Methods, apparatuses and systems for sensing exposure of electronic devices to moisture

1. An electronic device, comprising: a housing and a display defining an exterior of an electronic device and an interior of the electronic device; an integrated circuit (IC) within the electronic device and comprising a control element; and a moisture sensor comprising at least one inductive sensor, the moisture sensor being coupled to or part of the IC and associated with the control element, the moisture sensor and the control element together being configured to sense moisture within the electronic device, wherein the at least one inductive sensor is configured to generate a magnetic field and detect a change in magnetic permeability, the inductive sensor including an inductive coil surrounding the IC and configured to receive a voltage pulse from the IC.

2. The electronic device of claim 1 , further comprising an oscillator configured to convey a clock signal to the moisture sensor and the control element.

3. The electronic device of claim 1 , wherein the control element is programmable via a communications port of the IC.

4. The electronic device of claim 1 , the moisture sensor comprising a capacitance sensor including a shield surrounding a sense element and separated from the sense element by an air gap.

5. The electronic device of claim 1 , wherein the control element includes one or more logic circuits.

6. The electronic device of claim 1 , the IC configured to measure an electrical current response after conveying the voltage pulse to determine if moisture is present proximate the IC.

7. The electronic device of claim 1 , further comprising a ball grid array (BGA) package including the inductive sensor.

8. The electronic device of claim 1 , further comprising at least one moisture-resistant element coating at least a portion of the moisture sensor.

9. A system, comprising: an integrated circuit (IC) comprising a processing element and logic calibrated for determining an occurrence of a moisture event based on a received sensor signal; and a moisture sensor comprising at least one inductive sensor coupled to the processing element and configured to generate a magnetic field and detect a change in magnetic permeability and convey the sensor signal to the logic, the sensor signal indicative of a measured magnetic permeability proximate the moisture sensor, the inductive sensor including an inductive coil surrounding the IC and configured to receive a voltage pulse from the IC.

10. The system of claim 9 , the inductive sensor internal to the IC and configured to detect moisture proximate the IC.

11. The system of claim 9 , the system further including a shield and a sense element external from and coupled to the IC.

12. The system of claim 11 , the shield surrounding the sense element, wherein the inductive sensor is configured to detect moisture within a gap separating the shield and the sense element.

13. The system of claim 11 , wherein the shield is coupled to a ground voltage.

14. The system of claim 9 , the inductive sensor configured to receive a clock signal from an oscillator.

15. A method for responding to exposure of an electronic device to moisture, comprising: measuring a change in magnetic permeability within the electronic device, with at least one inductive sensor, the inductive sensor including an inductive coil; receiving a voltage pulse, at the inductive coil, from an integrated circuit (IC); determining if moisture is within the electronic device based on the measured change in magnetic permeability; and entering a moisture sense mode of the electronic device if it is determined that moisture is within the electronic device.

16. The method of claim 15 , further comprising measuring a change in dielectric constant within the electronic device with at least one capacitance sensor.

17. The method of claim 15 , further comprising calibrating one or more moisture event thresholds of the electronic device based on one or more conditions.