Scintillation compound including a rare earth element and a process of forming the same
A scintillation compound can include a rare earth element that is in a divalent (RE 2+ ) or a tetravalent state (RE 4+ ). The scintillation compound can include another element to allow for better change balance. The other element may be a principal constituent of the scintillation compound or may be a dopant or a co-dopant. In an embodiment, a metal element in a trivalent state (M 3+ ) may be replaced by RE 4+ and a metal element in a divalent state (M 2+ ). In another embodiment, M 3+ may be replaced by RE 2+ and M 4+ . In a further embodiment, M 2+ may be replaced by a RE 3+ and a metal element in a monovalent state (M 1+ ). The metal element used for electronic charge balance may have a single valance state, rather than a plurality of valence states, to help reduce the likelihood that the valance state would change during formation of the scintillation compound.
1. A material comprising a rare earth (Ln) silicate doped with an element RE different from Ln, RE being chosen among Ce, Pr, Tb, wherein the element RE is at least partially in its 4+ oxidation state (RE 4+ ), the quantity of RE 4+ in said material being comprised between 0.0001% and 0.1% in mass, and further doped with a divalent alkaline-earth element.
2. The material according to claim 1 , wherein the material is a scintillation material and has an afterglow of less than 200 ppm after 100 ms relative to the intensity measured during an X-ray irradiation.
3. The material according to claim 1 , wherein it has the formula Ln (2-z-x1-x2) RE 3+ x1 RE 4+ x2 M z M′ v Si (p-v) O (3+2p) in which:
Ln represents a rare earth different than RE;
M represents a divalent alkaline-earth element;
M′ represents a trivalent element;
(z+v) is greater than or equal to 0.0001 and lower than or equal to 0.2;
z is greater than 0 and lower than or equal to 0.2;
v is greater than or equal to 0 and lower than or equal to 0.2;
x1 is greater than or equal to 0.00005 and lower than 0.1;
x2 is greater than or equal to 0.00005 and lower than 0.1;
x2/(x1+x2) is greater than or equal to 0.05 and lower than 1;
x1+x2 is lower than 0.1; and
p equals 1 or 2.
4. The material according to claim 3 , wherein z is greater than or equal to 0.00003.
5. The material according to claim 3 , wherein:
Ln is Y, La, Gd, Er, Ho, Lu, or any combination thereof;
M is Ca, Mg, Sr, Ba, or any combination thereof;
z is greater than or equal to 0.00003 and lower than or equal to 0.1;
x1 is greater than or equal to 0.00005 and lower than 0.01;
x2 is greater than or equal to 0.00005 and lower than 0.01; and
x2/(x1+x2) is greater than or equal to 0.1 and lower than or equal to 1.
6. A scintillation material according to claim 1 , wherein the scintillation material's absorbance at a wavelength of 357 nm is less than the scintillation material's absorbance at 280 nm.
7. The scintillation material according to the previous claim, wherein the scintillation material is codoped with a divalent alkaline earth element M present in a proportion from 0.0025 mol % to 15 mol % of the sum of all the rare earths included in the scintillation material.
8. An ionizing particle detector comprising the material of claim 1 and a photosensor.
9. A scintillation compound comprising a rare earth silicate having a dopant in a divalent state at a concentration of at least 5 ppm atomic and a rare earth element in a tetravalent state at a concentration of at least approximately 10 ppm atomic of the scintillation compound.
10. The scintillation compound of claim 9 , wherein a ratio of the rare earth element in the tetravalent state to the dopant is at least approximately 1:90.
11. The scintillation compound of claim 10 , wherein a ratio of the rare earth element in the tetravalent state to the dopant is no greater than approximately 90:1.
12. The scintillation compound according to claim 9 , wherein an absorbance of the scintillation compound at a wavelength of 357 nm is less than an absorbance of the scintillation material at 280 nm.
13. The scintillation compound according to claim 12 , wherein the scintillation material has an afterglow of less than 200 ppm after 100 ms relative to the intensity measured during an X-ray irradiation.
14. The scintillation compound according to claim 12 , wherein the scintillation material is codoped with a divalent alkaline earth element M present in a proportion from 0.0025 mol % to 15 mol % of the sum of all the rare earths included in the scintillation material.
15. The scintillation compound according to claim 12 , wherein the scintillation material is codoped with a trivalent metal M′ in a proportion from 0.005 mol % to 25 mol % of the sum of the moles of silicon and of trivalent metal codopant included in the scintillation material.
16. The scintillation according to claim 12 , wherein the scintillation material has the formula Ln (2-z-x) Ce x M z Si (p-v) M′ v O (3,2p) in which:
Ln represents a rare earth;
M represents a divalent alkaline earth element;
M′ represents a trivalent metal;
(z+v) is greater than or equal to 0.0001 and less than or equal to 0.2;
z is greater than or equal to 0.0003 and less than or equal to 0.2;
v is greater than or equal to 0 and less than or equal to 0.2;
x is greater than or equal to 0.0001 and less than 0.1; and
p is equal to 1 or 2.