Systems and methods for frequency domain calibration and characterization
View Patent ↗A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
1. A system for assigning a characterization and calibrating a parameter, the system comprising:
a frequency measurement circuit configured to measure frequencies of an oscillatory signal generated by a circuit, and to generate a measurement signal including measured frequencies; and
a finite state machine configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
2. The system of claim 1 , wherein the circuit that generates the oscillatory signal comprises a digital controlled oscillator.
3. The system of claim 1 , wherein the circuit that generates the oscillatory signal comprises a time to digital converter.
4. The system of claim 1 , wherein the frequency measurement circuit includes a plurality of first and second counters, where a first counter receives the oscillatory signal and a second counter receives a reference clock, and wherein the frequency measurement circuit uses the outputs of the first and second counters to generate the measured frequencies.
5. The system of claim 1 , wherein the finite state machine is configured to providing a timing control signal to the frequency measurement circuit.
6. The system of claim 5 , wherein the timing control signal is based on a selected accuracy.
7. The system of claim 1 , wherein the calibration signal includes a digital code.
8. The system of claim 1 , wherein the calibration signal includes a phase locked loop gain.
9. The system of claim 8 , wherein the phase locked loop gain and a digital controlled oscillator gain yield a constant value.
10. The system of claim 1 , further comprising a component having the parameter and configured to generate the oscillatory signal.
11. The system of claim 10 , wherein the component is a digital controlled oscillator.
12. The system of claim 10 , wherein the component is a time to digital converter.
13. A method for assigning a characterization and calibrating a component, the method comprising:
obtaining frequency measurements of an oscillatory signal;
assigning a characterization to a component parameter based on the obtained frequency measurements; and
generating a calibration signal based on the characterized component parameter.
14. The method of claim 13 , wherein assigning the characterization to the component parameter includes identifying frequency shifts due to process, voltage and/or temperature variations.
15. The method of claim 13 , wherein assigning the characterization to the component parameter includes identifying resolution shifts due to process, voltage and/or temperature variations.