IP Library Granted Patent US 10,004,442
Granted Patent B2
US 10,004,442 · App. 14/860,392 · Granted Jun 26, 2018

Advanced analyte sensor calibration and error detection

Inventors: Sebastian Böhm (San Diego, CA); Daiting Rong (San Diego, CA); Peter C. Simpson (Cardiff, CA)
Assignee: DexCom, Inc.
A61B5/1495A61B5/1451A61B5/1473A61B5/1486A61B5/14503A61B5/14517A61B5/14532A61B5/14546A61B5/7257A61B5/7267G01D18/00G01N27/026G01N27/3274G01N33/49A61B2560/0276
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Quick Facts
Patent No.
US 10,004,442
App. No.
14/860,392
Granted
Jun 26, 2018
Kind
B2
Abstract

Systems and methods for processing sensor data and self-calibration are provided. In some embodiments, systems and methods are provided which are capable of calibrating a continuous analyte sensor based on an initial sensitivity, and then continuously performing self-calibration without using, or with reduced use of, reference measurements. In certain embodiments, a sensitivity of the analyte sensor is determined by applying an estimative algorithm that is a function of certain parameters. Also described herein are systems and methods for determining a property of an analyte sensor using a stimulus signal. The sensor property can be used to compensate sensor data for sensitivity drift, or determine another property associated with the sensor, such as temperature, sensor membrane damage, moisture ingress in sensor electronics, and scaling factors.

Claims (20)

1. A method for determining a defective sensor, the method comprising:

generating sensor data using an implantable analyte sensor;

generating, using sensor electronics, analyte concentration values using the implantable sensor data generated by the continuous analyte sensor;

applying, to the implantable analyte sensor, a stimulus signal having a particular frequency, multiple stimulus signals having different frequencies, or a stimulus signal comprising a spectrum of frequencies;

measuring a signal response of the implantable analyte sensor to the stimulus signal;

determining a value associated with the signal response;

determining whether the value is within a predefined level;

determining that the implantable analyte sensor has a condition associated with membrane damage when the value exceeds the predefined level; and

notifying a user that the implantable analyte sensor is defective responsive to the determining that the implantable analyte sensor has the condition associated with membrane damage.

2. The method of claim 1 , wherein determining the value associated with the signal response of the implantable analyte sensor is performed iteratively.

3. The method of claim 1 , wherein determining the value associated with the signal response of the implantable analyte sensor is performed in substantially real time.

4. The method of claim 1 , wherein the value associated with the signal response is electrical impedance determined by electrochemical impedance spectroscopy.

5. The method of claim 1 , further comprising determining a sensitivity of the implantable analyte sensor during sensor use.

6. The method of claim 5 , wherein determining the sensitivity is performed in substantially real time.

7. The method of claim 5 , wherein determining the sensitivity of the implantable analyte sensor is performed iteratively.

8. The method of claim 7 , wherein determining the sensitivity of the implantable analyte sensor is performed throughout a substantially entire sensor session.

9. The method of claim 1 , wherein the value associated with the signal response is electrical impedance, and wherein the determined electrical impedance is compared to an established impedance-to-sensor sensitivity relationship.

10. The method of claim 9 , further comprising determining sensor sensitivity by using the impedance-to-sensor sensitivity relationship.

11. The method of claim 9 , further comprising determining a change in sensitivity over time by using the impedance-to-sensor sensitivity relationship.

12. The method of claim 1 , wherein the defective implantable analyte sensor is detected by an unstable sensor sensitivity.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 24, 2015
From: BOHM, SEBASTIAN; RONG, DAITING; SIMPSON, PETER C.
To: DEXCOM, INC.
Reel/Frame 036687/0001 →
Continuity (4)
Continuation 13446977 · Apr 13, 2012
Continuation 13446848 · Apr 13, 2012
Provisional Application 61476145 · Apr 15, 2011
Related Publication 20160018246A1 · Jan 21, 2016
Cited By (4)
US 12,318,200 US 12,343,143 US 12,507,921 US 12,666,543