. The first openings overlap a first signal line from among the multiple signal lines when seen through in a direction perpendicular to a surface of the multilayer substrate. The second openings overlap the first signal line when seen through in the direction perpendicular to the surface of the multilayer substrate. The first openings have a first form, and the second openings have a second form different from the first form.
1. A multilayer substrate comprising:
a ground layer including a mesh ground having multiple openings, the multiple openings being arranged in a matrix along a first direction and a third direction, the third direction being substantially perpendicular to the first direction; and
a signal layer laid above the ground layer and including multiple signal lines,
wherein the multiple openings include:
first openings that overlap a first part of a first signal line from among the multiple signal lines when seen through in a direction perpendicular to a surface of the multilayer substrate, the first part extending in the first direction; and
second openings that overlap a second part of the first signal line when seen through in the direction perpendicular to the surface of the multilayer substrate, the second part extending in a second direction, the second direction being different from the first direction, the second direction being different from the third direction, and
wherein the first openings have a first form, and the second openings have a second form different from the first form, and
the second form includes a substantially rectangular shape of outline and a first orientation, the first orientation being an orientation with which a diagonal line of the second opening crosses both the first direction and the third direction.
2. The multilayer substrate according to claim 1 , wherein
the first form includes a substantially rectangular shape of outline and a second orientation, the second orientation being an orientation with which a diagonal line of the first opening is substantially parallel to the first direction.
3. The multilayer substrate according to claim 2 , wherein
a maximum diagonal length of the second opening is greater than a maximum diagonal length of the first opening.
4. The multilayer substrate according to claim 1 , wherein
the multiple openings further include:
third openings that overlap a third part of a second signal line from among the multiple signal lines when seen through in the direction perpendicular to the surface of the multilayer substrate, the third part extending in the first direction; and
fourth openings that overlap a fourth part of the second signal line when seen through in the direction perpendicular to the surface of the multilayer substrate, the fourth part extending in the second direction, and
wherein the third openings have the second form, and the fourth openings have the second form, and
the first orientation is an orientation with which a diagonal line of the third opening crosses both the first direction and the third direction and with which a diagonal line of the fourth opening crosses both the first direction and the third direction.
5. The multilayer substrate according to claim 4 , wherein
the first form includes a substantially rectangular shape of outline and a second orientation,
the second orientation being an orientation with which a diagonal line of the first opening is substantially parallel to the first direction.
6. The multilayer substrate according to claim 5 , wherein
a maximum diagonal length of the second opening is greater than a maximum diagonal length of the first opening,
a maximum diagonal length of the third opening is greater than the maximum diagonal length of the first opening, and
a maximum diagonal length of the fourth opening is greater than the maximum diagonal length of the first opening.
7. The multilayer substrate according to claim 4 , wherein
the first signal line and the second signal line are placed substantially parallel to each other when seen through in the direction perpendicular to the surface of the multilayer substrate.
8. The multilayer substrate according to claim 1 , wherein
the first form includes a substantially circular shape of outline.
9. The multilayer substrate according to claim 8 , wherein
a maximum diagonal length of the second opening is greater than a diameter of the first opening.
10. The multilayer substrate according to claim 1 , wherein
the multiple signal lines together function as a bus line.