IP Library Granted Patent US 10,113,971
Granted Patent B2
US 10,113,971 · App. 14/862,242 · Granted Oct 30, 2018

Test apparatus and control method thereof

Inventor: Yeong Bae Yeo (Seoul, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G01N21/78G01N21/07G01N21/253G01N2021/0325G01N2021/7783
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Quick Facts
Patent No.
US 10,113,971
App. No.
14/862,242
Granted
Oct 30, 2018
Kind
B2
Abstract

A test apparatus and a control method thereof are provided. The test apparatus is configured to test a sample in a reactor. The test apparatus includes at least one light emitter configured to emit light to chambers of the reactor, a light receiver configured to receive light passed through the chambers while scanning the chambers, and a processor configured to determine a position or an area of a chamber among the chambers, based on light receiving positions of the light receiver, and respective intensities of the received light. The processor is further configured to measure an optical density of light passed through the determined position or the determined area of the chamber.

Claims (34)

1. A test apparatus configured to test a sample in a reactor, the test apparatus comprising:

at least one light emitter configured to emit light to chambers included in the reactor, each of the chambers being configured to include a portion of the sample;

a light receiver configured to receive light passed through the chambers, while moving in a direction from a side of the reactor to another side of the reactor;

a motor configured to move the light receiver in the direction from the side of the reactor to the other side of the reactor; and

a processor configured to:

generate a map comprising coordinates respectively of the chambers, based on light receiving positions at which the light receiver receives the light passed through the chambers, the light receiving positions being along the direction from the side of the reactor to the other side of the reactor, and further based on intensities of the light received respectively at the light receiving positions, the coordinates comprising respectively pixel numbers of light receiving elements and the light receiving positions;

determine a position or an area of a chamber among the chambers, based on the light receiving positions and the intensities; and

measure an optical density of light passed through the determined position or the determined area of the chamber.

2. The test apparatus according to claim 1 , wherein the light receiver comprises an array of the light receiving elements.

3. The test apparatus according to claim 2 , wherein the array comprises a one-dimensional array or a two-dimensional array.

4. The test apparatus according to claim 1 , wherein the processor is further configured to calculate an average value of an optical density of light passed through an area within a range from the determined position or the determined area of the chamber.

5. The test apparatus according to claim 1 , wherein the light emitter is further configured to emit the light to the chambers at a fixed position, or while moving in the direction from the side of the reactor to the other side of the reactor in correspondence to the light receiver.

6. The test apparatus according to claim 1 , further comprising:

a filter configured to:

detect light having wavelengths from the emitted light; and

emit the detected light to the chambers.

7. The test apparatus according to claim 1 , further comprising:

an auxiliary light receiver configured to receive the emitted light.

8. The test apparatus according to claim 7 , further comprising:

a light path changer configured to change a path of the emitted light to allow the auxiliary light receiver to receive the emitted light.

9. The test apparatus according to claim 7 , wherein the processor is further configured to compensate for differences of a variation of an intensity of the light received through the chambers by comparing a variation of an intensity of the received emitted light with data of an intensity of the emitted light.

10. The test apparatus according to claim 9 , wherein the processor is further configured to measure the optical density of the light passed through the determined position and the determined area of the chamber, based on the compensated differences.

11. The test apparatus according to claim 1 , further comprising:

a condenser lens disposed between the reactor and the light receiver, the condenser lens being configured to focus the light passed through the chambers to the light receiver having an area less than that of the reactor.

12. A test apparatus configured to test a sample in a reactor, the test apparatus comprising:

at least one light emitter configured to emit light to chambers included in the reactor, each of the chambers being configured to include a portion of the sample;

a light receiver comprising light receiving elements configured to receive light passed through the chambers, while moving in a direction from a side of the reactor to another side of the reactor;

a motor configured to move the light receiver in the direction from the side of the reactor to the other side of the reactor; and

a processor configured to:

generate a map comprising coordinates respectively of the chambers, based on light receiving positions at which the light receiver receives the light passed through the chambers, the light receiving positions being along the direction from the side of the reactor to the other side of the reactor, and further based on intensities of the light received respectively at the light receiving positions, the coordinates comprising respectively pixel numbers of the light receiving elements and the receiving positions;

determine a coordinate of a chamber among the chambers, the coordinate comprising a pixel number of one of the light receiving elements and a light receiving position of the light receiver, at which the one of the light receiving elements receives a largest intensity of the light passed through the chambers, the light receiving position being along the direction from the side of the reactor to the other side of the reactor.

13. The test apparatus of claim 12 , wherein the processor is further configured to measure an optical density of light passed through the determined coordinate of the chamber.

14. The test apparatus of claim 12 , wherein the light receiver is further configured to receive light passed through air-holes adjacent to the chambers, and

the processor is further configured to compensate for differences of a variation of an intensity of the light received through the chambers by comparing a variation of an intensity of the light received through the air-holes with data of an intensity of the emitted light.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2022
From: SAMSUNG ELECTRONICS CO., LTD.
To: PRECISION BIOSENSOR INC.
Reel/Frame 060632/0598 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2015
From: YEO, YEONG BAE
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 036630/0377 →
Priority Claims (1)
KR 10-2014-0173205 · Dec 4, 2014 · national
Continuity (1)
Related Publication 20160161418A1 · Jun 9, 2016