Heterogeneous spectroscopic transceiving photonic integrated circuit sensor
Described herein are optical sensing devices for photonic integrated circuits (PICs). A PIC may comprise a plurality of waveguides formed in a silicon on insulator (SOI) substrate, and a plurality of heterogeneous lasers, each laser formed from a silicon material of the SOI substrate and to emit an output wavelength comprising an infrared wavelength. Each of these lasers may comprise a resonant cavity included in one of the plurality of waveguides, and a gain material comprising a non-silicon material and adiabatically coupled to the respective waveguide. A light directing element may direct outputs of the plurality of heterogeneous lasers from the PIC towards an object, and one or more detectors may detect light from the plurality of heterogeneous lasers reflected from or transmitted through the object.
1. A system comprising:
a photonic integrated circuit (PIC) comprising:
a plurality of waveguides formed in a silicon on insulator (SOI) substrate; and
a plurality of heterogeneous lasers, each laser formed from a silicon material of the SOI substrate and to emit an output wavelength comprising an infrared wavelength, each laser comprising:
a resonant cavity included in one of the plurality of waveguides; and
a gain material comprising a non-silicon material and adiabatically coupled to the respective waveguide;
a light directing element to direct outputs of the plurality of heterogeneous lasers from the PIC towards an object; and
one or more detectors to detect light from the plurality of heterogeneous lasers reflected from or transmitted through the object.
2. The system of claim 1 , wherein the one or more detectors and the light directing element are both included in the PIC.
3. The system of claim 2 , wherein the PIC further comprises:
one or more emission apertures to emit light from the plurality of heterogeneous lasers; and
one or more collection apertures to receive light for the one or more detectors.
4. The system of claim 3 , wherein a quantity of the plurality of collection apertures is greater than a quantity of the one or more emission apertures.
5. The system of claim 3 , wherein the one or more emission apertures and the one or more collection apertures comprise a same single aperture.
6. The system of claim 3 , wherein at least two of the plurality of collection apertures are different distances from the one or more emission apertures.
7. The system of claim 2 , wherein the light collected from the object is coupled into a waveguide mode.
8. The system of claim 7 , wherein the light collected from the object is to be combined with a component of light from one or more of the heterogeneous lasers that has not been coupled off of the PIC.
9. The system of claim 1 , wherein the light directing element comprises:
an edge emitting facet to emit light from an edge of the PIC; and
a tuning mirror to direct light from the edge emitting facet towards the object.
10. The system of claim 1 , wherein the light directing element comprises a grating.
11. The system of claim 1 , wherein the light directing element is to direct the outputs of the plurality of heterogeneous lasers normal to a surface of the PIC.
12. The system of claim 1 , wherein the plurality of heterogeneous lasers are configured to emit a plurality of wavelength ranges, and the one or more detectors comprise a detector for each wavelength range.
13. The system of claim 1 , wherein the plurality of heterogeneous lasers comprises:
a first laser having a gain material comprising a first non-silicon material; and
a second laser having a gain material comprising a second non-silicon material different than the first non-silicon material.
14. The system of claim 1 , wherein the PIC further comprises:
one or more modulators to modulate intensities of the outputs of the plurality of heterogeneous, the intensities to be modulated with a carrier frequency.