Limiting of temperature variations of semiconductor component

1. A method of limiting temperature variations in a semiconductor component of a switching converter, the method comprising

determining a quantity relating to operation temperature of the switching converter,

determining temperature of the semiconductor component,

selecting a maximum value of switching frequency of the switching converter based on the determined quantity relating to operation temperature of the switching converter and the temperature of the semiconductor component, and

limiting the switching frequency of the semiconductor component of the switching converter to the selected switching frequency,

wherein the selecting of the maximum value of switching frequency comprises

setting a higher temperature limit (T_sf_high) on the basis of the determined quantity relating to the operation temperature of the switching converter,

selecting a maximum value of the switching frequency such that

when the temperature of the semiconductor component is above the higher temperature limit the maximum value of the switching frequency has a second frequency value and

when the temperature of the semiconductor component is lower than the higher temperature limit, the maximum value of the switching frequency has a higher value than the second frequency value.

2. A method according to claim 1 , wherein the method also comprises setting a lower temperature limit on the basis of the determined quantity relating to temperature, and the selecting of the maximum value for the switching frequency comprises steps

when the temperature of the semiconductor component is below the lower temperature limit the maximum value of the switching frequency has a first frequency value, and

when the temperature of the semiconductor component is between the lower temperature limit and higher temperature limit the maximum value of the switching frequency has a value between the first frequency value and the second frequency value.

3. A method according to claim 2 , wherein when the temperature of the semiconductor component is between the lower temperature limit and the higher temperature limit, the maximum value of switching frequency is changed as a function of temperature of the semiconductor component, preferably linearly depending on the temperature of the semiconductor component.

4. A method according to claim 3 , wherein the method further comprises

providing the maximum value of the switching frequency to a modulator of the switching converter, the modulator of the switching converter limiting the switching frequency to the selected maximum value.

5. A method according to claim 2 , wherein when the temperature of the semiconductor component is between the lower temperature limit and the higher temperature limit, the maximum value of switching frequency is changed as a function of temperature of the semiconductor component.

6. A method according to claim 2 , wherein the method further comprises

providing the maximum value of the switching frequency to a modulator of the switching converter, the modulator of the switching converter limiting the switching frequency to the selected maximum value.

7. A method according to claim 1 , wherein the method further comprises

providing the maximum value of the switching frequency to a modulator of the switching converter, the modulator of the switching converter limiting the switching frequency to the selected maximum value.

8. A method according to claim 1 , wherein the method comprises

determining temperatures of multiple of semiconductor components,

selecting the highest temperature of the determined temperatures,

using the selected temperature in selecting the maximum value of the switching frequency, and

operating the multiple of semiconductor components of the switching converter using the maximum value of the switching frequency in the multiple of semiconductor components.

9. A method according to claim 1 , wherein the temperature of the semiconductor component is the temperature of the pn-junction of the component.

10. A method according to claim 9 , wherein the temperature of the pn-junction of the component is determined using a thermal model of the component and a measured temperature of the component.

11. A method according to claim 1 , wherein the switching converter is a frequency converter.

12. A method according to claim 1 , wherein the quantity relating to operation temperature is the temperature of the cooling medium of the switching converter, filtered temperature of the semiconductor component, information of the loading of the switching converter or time information.

13. A method according to claim 12 , wherein the cooling medium is cooling liquid or cooling air.

14. A method according to claim 1 , wherein the method also comprises setting a lower temperature limit, and wherein when the temperature of the semiconductor component is between the lower temperature limit and the higher temperature limit, the maximum value of switching frequency is changed as a function of temperature of the semiconductor component, preferably linearly depending on the temperature of the semiconductor component.

15. A method according to claim 1 , wherein the method further comprises

providing the maximum value of the switching frequency to a modulator of the switching converter, the modulator of the switching converter limiting the switching frequency to the selected maximum value.

16. A method according to claim 1 , wherein the method comprises

determining temperatures of multiple of semiconductor components,

selecting the highest temperature of the determined temperatures,

using the selected temperature in selecting the maximum value of the switching frequency, and

operating the multiple of semiconductor components of the switching converter using the maximum value of the switching frequency in the multiple of semiconductor components.

17. A method according to claim 1 , wherein the temperature of the semiconductor component is the temperature of the pn-junction of the component.

18. An arrangement of limiting temperature variations in a semiconductor component of a switching converter, the arrangement comprising

means for determining a quantity relating to operation temperature of the switching converter,

means for determining temperature of the semiconductor component,

means for selecting a maximum value of switching frequency of the switching converter based on the determined quantity relating to operation temperature of the switching converter and the temperature of the semiconductor component, and

means for limiting the switching frequency of the semiconductor component of the switching converter to the selected switching frequency,

wherein the means for selecting the maximum value of switching frequency performs the steps of:

setting a higher temperature limit (T_sf_high) on the basis of the determined quantity relating to the operation temperature of the switching converter,

selecting a maximum value of the switching frequency such that

when the temperature of the semiconductor component is above the higher temperature limit the maximum value of the switching frequency has a second frequency value and

when the temperature of the semiconductor component is lower than the higher temperature limit, the maximum value of the switching frequency has a higher value than the second frequency value.