Scanning optical system with multiple optical sources
In an embodiment, a scanning optical system comprises first and second optical sources and a deflector device. The first and second optical sources provide first and second beams, respectively, of optical radiation. The deflector device is disposed to receive and deflect the first and second beams, and is configured for a scanning operation on a beam of radiation traversing the deflector device. The first beam is incident on the deflector device with a first orientation and the second beam is incident on the deflector device with a second orientation that is different from the first orientation.
1. A scanning optical system, comprising:
a plurality of optical sources, each optical source configured to provide a beam of optical radiation;
a deflector device disposed to receive and deflect the beams provided by the optical sources, the deflector device configured for a scanning operation on a beam of radiation traversing the deflector device to scan a target, the beams provided by the optical sources comprising:
a first beam incident on the deflector device with a first orientation; and
a second beam incident on the deflector device with a second orientation, the first orientation being different from the second orientation;
a plurality of interferometric measuring devices configured to optically analyze the target by establishing interference between radiation backscattered from the target and reference radiation obtained from at least one of the beams provided by the optical sources; and
a control computer configured to control the deflector device to:
perform the scanning operation during operation of a first measuring device; and
inactivate the scanning operation during operation of a second measuring device.
2. The scanning optical system of claim 1 , wherein:
the deflector device includes a first scanning mirror disposed for tilting about at least one tilt axis; and
the first beam is incident on the first scanning mirror with the first orientation and the second beam is incident on the first scanning mirror with the second orientation.
3. The scanning optical system of claim 1 , wherein:
the deflector device includes a first scanning mirror disposed for tilting about a first tilt axis and a second scanning mirror disposed for tilting about a second tilt axis;
the first tilt axis is oriented perpendicularly to the second tilt axis;
the first and second beams are incident on the first scanning mirror with the first and second orientations, respectively; and
the first scanning mirror is arranged to direct the first and second beams to the second scanning mirror with a common, third orientation.
4. The scanning optical system of claim 1 , wherein:
the first measuring device comprises an OCT-based measuring unit; and
the second measuring device comprises an OLCR-based measuring unit.
5. The scanning optical system of claim 1 , wherein at least one of the measuring devices comprises a measuring unit configured to perform at least one of the following: a function for measuring an axial length of an eye, a function for measuring a central thickness of a cornea, a function for measuring an axial length of an anterior chamber of an eye, a function for measuring a central thickness of a crystal lens of an eye, a function for performing a keratometry of an eye, a function for measuring a white-to-white distance of an eye, a function for performing a pupillometry of an eye, a function for measuring an eccentricity of a visual axis of an eye, and a function for measuring a retinal thickness of an eye.
6. The scanning optical system of claim 1 , wherein at least one of the measuring devices includes a measuring unit configured to perform at least one of two-dimensional and three-dimensional imaging of an eye structure.
7. The scanning optical system of claim 1 , wherein the plurality of optical sources is two.
8. The scanning optical system of claim 1 , wherein the plurality of optical sources is three.