Module test socket for over the air testing of radio frequency integrated circuits

1. A test system for testing an integrated circuit Device-Under-Test (DUT), the DUT including a radiative element that emits close-proximity radio frequency (RF) electromagnetic radiation, the test system comprising:

a test socket that holds the DUT during testing;

an interface board electrically connected between tester instrumentation and electrical contacts of the DUT during testing;

a waveguide integrated into the test socket, the waveguide having a first end positioned to receive the RF electromagnetic radiation side emitted by the DUT during testing, the waveguide relaying the RF electromagnetic radiation to the tester instrumentation;

a reflective plane positioned below the DUT to reflect the RF electromagnetic radiation, the reflective plane increasing coupling of the RF electromagnetic radiation from the DUT into the waveguide; and

a position adjustment mechanism to adjust a position of the reflective plane relative to a position of the DUT.

2. The test system of claim 1 , wherein the reflective plane is positioned 5-10 mil below the DUT.

3. The test system of claim 1 , wherein the position adjustment mechanism is configured to tilt the reflective plane relative to the DUT.

4. The test system of claim 1 , wherein the position adjustment mechanism is configured to change a spacing between the reflective plane and a bottom surface of the DUT.

5. The test system of claim 1 , wherein the position adjustment mechanism is configured to translate the reflective plane relative to the DUT, thereby changing a separation between the reflective plane and the first end of the waveguide.

6. The test system of claim 1 , wherein adjusting the position of the reflective plane changes an angle of propagation of the electromagnetic radiation emitted by the DUT.

7. The test system of claim 1 , wherein the radiative element is separated from the first end of the waveguide by an air gap.

8. The test system of claim 1 , wherein the air gap is less than 2 mm.

9. The test system of claim 1 , wherein the DUT when able to pass a testing routine of the tester instrumentation has sufficient radiative power to enable reliable reception by a receiver radiative element placed within an envelope of the RF electromagnetic radiation, but insufficient radiative power to enable reliable reception by a receiver radiative element placed outside the envelope.

10. The test system of claim 9 , wherein the envelope is less than 2 centimeters in its longest dimension.

11. The test system of claim 9 , wherein the radiative element has a longest dimension that is less than 1 centimeter.

12. The test system of claim 1 , wherein the RF electromagnetic radiation side emitted from the DUT is EHF radiation having a frequency between 30 GHz and 300 GHz.

13. The test system of claim 1 , wherein the test socket comprises:

a socket base with a cavity, the cavity receiving the DUT during testing; and

a socket plunger situated above the socket base, the socket plunger pressing the DUT into the cavity during testing.

14. The test system of claim 13 , wherein the tester instrumentation controls the socket plunger to automatically and sequentially obtain and then press DUTs into the cavity for testing.

15. The test system of claim 13 , wherein the socket plunger includes a conductive sheet that increases coupling of the RF electromagnetic radiation from the DUT into the waveguide.

16. The test system of claim 13 , wherein the socket plunger is composed of a material with a permittivity (Er) of at least 5.

17. The test system of claim 13 , further comprising a socket lid, the socket plunger extending through the socket lid into the cavity, the socket lid including a conductive sheet.

18. The test system of claim 13 , wherein a portion of the cavity in proximity to the first end of the waveguide is composed of a material with a permittivity (Er) of at least 5.

19. The test system of claim 1 , wherein the DUT includes a plurality of radiative elements that each side emits close-proximity RF electromagnetic radiation, the test system comprising a plurality of waveguides integrated into the test socket, each waveguide having a first end positioned to receive RF electromagnetic radiation side emitted by a different radiative element of the DUT during testing, each waveguide relaying the received RF electromagnetic radiation to the tester instrumentation.

20. The test system of claim 19 , wherein the radiative elements are separated by not more than 20 mm.

21. The test system of claim 19 , wherein the radiative elements are separated by not more than 10 mm.

22. The test system of claim 19 , wherein the test system is configured to measure cross talk between the radiative elements.

23. The test system of claim 19 , wherein each radiative element can be tested independently from the other radiative elements.

24. The test system of claim 1 , wherein the DUT can be tested without use of a radiation chamber.

25. The test system of claim 1 , wherein the DUT can be tested without use of a horn antenna.

26. The test system of claim 1 , wherein the waveguide is hollow.

27. The test system of claim 1 , wherein the waveguide is a dielectric waveguide.

28. The test system of claim 1 , wherein the waveguide is flexible.

29. The test system of claim 1 , wherein the tester instrumentation is configured to measure radiated power.

30. The test system of claim 1 , wherein the tester instrumentation is configured to measure receiver sensitivity.

31. The test system of claim 1 , wherein the tester instrumentation is configured to measure jitter.

32. The test system of claim 1 , wherein the position adjustment mechanism is electronic and/or mechanical.