Probe supporting and aligning apparatus
View Patent ↗An apparatus for testing electrical characteristics of a device, having one or more testing sites. The apparatus comprises a nonconductive plate having a through-hole. The through-hole is positioned such that it at least partially overlays one of the one or more testing sites when at least a portion of the bottom surface of the nonconductive plate is adjacent to the device to be tested. The apparatus also comprises a probe positioning body protruding from the top surface of the nonconductive plate and having a through-hole. The probe positioning body is positioned such that the through-hole of the probe positioning body at least partially aligns with the through-hole of the nonconductive plate.
1. A probe supporting apparatus for testing electrical characteristics of a device, the device having one or more testing sites, comprising:
a nonconductive plate having a top surface, a bottom surface, and a through-hole, wherein the through-hole is positioned such that the through-hole at least partially overlays one of the one or more testing sites when at least a portion of the bottom surface of the nonconductive plate is adjacent to the device to be tested; and
a probe positioning body protruding from the top surface of the nonconductive plate and having a through-hole, wherein the probe positioning body is positioned such that the through-hole of the probe positioning body at least partially aligns with the through-hole of the nonconductive plate for allowing insertion of a probe through both of the through-hole of the probe positioning body and the through-hole of the nonconductive plate;
wherein the probe positioning body includes a substantially cylindrical wall of substantially uniform thickness protruding from the top surface of the nonconductive plate for supporting the probe inserted through both of the through-hole of the probe positioning body and the through-hole of the nonconductive plate;
wherein the bottom surface of the nonconductive plate includes at least one aperture that compensates for a protruding body of the device to be tested.
2. The probe supporting apparatus of claim 1 , wherein the through-hole of the nonconductive plate is substantially cylindrical and wherein the through-hole of the probe positioning body is substantially cylindrical.
3. The probe supporting apparatus of claim 2 , wherein the probe positioning body is positioned such that the through-hole of the probe positioning body at least partially aligns with the through-hole of the nonconductive plate, and the through-hole of the probe positioning body and the through-hole of the nonconductive plate are substantially axially aligned about a central axis.
4. The probe supporting apparatus of claim 3 , wherein the probe positioning body is positioned such that the through-hole of the probe positioning body at least partially aligns with the through-hole of the nonconductive plate, and the through-hole of the probe positioning body and the through-hole of the nonconductive plate are substantially axially aligned about a central axis, and the through-hole of the probe positioning body and the through-hole of the nonconductive plate have substantially equal diameters.
5. The probe supporting apparatus of claim 1 , wherein the nonconductive plate comprises a transparent material.
6. The probe supporting apparatus of claim 1 , further comprising clips for attaching the bottom surface of the nonconductive plate to the device to be tested.
7. The probe supporting apparatus of claim 1 , wherein the nonconductive plate and the probe positioning body protruding from the top surface of the nonconductive plate comprise the same material.
8. The probe supporting apparatus of claim 7 , wherein the probe supporting apparatus is formed as one piece, such that the nonconductive plate and the probe positioning body protruding from the top surface of the nonconductive plate are integral.
9. The probe supporting apparatus of claim 1 , wherein the through-hole of the probe positioning body and the through-hole of the nonconductive plate have substantially equal diameters.
10. The probe supporting apparatus of claim 1 , wherein the through-hole of the nonconductive plate is substantially cuboid.
11. The probe supporting apparatus of claim 1 , further comprising clips for attaching the bottom surface of the nonconductive plate to the device to be tested,
wherein the nonconductive plate and the probe positioning body protruding from the top surface of the nonconductive plate comprise the same material,
wherein the probe supporting apparatus is formed as one piece, such that the nonconductive plate and the probe positioning body protruding from the top surface of the nonconductive plate are integral,
wherein the through-hole of the nonconductive plate is substantially cuboid, and wherein the through-hole of the probe positioning body is substantially cuboid.
12. A probe supporting apparatus for testing electrical characteristics of a device, the device having one or more testing sites, the probe supporting apparatus comprising:
a nonconductive plate having a top surface, a bottom surface, and a through-hole extending between the top and bottom surfaces; and
a probe positioning body protruding from the nonconductive plate and having a through-hole, wherein the through-hole of the probe positioning body and the through-hole of the nonconductive plate are axially aligned about a central axis,
wherein the through-hole of the probe positioning body and the through-hole of the nonconductive plate have substantially equal inner diameters measured perpendicular to the central axis.
13. The probe supporting apparatus of claim 12 , wherein the through-hole of the nonconductive plate is substantially cylindrical and wherein the through-hole of the probe positioning body is substantially cylindrical.
14. The probe supporting apparatus of claim 12 , wherein the probe positioning body protrudes from the top surface of the nonconductive plate, wherein the probe positioning body is a separate piece from the nonconductive plate, wherein an end of the through-hole of the probe positioning body and an end of the through-hole of the nonconductive plate are substantially coplanar with the top surface of the nonconductive plate.
15. The probe supporting apparatus of claim 12 , wherein the nonconductive plate comprises a transparent material.
16. The probe supporting apparatus of claim 12 , further comprising clips for attaching the bottom surface of the nonconductive plate to the device to be tested.
17. The probe supporting apparatus of claim 12 , wherein the nonconductive plate and the probe positioning body protruding from the nonconductive plate comprise the same material.
18. The probe supporting apparatus of claim 17 , wherein the probe supporting apparatus is formed as one piece, such that the nonconductive plate and the probe positioning body protruding from the top surface of the nonconductive plate are integral.
19. The probe supporting apparatus of claim 12 , wherein the inner diameter of the through-hole of the probe positioning body is defined by a straight line that extends from a point on an innermost cylindrical wall of the probe positioning body, through the central axis to a different point on the innermost cylindrical wall of the probe positioning body, the innermost cylindrical wall defining the through-hole.
20. The probe supporting apparatus of claim 12 , wherein the inner diameter of the nonconductive plate is defined by a straight line that extends from a point on an innermost cylindrical wall of the nonconductive plate, through the central axis to a different point on the innermost cylindrical wall of the nonconductive plate, the innermost cylindrical wall defining the through-hole.