Removal of ions from survey scans using variable window band-pass filtering to improve intrascan dynamic range
Systems and methods are used to band-pass filter ions from a mass range. A full spectrum is received for a full scan of a mass range using a tandem mass spectrometer. A mass selection window of the full spectrum is selected and a set of tuning parameter values is selected. The tandem mass spectrometer is instructed to perform a scan of the mass selection window using the set of tuning parameter values. A spectrum is received for the scan from the tandem mass spectrometer. A band-pass filtered spectrum is created for the mass range that includes values from the spectrum for the mass selection window of the mass range. Systems and methods are also used to band-pass filter ions from two or more mass selection windows across the mass range and to filter out ions from a mass selection window between two band-pass mass selection windows.
1. A system for selecting precursor ion mass selection windows for a mass range based on whether or not precursor ions found in a precursor ion survey scan of the mass range are capable of producing detector sub-system saturation, comprising:
a tandem mass spectrometer that includes a mass analyzer and that performs a precursor ion survey scan of a mass range, producing a full precursor ion spectrum for the mass range; and
a processor in communication with the tandem mass spectrometer that
receives the full precursor ion spectrum from the tandem mass spectrometer,
from the full precursor ion spectrum, identifies for removal precursor ions that produce saturation in a detector sub-system of the mass analyzer, and
across the mass range, selects non-overlapping precursor mass selection windows with variable window widths based on the precursor ions identified for removal, wherein each precursor mass selection window either is selected to include a precursor ion identified for removal and to prevent precursor ions from being fragmented or is selected to not include a precursor ion identified for removal and to allow precursor ions to be fragmented and allow resulting fragmented ions to be mass analyzed.
2. The system of claim 1 , wherein the processor identifies for removal precursor ions that produce saturation in the detector sub-system by
identifying precursor ions in the full precursor ion spectrum that have an ion count rate that exceeds a total ion count rate of the detector sub-system.
3. The system of claim 1 , wherein the processor identifies for removal precursor ions that produce saturation in the detector sub-system by
identifying precursor ions in the full precursor ion spectrum that have an intensity that exceeds a threshold intensity of the detector sub-system.
4. The system of claim 1 , wherein the processor further instructs the tandem mass spectrometer to fragment and analyze fragment ions of only precursor mass selection windows that are selected to not include a precursor ion identified for removal and allow precursor ions to be fragmented and allow resulting fragment ions to be mass analyzed, producing a plurality of fragment ion spectra.
5. The system of claim 4 , wherein the processor receives the plurality of fragment ion spectra from the tandem mass spectrometer and creates a band-pass filtered fragment ion spectrum from the plurality of fragment ion spectra.
6. The system of claim 1 , wherein processor further instructs the tandem mass spectrometer to fragment the precursor mass selection windows that are selected to not include a precursor ion identified for removal using different tuning parameters for the detection sub-system.
7. The system of claim 6 , wherein the tuning parameters include a maximum total ion current of the detection sub-system.
8. The system of claim 6 , wherein the tuning parameters include a maximum intensity threshold of the detection sub-system.
9. A method for selecting precursor ion mass selection windows for a mass range based on whether or not precursor ions found in a precursor ion survey scan of the mass range are capable of producing detector sub-system saturation, comprising:
receiving a full spectrum for a full scan of a mass range using a tandem mass spectrometer that includes a mass analyzer and that performs a precursor ion survey scan of a mass range to produce the full precursor ion spectrum for the mass range;
from the full precursor ion spectrum, identifying for removal precursor ions that produce saturation in a detector sub-system of the mass analyzer using a processor; and
across the mass range, selecting non-overlapping precursor mass selection windows with variable window widths based on the precursor ions identified for removal using the processor, wherein each precursor mass selection window either is selected to include a precursor ion identified for removal and to prevent precursor ions from being fragmented or is selected to not include a precursor ion identified for removal and to allow precursor ions to be fragmented and allow resulting fragmented ions to be mass analyzed.
10. The method of claim 9 , wherein the identifying steps comprises identifying precursor ions in the full precursor ion spectrum that have an ion count rate that exceeds a total ion count rate of the detector sub-system.
11. The method of claim 9 , wherein the identifying steps comprises identifying precursor ions in the full precursor ion spectrum that have an intensity that exceeds a threshold intensity of the detector sub-system.
12. The method of claim 9 , further comprising:
instructing the tandem mass spectrometer to fragment and analyze fragment ions of only precursor mass selection windows that are selected to not include a precursor ion identified for removal and allow precursor ions to be fragmented and allow resulting fragment ions to be mass analyzed using the processor, producing a plurality of fragment ion spectra.
13. The method of claim 12 , further comprising:
receiving the plurality of fragment ion spectra from the tandem mass spectrometer and creating a band-pass filtered fragment ion spectrum from the plurality of fragment ion spectra using the processor.
14. The method of claim 9 , further comprising:
instructing the tandem mass spectrometer to fragment the precursor mass selection windows that are selected to not include a precursor ion identified for removal using different tuning parameters for the detection sub-system using the processor.
15. The method of claim 14 , wherein the tuning parameters include a maximum total ion current of the detection sub-system.
16. The method of claim 14 , wherein the tuning parameters include a maximum intensity threshold of the detection sub-system.
17. A computer program product, comprising a tangible computer-readable storage medium whose contents include a program with instructions being executed on a processor so as to perform a method for selecting precursor ion mass selection windows for a mass range based on whether or not precursor ions found in a precursor ion survey scan of the mass range are capable of producing detector sub-system saturation, the method comprising:
providing a system, wherein the system comprises one or more distinct software modules, and wherein the distinct software modules comprise a measurement module and a filtering module;
receiving a full spectrum for a full scan of a mass range using a tandem mass spectrometer that includes a mass analyzer and that performs a precursor ion survey scan of a mass range, producing a full precursor ion spectrum for the mass range using the measurement module;
from the full precursor ion spectrum, identifying for removal precursor ions that produce saturation in a detector sub-system of the mass analyzer using the filtering module; and
across the mass range, selecting non-overlapping precursor mass selection windows with variable window widths based on the precursor ions identified for removal using the filtering module, wherein each precursor mass selection window either is selected to include a precursor ion identified for removal and to prevent precursor ions from being fragmented or is selected to not include a precursor ion identified for removal and to allow precursor ions to be fragmented and allow resulting fragmented ions to be mass analyzed.
18. The computer program product of claim 17 , wherein the identifying step comprises identifying precursor ions in the full precursor ion spectrum that have an ion count rate that exceeds a total ion count rate of the detector sub-system.
19. The computer program product of claim 17 , wherein the identifying steps comprises identifying precursor ions in the full precursor ion spectrum that have an intensity that exceeds a threshold intensity of the detector sub-system.
20. The computer program product of claim 17 , wherein the method further comprises:
instructing the tandem mass spectrometer to fragment and analyze fragment ions of only precursor mass selection windows that are selected to not include a precursor ion identified for removal and allow precursor ions to be fragmented and allow resulting fragment ions to be mass analyzed using the processor, producing a plurality of fragment ion spectra.